K. Prume

675 total citations
22 papers, 540 citations indexed

About

K. Prume is a scholar working on Biomedical Engineering, Materials Chemistry and Electrical and Electronic Engineering. According to data from OpenAlex, K. Prume has authored 22 papers receiving a total of 540 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Biomedical Engineering, 17 papers in Materials Chemistry and 11 papers in Electrical and Electronic Engineering. Recurrent topics in K. Prume's work include Ferroelectric and Piezoelectric Materials (17 papers), Acoustic Wave Resonator Technologies (16 papers) and Advanced MEMS and NEMS Technologies (7 papers). K. Prume is often cited by papers focused on Ferroelectric and Piezoelectric Materials (17 papers), Acoustic Wave Resonator Technologies (16 papers) and Advanced MEMS and NEMS Technologies (7 papers). K. Prume collaborates with scholars based in Germany, Switzerland and United States. K. Prume's co-authors include Rainer Waser, S. Tiedke, R. Meyer, Paul Muralt, F. Calame, Thorsten Schmitz-Kempen, Andreas Roelofs, U. Böttger, B. Reichenberg and Theodor Schneller and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of the American Ceramic Society.

In The Last Decade

K. Prume

22 papers receiving 530 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
K. Prume Germany 14 386 293 239 107 78 22 540
G.M. Yang Germany 13 222 0.6× 178 0.6× 205 0.9× 56 0.5× 59 0.8× 28 449
F. Felten Germany 11 277 0.7× 166 0.6× 210 0.9× 79 0.7× 146 1.9× 19 536
R. Pérez Spain 14 638 1.7× 385 1.3× 367 1.5× 231 2.2× 122 1.6× 42 771
P. Gaucher France 15 661 1.7× 405 1.4× 450 1.9× 260 2.4× 44 0.6× 44 778
Qun Li China 10 708 1.8× 363 1.2× 309 1.3× 274 2.6× 109 1.4× 30 800
Yan Peng China 15 354 0.9× 172 0.6× 308 1.3× 159 1.5× 81 1.0× 77 647
Stéphane Hiboux Switzerland 14 723 1.9× 514 1.8× 355 1.5× 237 2.2× 81 1.0× 26 815
G. Vélu France 15 545 1.4× 305 1.0× 539 2.3× 216 2.0× 37 0.5× 68 817
Martha Small United States 10 136 0.4× 303 1.0× 230 1.0× 40 0.4× 162 2.1× 22 500
M. Aïd France 12 224 0.6× 246 0.8× 225 0.9× 86 0.8× 38 0.5× 41 415

Countries citing papers authored by K. Prume

Since Specialization
Citations

This map shows the geographic impact of K. Prume's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Prume with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Prume more than expected).

Fields of papers citing papers by K. Prume

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Prume. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Prume. The network helps show where K. Prume may publish in the future.

Co-authorship network of co-authors of K. Prume

This figure shows the co-authorship network connecting the top 25 collaborators of K. Prume. A scholar is included among the top collaborators of K. Prume based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. Prume. K. Prume is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Prume, K., et al.. (2010). High-rate sputtering of thick PZT thin films for MEMS. Journal of Electroceramics. 25(2-4). 198–202. 13 indexed citations
2.
Kamlah, Marc, et al.. (2008). Effective Piezoelectric Coefficients of Ferroelectric Thin Films on Elastic Substrates. Journal of Intelligent Material Systems and Structures. 20(6). 683–695. 7 indexed citations
3.
Prume, K., Paul Muralt, F. Calame, Thorsten Schmitz-Kempen, & S. Tiedke. (2007). Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals. Journal of Electroceramics. 19(4). 407–411. 26 indexed citations
4.
Prume, K., Paul Muralt, Thorsten Schmitz-Kempen, & S. Tiedke. (2007). Tensile and compressive stress dependency of the transverse (e31,f) piezoelectric coefficient of PZT thin films for MEMS devices. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6526. 65260G–65260G. 3 indexed citations
5.
Prume, K., Paul Muralt, F. Calame, Thorsten Schmitz-Kempen, & S. Tiedke. (2007). Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices. IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control. 54(1). 8–14. 74 indexed citations
6.
Calame, F., et al.. (2007). Chemically derived seeding layer for {100}-textured PZT thin films. Journal of Electroceramics. 19(4). 311–314. 14 indexed citations
7.
Ræder, H., W.E. Booij, F. Calame, et al.. (2007). Taking piezoelectric microsystems from the laboratory to production. Journal of Electroceramics. 19(4). 357–362. 13 indexed citations
8.
Booij, W.E., et al.. (2007). A simple and powerful analytical model for MEMS piezoelectric multimorphs. Journal of Electroceramics. 19(4). 387–393. 4 indexed citations
9.
Meyer, R., et al.. (2005). Dynamic leakage current compensation in ferroelectric thin-film capacitor structures. Applied Physics Letters. 86(14). 128 indexed citations
10.
11.
Gerber, Peter Arne, Andreas Roelofs, C. Kügeler, et al.. (2004). Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films. Journal of Applied Physics. 96(5). 2800–2804. 30 indexed citations
12.
Prume, K., et al.. (2003). In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements. Journal of the European Ceramic Society. 24(6). 1145–1147. 18 indexed citations
13.
Prume, K., et al.. (2002). Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs). Journal of the European Ceramic Society. 22(8). 1285–1296. 25 indexed citations
14.
15.
16.
Tiedke, S., K. Prume, Andreas Roelofs, et al.. (2001). Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope. Applied Physics Letters. 79(22). 3678–3680. 59 indexed citations
17.
Prume, K., S. Tiedke, Andreas Roelofs, et al.. (2001). Electrical measurements on capacitor sizes in the submicron regime for the characterization of real memory cell capacitors. Integrated ferroelectrics. 37(1-4). 163–172. 4 indexed citations
18.
Prume, K., et al.. (2000). Finite‐Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads. Journal of the American Ceramic Society. 83(6). 1433–1440. 43 indexed citations
19.
Prume, K., et al.. (2000). Finite‐Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test. Journal of the American Ceramic Society. 83(5). 1153–1159. 17 indexed citations
20.
Prume, K., et al.. (1999). 3-Dimensional FEM simulations of resonances in the impedance characteristic of ceramic multilayer capacitors. Ferroelectrics. 224(1). 185–194. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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