L. Ouellet

401 citations
19 papers · 342 · h-index 11

Impact in

Papers in

L. Ouellet

19 papers receiving 334 citations

Peers

L. Ouellet
Comparison fields: 5 of 47
  • Materials Chemistry 184
  • Electrical and Electronic Engineering 220
  • Electronic, Optical and Magnetic Materials 70
  • Surfaces, Coatings and Films 25
  • Ceramics and Composites 20
Replace Sebastião Gomes dos Santos Filho with:
Sebastião Gomes dos Santos Filho Brazil
J. Dudonis Lithuania
Christopher P. Murray Ireland
Arthur Sherman United States
C. B. Samantaray United States
Jiro Yota United States
Jebreel M. Khoshman Jordan
L.G. Gosset France
Yasuo Hirabayashi Japan
M. Djafari-Rouhani France
L. Ouellet relative to Sebastião Gomes dos Santos Filho Brazil Sebastião Gomes dos Santos Filho's profile →
Citations per field
00.5×2.8×
Sebastião Gomes dos Santos Filho · 1×
Citations per year

Countries citing papers authored by L. Ouellet

Since Specialization
Citations

This map shows the geographic impact of L. Ouellet's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Ouellet with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Ouellet more than expected).

Fields of papers citing papers by L. Ouellet

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L. Ouellet. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Ouellet. The network helps show where L. Ouellet may publish in the future.

Co-authors

The 19 scholars most cited alongside L. Ouellet, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with L. Ouellet Line = papers co-authored together L. Ouellet links everyone, so they are left out of the graph.

All Works

19 of 19 papers shown
#Work
1 199449
2 200740
3 200432
4 200431
5 199530
6 200730
7 200627
8 201227
9 200719
10 199614
11 200511
12 19968
13 19986
14 19995
15 19955
16 19963
17 19963
18 19931
19 19961

About L. Ouellet

L. Ouellet is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 19 papers that have together received 342 indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), Metal and Thin Film Mechanics (10 papers), Copper Interconnects and Reliability (10 papers), Semiconductor materials and interfaces (7 papers), Electronic and Structural Properties of Oxides (3 papers), Ferroelectric and Piezoelectric Materials (2 papers), Aluminum Alloys Composites Properties (2 papers) and Advanced Welding Techniques Analysis (1 paper). The work is most often cited by research in Materials Chemistry (184 citations), Electrical and Electronic Engineering (220 citations), Electronic, Optical and Magnetic Materials (70 citations), Surfaces, Coatings and Films (25 citations) and Ceramics and Composites (20 citations). L. Ouellet has collaborated with scholars based in Canada, United States and France. Frequent co-authors include D. Brassard, My Alı El Khakani, D.K. Sarkar, G. Gagnon, J. F. Currie, S. C. Gujrathi, Mario Caron, J. L. Brebner, Stéphane Blain and J. R. Currie. Their work appears in journals such as Journal of Applied Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Physics Letters, Thin Solid Films and Optics Express.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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