L.G. Feinstein
Impact in
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- Copper Interconnects and Reliability
- Mechanics of Materials top 10%
- Metal and Thin Film Mechanics
Papers in
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- Semiconductor materials and devices 11
- Electronic Packaging and Soldering Technologies 7
- Silicon and Solar Cell Technologies 3
-
- Ferroelectric and Piezoelectric Materials 4
- Co-authors
- R. N. Castellano (2 shared papers)Eric Blanc (2 shared papers)D. Gerstenberg (2 shared papers)D. P. Shoemaker (2 shared papers)David W. Peters (2 shared papers)Neil Sbar (2 shared papers)R. M. Lum (1 shared paper)J. MacNaughton (1 shared paper)
- Journals
- Surface Science (7 papers)Thin Solid Films (5 papers)Journal of Applied Physics (2 papers)Microelectronics Reliability (2 papers)Physics Letters A (1 paper)
- Partner nations
- United StatesCanada
In The Last Decade
L.G. Feinstein
35 papers receiving 509 citations
Peers
Comparison fields: 5 of 49
- Electronic, Optical and Magnetic Materials 120
- Mechanics of Materials 152
- Surfaces, Coatings and Films 40
- Materials Chemistry 240
- Electrical and Electronic Engineering 289
Countries citing papers authored by L.G. Feinstein
This map shows the geographic impact of L.G. Feinstein's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L.G. Feinstein with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L.G. Feinstein more than expected).
Fields of papers citing papers by L.G. Feinstein
This network shows the impact of papers produced by L.G. Feinstein. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L.G. Feinstein. The network helps show where L.G. Feinstein may publish in the future.
Co-authors
The 12 scholars most cited alongside L.G. Feinstein, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 37 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1979 | 149 | |
| 2 | 1973 | 87 | |
| 3 | 1970 | 31 | |
| 4 | 1965 | 23 | |
| 5 | 1974 | 23 | |
| 6 | 1972 | 23 | |
| 7 | 1979 | 21 | |
| 8 | 1965 | 20 | |
| 9 | 1970 | 20 | |
| 10 | 1969 | 17 | |
| 11 | 1987 | 14 | |
| 12 | 1981 | 13 | |
| 13 | 1971 | 12 | |
| 14 | 1977 | 10 | |
| 15 | Surface-crack detection by microwave methods. | 1967 | 10 |
| 16 | 1971 | 8 | |
| 17 | 1979 | 8 | |
| 18 | 1969 | 7 | |
| 19 | 1970 | 6 | |
| 20 | 1972 | 6 |
About L.G. Feinstein
L.G. Feinstein is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Mechanics of Materials, Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics, having authored 37 papers that have together received 558 indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), Electronic Packaging and Soldering Technologies (7 papers), Copper Interconnects and Reliability (7 papers), Metal and Thin Film Mechanics (6 papers), Electron and X-Ray Spectroscopy Techniques (4 papers), Ferroelectric and Piezoelectric Materials (4 papers), Advanced Chemical Physics Studies (3 papers) and Silicon and Solar Cell Technologies (3 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (120 citations), Mechanics of Materials (152 citations), Surfaces, Coatings and Films (40 citations), Materials Chemistry (240 citations) and Electrical and Electronic Engineering (289 citations). L.G. Feinstein has collaborated with scholars based in United States and Canada. Frequent co-authors include R. N. Castellano, Eric Blanc, D. Gerstenberg, D. P. Shoemaker, David W. Peters, Neil Sbar, R. M. Lum, J. MacNaughton, G. H. Trilling and Roberto Pagano. Their work appears in journals such as Surface Science, Thin Solid Films, Journal of Applied Physics, Microelectronics Reliability and Physics Letters A.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.