M. D. Moyer

1.4k total citations
29 papers, 1.1k citations indexed

About

M. D. Moyer is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, M. D. Moyer has authored 29 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 24 papers in Electrical and Electronic Engineering, 23 papers in Materials Chemistry and 7 papers in Computational Mechanics. Recurrent topics in M. D. Moyer's work include Thin-Film Transistor Technologies (19 papers), Silicon Nanostructures and Photoluminescence (18 papers) and Silicon and Solar Cell Technologies (13 papers). M. D. Moyer is often cited by papers focused on Thin-Film Transistor Technologies (19 papers), Silicon Nanostructures and Photoluminescence (18 papers) and Silicon and Solar Cell Technologies (13 papers). M. D. Moyer collaborates with scholars based in United States. M. D. Moyer's co-authors include N. M. Johnson, D. K. Biegelsen, W. B. Jackson, Jessica Marshall, W. B. Jackson, N. M. Johnson, P. J. Caplan, S. T. Chang, Edward H. Poindexter and D. J. Bartelink and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and IEEE Transactions on Electron Devices.

In The Last Decade

M. D. Moyer

29 papers receiving 1.0k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
M. D. Moyer United States	13	1.0k	557	238	100	90	29	1.1k
P. Rava Italy	15	836 0.8×	560 1.0×	282 1.2×	46 0.5×	84 0.9×	73	941
Masatoshi Wakagi Japan	13	484 0.5×	471 0.8×	79 0.3×	58 0.6×	84 0.9×	34	592
Toshikazu Shimada Japan	18	720 0.7×	577 1.0×	169 0.7×	47 0.5×	110 1.2×	47	839
F.J. Demond Germany	8	845 0.8×	716 1.3×	81 0.3×	85 0.8×	37 0.4×	11	938
M. D. Tabat United States	11	295 0.3×	372 0.7×	151 0.6×	98 1.0×	99 1.1×	23	552
A. Waldorf Canada	10	314 0.3×	185 0.3×	146 0.6×	107 1.1×	70 0.8×	15	519
Jyoji Nakata Japan	15	587 0.6×	346 0.6×	164 0.7×	330 3.3×	67 0.7×	54	788
Yasuto Yonezawa Japan	15	401 0.4×	464 0.8×	122 0.5×	66 0.7×	136 1.5×	56	686
M. Harry United Kingdom	10	806 0.8×	382 0.7×	855 3.6×	53 0.5×	134 1.5×	19	1.1k
Tomio Izumi Japan	13	323 0.3×	317 0.6×	129 0.5×	51 0.5×	85 0.9×	43	450

Countries citing papers authored by M. D. Moyer

Since Specialization

Citations

This map shows the geographic impact of M. D. Moyer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. D. Moyer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. D. Moyer more than expected).

Fields of papers citing papers by M. D. Moyer

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. D. Moyer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. D. Moyer. The network helps show where M. D. Moyer may publish in the future.

Co-authorship network of co-authors of M. D. Moyer

This figure shows the co-authorship network connecting the top 25 collaborators of M. D. Moyer. A scholar is included among the top collaborators of M. D. Moyer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. D. Moyer. M. D. Moyer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Bandis, C., Bradford B. Pate, William Phillips, et al.. (1996). Field Emission and Band Bending Considerations From High-Quality NEA Diamond. MRS Proceedings. 423. 2 indexed citations

Han, S., R. S. Wagner, J. Joseph, M. A. Plano, & M. D. Moyer. (1995). Chemical vapor deposited diamond radiation detectors for ultrahigh radiation dose-rate measurements: Response to subnanosecond, 16-MeV electron pulses. Review of Scientific Instruments. 66(12). 5516–5521. 6 indexed citations

Cappelli, Mark, et al.. (1992). First-order Raman scattering in homoepitaxial chemical vapor deposited diamond at elevated temperatures. Thin Solid Films. 212(1-2). 206–215. 29 indexed citations

Jackson, W. B., Jessica Marshall, & M. D. Moyer. (1989). Role of hydrogen in the formation of metastable defects in hydrogenated amorphous silicon. Physical review. B, Condensed matter. 39(2). 1164–1179. 160 indexed citations

Jackson, Warren B. & M. D. Moyer. (1988). Kinetics of Carrier-Induced Metastable defect Formation in Hydrogenated Amorphous Silicon. MRS Proceedings. 118. 7 indexed citations

Jackson, W. B. & M. D. Moyer. (1987). Creation of near-interface defects in hydrogenated amorphous silicon-silicon nitride heterojunctions: The role of hydrogen. Physical review. B, Condensed matter. 36(11). 6217–6220. 107 indexed citations

Jackson, W. B., M. D. Moyer, C. C. Tsai, & Jessica Marshall. (1987). Band offsets for the silicon nitride/amorphous silicon interface: Implications for charge transport and trapping in silicon nitride. Journal of Non-Crystalline Solids. 97-98. 891–894. 11 indexed citations

Johnson, N. M. & M. D. Moyer. (1985). Absence of oxygen diffusion during hydrogen passivation of shallow-acceptor impurities in single-crystal silicon. Applied Physics Letters. 46(8). 787–789. 96 indexed citations

Johnson, N. M. & M. D. Moyer. (1984). Electronic Deep Levels in Laser – Crystallized Silicon Thin-Film MOS Capacitors on Fused Silica. MRS Proceedings. 33. 2 indexed citations

10.

Moyer, M. D., et al.. (1983). Defect Reduction by Tilted Zone Crystallization of Patterned Silicon Films on Fused Silica. MRS Proceedings. 23. 1 indexed citations

11.

Johnson, N. M., et al.. (1982). Thin-Film Transistors in CO₂-Laser Crystallized Silicon Films On Fused Silica. MRS Proceedings. 13. 2 indexed citations

12.

Johnson, N. M., et al.. (1982). Detection of Electronic Defects in Strip-Heater Crystallized Silicon Thin Films. MRS Proceedings. 13. 2 indexed citations

13.

Johnson, N. M., et al.. (1982). Deep levels in cw laser-crystallized silicon thin films. Applied Physics Letters. 41(6). 560–563. 5 indexed citations

14.

Biegelsen, D. K., et al.. (1982). Laser-Induced Crystallization of Silicon on Bulk Amorphous Substrates: An Overview. MRS Proceedings. 13. 6 indexed citations

15.

Johnson, N. M., et al.. (1982). Single-crystal silicon transistors in laser-crystallized thin films on bulk glass. IEEE Electron Device Letters. 3(12). 369–372. 23 indexed citations

16.

Biegelsen, D. K., et al.. (1981). Correlated Electrical and Microstructural Studies of Recrystallized Silicon Thin Films on Bulk Glass Substrates. MRS Proceedings. 4. 2 indexed citations

17.

Biegelsen, D. K., N. M. Johnson, D. J. Bartelink, & M. D. Moyer. (1981). Laser-induced crystallization of silicon islands on amorphous substrates: Multilayer structures. Applied Physics Letters. 38(3). 150–152. 67 indexed citations

18.

Johnson, N. M., D. K. Biegelsen, & M. D. Moyer. (1981). Grain Boundaries in Crystallized Silicon Thin Films. MRS Proceedings. 5. 2 indexed citations

19.

Johnson, N. M., D. K. Biegelsen, & M. D. Moyer. (1980). Processing and Properties of Cw Laser-Recrystallized Silicon Films on Amorphous Substrates. MRS Proceedings. 1. 2 indexed citations

20.

Biegelsen, D. K., N. M. Johnson, D. J. Bartelink, & M. D. Moyer. (1980). Laser Induced Crystal Growth of Silicon Islands on Amorphous Substrates. MRS Proceedings. 1. 9 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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