Kuo-Yu Chou
- Automotive Engineering top 5%
- Mechanical Engineering top 10%
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering top 5%
- Biomedical Engineering
- Co-authors
- Calvin Yi‐Ping ChaoFu-Lung HsuehKenneth L. ShepardJames C. EarthmanXue GongOmar RodriguezPaul AllisonD.K. Francis
- Topics
- CCD and CMOS Imaging Sensors (8 papers)Integrated Circuits and Semiconductor Failure Analysis (6 papers)Additive Manufacturing Materials and Processes (5 papers)
- Partner nations
- TaiwanUnited StatesFrance
In The Last Decade
Kuo-Yu Chou
18 papers receiving 455 citations
Peers
Comparison fields: 5 of 51
- Automotive Engineering 253
- Mechanical Engineering 218
- Electrical and Electronic Engineering 165
- Industrial and Manufacturing Engineering 143
- Biomedical Engineering 71
Countries citing papers authored by Kuo-Yu Chou
This map shows the geographic impact of Kuo-Yu Chou's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kuo-Yu Chou with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kuo-Yu Chou more than expected).
Fields of papers citing papers by Kuo-Yu Chou
This network shows the impact of papers produced by Kuo-Yu Chou. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kuo-Yu Chou. The network helps show where Kuo-Yu Chou may publish in the future.
Co-authorship network of co-authors of Kuo-Yu Chou
This figure shows the co-authorship network connecting the top 25 collaborators of Kuo-Yu Chou. A scholar is included among the top collaborators of Kuo-Yu Chou based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kuo-Yu Chou. Kuo-Yu Chou is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 8 | |
| 3 | 6 | |
| 4 | 10 | |
| 5 | 12 | |
| 6 | 16 | |
| 7 | 25 | |
| 8 | 29 | |
| 9 | Thermal Property Measurement Methods and Analysis for Additive Manufacturing Solids and Powders | 5 |
| 10 | 18 | |
| 11 | 33 | |
| 12 | 12 | |
| 13 | 6 | |
| 14 | 18 | |
| 15 | 4 | |
| 16 | 0 | |
| 17 | 242 | |
| 18 | 16 | |
| 19 | 7 | |
| 20 | 13 |
About Kuo-Yu Chou
Kuo-Yu Chou is a scholar working on Instrumentation, Hardware and Architecture and Automotive Engineering, having authored 20 papers that have together received 480 indexed citations. Recurring topics across this work include CCD and CMOS Imaging Sensors (8 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers) and Additive Manufacturing Materials and Processes (5 papers). The work is most often cited by research in Automotive Engineering (253 citations), Industrial and Manufacturing Engineering (143 citations) and Instrumentation (32 citations). Kuo-Yu Chou has collaborated with scholars based in Taiwan, United States and France. Frequent co-authors include Calvin Yi‐Ping Chao, Fu-Lung Hsueh, Kenneth L. Shepard, James C. Earthman, Xue Gong, Omar Rodriguez, Paul Allison, D.K. Francis, Ming‐Jer Chen and O.G. Rivera. Their work appears in journals such as Materials Science and Engineering A, Sensors and IEEE Journal of Solid-State Circuits.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.