Ki-Lim Han

865 total citations
29 papers, 717 citations indexed

About

Ki-Lim Han is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Biomedical Engineering. According to data from OpenAlex, Ki-Lim Han has authored 29 papers receiving a total of 717 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 13 papers in Materials Chemistry and 3 papers in Biomedical Engineering. Recurrent topics in Ki-Lim Han's work include Thin-Film Transistor Technologies (20 papers), Semiconductor materials and devices (18 papers) and ZnO doping and properties (12 papers). Ki-Lim Han is often cited by papers focused on Thin-Film Transistor Technologies (20 papers), Semiconductor materials and devices (18 papers) and ZnO doping and properties (12 papers). Ki-Lim Han collaborates with scholars based in South Korea, United States and Australia. Ki-Lim Han's co-authors include Jin‐Seong Park, Hyun‐Jun Jeong, TaeHyun Hong, Jiazhen Sheng, Chih‐Tang Sah, A. Neugroschel, Saeroonter Oh, J. Kavalieros, Toshikazu Nishida and Michael S. Carroll and has published in prestigious journals such as Applied Physics Letters, ACS Applied Materials & Interfaces and Applied Surface Science.

In The Last Decade

Ki-Lim Han

29 papers receiving 698 citations

Peers

Ki-Lim Han

EEE

EOMM

KeeChan Park South Korea

Woonggi Hong South Korea

Chun‐Cheng Cheng Taiwan

Yung‐Hui Yeh Taiwan

Brian Cobb Netherlands

Jen-Chung Lou Taiwan

Sungju Choi South Korea

Min Ju Kim South Korea

Dong‐Kyun Ban South Korea

Himchan Oh South Korea

KeeChan Park South Korea

Ki-Lim Han

1.1k ×1.5

EEE

552 ×1.7

148 ×1.2

154 ×1.7

42 ×1.4

EOMM

Citations per year, relative to Ki-Lim Han Ki-Lim Han (= 1×) peers KeeChan Park

Countries citing papers authored by Ki-Lim Han

Since Specialization

Citations

This map shows the geographic impact of Ki-Lim Han's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ki-Lim Han with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ki-Lim Han more than expected).

Fields of papers citing papers by Ki-Lim Han

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ki-Lim Han. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ki-Lim Han. The network helps show where Ki-Lim Han may publish in the future.

Co-authorship network of co-authors of Ki-Lim Han

This figure shows the co-authorship network connecting the top 25 collaborators of Ki-Lim Han. A scholar is included among the top collaborators of Ki-Lim Han based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ki-Lim Han. Ki-Lim Han is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Hong, TaeHyun, Su‐Hwan Choi, Seung-Hwan Lee, et al.. (2022). Structural, Optical, and Electrical Properties of InO_x Thin Films Deposited by Plasma-Enhanced Atomic Layer Deposition for Flexible Device Applications. ACS Applied Electronic Materials. 4(6). 3010–3017. 19 indexed citations

Kim, Yong‐Duck, Ki-Lim Han, Jin‐Seong Park, & Byong‐Deok Choi. (2022). 5‐3: A Random Access Gate Driver Using a‐IGZO TFTs for External Compensation of High‐Resolution, High‐Frame‐Rate AMOLEDs. SID Symposium Digest of Technical Papers. 53(1). 32–35. 2 indexed citations

Kim, Yong‐Duck, et al.. (2021). Effects of Tensile Strain on Dynamic and Static Inverters Using Amorphous Indium-Gallium-Zinc-Oxide TFTs. IEEE Electron Device Letters. 42(3). 359–362. 3 indexed citations

Lee, Seung-Hwan, et al.. (2021). An organic–inorganic hybrid semiconductor for flexible thin film transistors using molecular layer deposition. Journal of Materials Chemistry C. 9(12). 4322–4329. 15 indexed citations

Han, Ki-Lim, et al.. (2021). Mechanical Durability of Flexible/Stretchable a-IGZO TFTs on PI Island for Wearable Electronic Application. ACS Applied Electronic Materials. 3(11). 5037–5047. 42 indexed citations

Han, Ki-Lim, et al.. (2020). Cryogenic Temperature Induced Instability of 200MHz CMOS Operational Amplifier. 1–8. 1 indexed citations

Jeong, Hyun‐Jun, Beom‐Su Kim, Ki-Lim Han, Saeroonter Oh, & Jin‐Seong Park. (2019). Quantitative analysis of interface trap recovery caused by repetitive bending stress in flexible oxide thin-film transistors. Japanese Journal of Applied Physics. 58(5). 50906–50906. 10 indexed citations

Han, Ki-Lim, et al.. (2019). Recent review on improving mechanical durability for flexible oxide thin film transistors. Journal of Physics D Applied Physics. 52(48). 483002–483002. 11 indexed citations

Kim, Yong‐Duck, et al.. (2019). Electrical Stability Analysis of Dynamic Logic Using Amorphous Indium–Gallium–Zinc-Oxide TFTs. IEEE Electron Device Letters. 40(7). 1128–1131. 8 indexed citations

10.

Han, Ki-Lim, et al.. (2019). Organic/Inorganic Hybrid Buffer in InGaZnO Transistors under Repetitive Bending Stress for High Electrical and Mechanical Stability. ACS Applied Materials & Interfaces. 12(3). 3784–3791. 24 indexed citations

11.

Kim, Jong-Seok, et al.. (2018). A High-Reliability Carry-Free Gate Driver for Flexible Displays Using a-IGZO TFTs. IEEE Transactions on Electron Devices. 65(8). 3269–3276. 20 indexed citations

12.

Jeong, Hyun‐Jun, et al.. (2018). Effects of Repetitive Mechanical Stress on Flexible Oxide Thin-Film Transistors and Stress Reduction via Additional Organic Layer. IEEE Electron Device Letters. 39(7). 971–974. 27 indexed citations

13.

Han, Ki-Lim, et al.. (2018). Comparative Study on Hydrogen Behavior in InGaZnO Thin Film Transistors with a SiO2/SiNx/SiO2 Buffer on Polyimide and Glass Substrates. Electronic Materials Letters. 14(6). 749–754. 15 indexed citations

14.

Han, Ki-Lim, et al.. (2017). Effect of hydrogen on the device performance and stability characteristics of amorphous InGaZnO thin-film transistors with a SiO2/SiNx/SiO2 buffer. Applied Physics Letters. 111(6). 40 indexed citations

15.

Jeong, Hyun‐Jun, et al.. (2017). Effect of mechanical stress on the stability of flexible InGaZnO thin-film transistors. Journal of Information Display. 18(2). 87–91. 37 indexed citations

16.

Kim, Jong-Seok, et al.. (2017). Dynamic Logic Circuits Using a-IGZO TFTs. IEEE Transactions on Electron Devices. 64(10). 4123–4130. 27 indexed citations

17.

Neugroschel, A., et al.. (1998). Current-accelerated channel hot carrier stressof MOS transistors. Electronics Letters. 34(2). 217–219. 7 indexed citations

18.

Han, Ki-Lim, et al.. (1997). Linear reduction of drain current with increasinginterface recombination in n MOS transistors stressed by channel hot electrons. Electronics Letters. 33(21). 1821–1822. 4 indexed citations

19.

Sah, Chih‐Tang, A. Neugroschel, Ki-Lim Han, & J. Kavalieros. (1996). Profiling interface traps in MOS transistors by the DC current-voltage method. IEEE Electron Device Letters. 17(2). 72–74. 19 indexed citations

20.

Han, Ki-Lim & Toshikazu Nishida. (1995). Sequential substrate and channel hot electron injection to separate oxide and interface traps in n-MOSTs. Solid-State Electronics. 38(1). 105–113. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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