M. Boukerche

589 citations
21 papers · 433 · h-index 14

Impact in

Papers in

M. Boukerche

21 papers receiving 411 citations

Peers

M. Boukerche
Comparison fields: 5 of 21
  • Atomic and Molecular Physics, and Optics 304
  • Electrical and Electronic Engineering 421
  • Materials Chemistry 126
  • Radiation 14
  • Instrumentation 5
Replace Ronald D. Graft with:
Ronald D. Graft United States
T. Colin Norway
D. K. Blanks United States
E. R. Youngdale United States
M. Erdtmann United States
Charles J. Reyner United States
Y.–H. Zhang United States
B. Jensen United States
Jarosław Wróbel Poland
E. Ahlswede Germany
M. Boukerche relative to Ronald D. Graft United States Ronald D. Graft's profile →
Citations per field
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Citations per year

Countries citing papers authored by M. Boukerche

Since Specialization
Citations

This map shows the geographic impact of M. Boukerche's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Boukerche with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Boukerche more than expected).

Fields of papers citing papers by M. Boukerche

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Boukerche. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Boukerche. The network helps show where M. Boukerche may publish in the future.

Co-authors

The 16 scholars most cited alongside M. Boukerche, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Boukerche Line = papers co-authored together M. Boukerche links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 21 papers — load more, or switch the sort, to bring in the rest.

#Work
1 198991
2 198840
3 199035
4 198434
5 198727
6 198527
7 198623
8 198521
9 198621
10 198518
11 198616
12 198616
13 199015
14 198914
15 198511
16 19869
17 19887
18 19895
19 19871
20 19891

About M. Boukerche

M. Boukerche is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Geophysics and Computational Mechanics, having authored 21 papers that have together received 433 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (20 papers), Semiconductor Quantum Structures and Devices (18 papers), Chalcogenide Semiconductor Thin Films (12 papers), Machine Learning in Materials Science (5 papers), High-pressure geophysics and materials (2 papers), Electronic and Structural Properties of Oxides (2 papers), Semiconductor materials and interfaces (1 paper) and Advanced Chemical Physics Studies (1 paper). The work is most often cited by research in Atomic and Molecular Physics, and Optics (304 citations), Electrical and Electronic Engineering (421 citations), Materials Chemistry (126 citations), Radiation (14 citations) and Instrumentation (5 citations). M. Boukerche has collaborated with scholars based in United States. Frequent co-authors include J. P. Faurie, J. P. Faurie, S. Sivananthan, I. K. Sou, J. Reno, P. S. Wijewarnasuriya, S. Sivananthan, R. Sporken, C. Hsu and J. L. Reno. Their work appears in journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Physics Letters, Journal of Applied Physics, Journal of Crystal Growth and Superlattices and Microstructures.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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