Kai-Yuan Chao

990 citations
58 papers · 760 indexed · h-index 15

Kai-Yuan Chao

54 papers receiving 736 citations

Peers

Kai-Yuan Chao
Comparison fields: 5 of 45
  • Hardware and Architecture 377
  • Electrical and Electronic Engineering 690
  • Computer Networks and Communications 177
  • Computer Graphics and Computer-Aided Design 23
  • Industrial and Manufacturing Engineering 36
Replace Yici Cai with:
Yici Cai China
Jin-Tai Yan Taiwan
Jhih-Rong Gao United States
Sheqin Dong China
Shmuel Wimer Israel
Kun Yuan United States
Hailong Yao China
Saurabh Adya United States
Ping-Hung Yuh Taiwan
Kai-Yuan Chao relative to Yici Cai China Yici Cai's profile →
Citations per field
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Yici Cai · 1×
Citations per year

Countries citing papers authored by Kai-Yuan Chao

Since Specialization
Citations

This map shows the geographic impact of Kai-Yuan Chao's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kai-Yuan Chao with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kai-Yuan Chao more than expected).

Fields of papers citing papers by Kai-Yuan Chao

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Kai-Yuan Chao. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kai-Yuan Chao. The network helps show where Kai-Yuan Chao may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Kai-Yuan Chao, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Kai-Yuan Chao Line = papers co-authored together Kai-Yuan Chao links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20241
2 202423
3 20240
4 20226
5 202128
6 20119
7 20117
8 201012
9 20101
10 201013
11 200827
12 20083
13 20084
14 200717
15 200717
16 200633
17 200242
18 20024
19 19957
20 19942

About Kai-Yuan Chao

Kai-Yuan Chao is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 58 papers that have together received 760 indexed citations. Recurring topics across this work include VLSI and FPGA Design Techniques (43 papers), VLSI and Analog Circuit Testing (26 papers), Low-power high-performance VLSI design (22 papers), 3D IC and TSV technologies (17 papers), Advancements in Photolithography Techniques (16 papers), Interconnection Networks and Systems (8 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and Electromagnetic Compatibility and Noise Suppression (3 papers). The work is most often cited by research in Hardware and Architecture (377 citations), Electrical and Electronic Engineering (690 citations) and Computer Networks and Communications (177 citations). Kai-Yuan Chao has collaborated with scholars based in United States, Taiwan and Hong Kong. Frequent co-authors include Martin D. F. Wong, Yih-Lang Li, Wenhao Liu, Cheng‐Kok Koh, Ting-Chi Wang, Kuang‐Yao Lee, Hongbo Zhang, Hua Xiang, Yuelin Du and Wenhao Liu. Their work appears in journals such as Nature Nanotechnology, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Journal on Emerging and Selected Topics in Circuits and Systems.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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