Leena Lepistö
- Computer Vision and Pattern Recognition top 5%
- Mechanical Engineering
- Media Technology top 5%
- Artificial Intelligence
- Industrial and Manufacturing Engineering top 10%
- Topics
- Image Retrieval and Classification Techniques (18 papers)Advanced Image and Video Retrieval Techniques (11 papers)Image Processing and 3D Reconstruction (7 papers)
In The Last Decade
Leena Lepistö
22 papers receiving 313 citations
Peers
Comparison fields: 5 of 71
- Computer Vision and Pattern Recognition 262
- Mechanical Engineering 74
- Media Technology 66
- Artificial Intelligence 52
- Industrial and Manufacturing Engineering 32
Countries citing papers authored by Leena Lepistö
This map shows the geographic impact of Leena Lepistö's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Leena Lepistö with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Leena Lepistö more than expected).
Fields of papers citing papers by Leena Lepistö
This network shows the impact of papers produced by Leena Lepistö. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Leena Lepistö. The network helps show where Leena Lepistö may publish in the future.
Co-authorship network of co-authors of Leena Lepistö
This figure shows the co-authorship network connecting the top 25 collaborators of Leena Lepistö. A scholar is included among the top collaborators of Leena Lepistö based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Leena Lepistö. Leena Lepistö is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 7 | |
| 2 | 2 | |
| 3 | 1 | |
| 4 | 27 | |
| 5 | Colour and Texture Based Classification of Rock Images Using Classifier Combinations | 6 |
| 6 | 8 | |
| 7 | 12 | |
| 8 | 9 | |
| 9 | 1 | |
| 10 | 52 | |
| 11 | 45 | |
| 12 | 31 | |
| 13 | 20 | |
| 14 | 12 | |
| 15 | 34 | |
| 16 | Rock Image Classification Using Non-Homogenous Textures and Spectral Imaging | 30 |
| 17 | Binary Histogram in Image Classification for Retrieval Purposes | 10 |
| 18 | 13 | |
| 19 | 2 | |
| 20 | 5 |
About Leena Lepistö
Leena Lepistö is a scholar working on Computer Vision and Pattern Recognition, Media Technology and Industrial and Manufacturing Engineering, having authored 23 papers that have together received 352 indexed citations. Recurring topics across this work include Image Retrieval and Classification Techniques (18 papers), Advanced Image and Video Retrieval Techniques (11 papers) and Image Processing and 3D Reconstruction (7 papers). The work is most often cited by research in Computer Vision and Pattern Recognition (262 citations), Media Technology (66 citations) and Industrial and Manufacturing Engineering (32 citations). Leena Lepistö has collaborated with scholars based in Finland and Ukraine. Frequent co-authors include Iivari Kunttu, Ari Visa, Karen Egiazarian, Vladimir Lukin and Nikolay Ponomarenko. Their work appears in journals such as Pattern Recognition Letters, Optical Engineering and Machine Vision and Applications.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.