K. L. Westra

1.1k total citations
29 papers, 912 citations indexed

About

K. L. Westra is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Mechanics of Materials. According to data from OpenAlex, K. L. Westra has authored 29 papers receiving a total of 912 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 14 papers in Atomic and Molecular Physics, and Optics and 12 papers in Mechanics of Materials. Recurrent topics in K. L. Westra's work include Force Microscopy Techniques and Applications (10 papers), Metal and Thin Film Mechanics (9 papers) and Optical Coatings and Gratings (6 papers). K. L. Westra is often cited by papers focused on Force Microscopy Techniques and Applications (10 papers), Metal and Thin Film Mechanics (9 papers) and Optical Coatings and Gratings (6 papers). K. L. Westra collaborates with scholars based in Canada, United States and Japan. K. L. Westra's co-authors include D. J. Thomson, Michael J. Brett, Velimir Radmilović, Zonghoon Lee, Stéphane Evoy, David Mitlin, Colin Ophus, U. Dahmen, T. Smy and Mirwais Aktary and has published in prestigious journals such as Advanced Materials, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

K. L. Westra

28 papers receiving 874 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
K. L. Westra Canada 15 404 357 318 272 232 29 912
S. Baba Japan 17 287 0.7× 303 0.8× 297 0.9× 331 1.2× 142 0.6× 55 805
Cock Lodder Netherlands 12 247 0.6× 125 0.4× 270 0.8× 532 2.0× 220 0.9× 35 906
John L. Vossen United States 10 364 0.9× 266 0.7× 536 1.7× 134 0.5× 135 0.6× 18 823
C.A. Carosella United States 16 444 1.1× 342 1.0× 309 1.0× 124 0.5× 84 0.4× 53 805
Steven C. Seel United States 10 385 1.0× 349 1.0× 367 1.2× 163 0.6× 112 0.5× 11 794
C.V. Falub Switzerland 20 669 1.7× 389 1.1× 608 1.9× 447 1.6× 262 1.1× 76 1.2k
D. Frankel United States 20 295 0.7× 212 0.6× 493 1.6× 228 0.8× 570 2.5× 37 1.0k
Sergey Grachev France 15 415 1.0× 307 0.9× 298 0.9× 164 0.6× 80 0.3× 45 759
W. Pamler Germany 16 323 0.8× 162 0.5× 601 1.9× 265 1.0× 303 1.3× 50 951
M. Wienecke Germany 16 423 1.0× 176 0.5× 412 1.3× 138 0.5× 118 0.5× 53 784

Countries citing papers authored by K. L. Westra

Since Specialization
Citations

This map shows the geographic impact of K. L. Westra's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. L. Westra with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. L. Westra more than expected).

Fields of papers citing papers by K. L. Westra

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. L. Westra. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. L. Westra. The network helps show where K. L. Westra may publish in the future.

Co-authorship network of co-authors of K. L. Westra

This figure shows the co-authorship network connecting the top 25 collaborators of K. L. Westra. A scholar is included among the top collaborators of K. L. Westra based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. L. Westra. K. L. Westra is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Mohammad, Mohammad, et al.. (2011). Comparison between ZEP and PMMA resists for nanoscale electron beam lithography experimentally and by numerical modeling. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 29(6). 06F306–06F306. 38 indexed citations
2.
Luber, Erik J., Reza Mohammadi, Colin Ophus, et al.. (2008). Tailoring the microstructure and surface morphology of metal thin films for nano-electro-mechanical systems applications. Nanotechnology. 19(12). 125705–125705. 16 indexed citations
3.
Mohammad, Mohammad, et al.. (2007). Nanoscale resist morphologies of dense gratings using electron-beam lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 25(3). 745–753. 7 indexed citations
4.
Aktary, Mirwais, K. L. Westra, M. R. Freeman, & Yasutaka Tanaka. (2006). Synthesis and characterization of calixarene derivatives as resist materials for electron-beam lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 24(1). 267–270. 3 indexed citations
5.
Westra, K. L., et al.. (2006). Fabrication of nanoelectromechanical resonators using a cryogenic etching technique. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 24(6). 2769–2771. 2 indexed citations
6.
Smy, T., R. Niall Tait, K. L. Westra, & Michael J. Brett. (2003). Simulation of density variation and step coverage for via metallization. 821. 292–298. 2 indexed citations
7.
Aktary, Mirwais, Martin O. Jensen, K. L. Westra, Michael J. Brett, & M. R. Freeman. (2003). High-resolution pattern generation using the epoxy novolak SU-8 2000 resist by electron beam lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 21(4). L5–L7. 53 indexed citations
8.
Vick, D., Michael J. Brett, & K. L. Westra. (2002). Porous thin films for the characterization of atomic force microscope tip morphology. Thin Solid Films. 408(1-2). 79–86. 7 indexed citations
9.
Westra, K. L. & D. J. Thomson. (1995). Effect of tip shape on surface roughness measurements from atomic force microscopy images of thin films. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(2). 344–349. 80 indexed citations
10.
Westra, K. L. & D. J. Thomson. (1995). The microstructure of thin films observed using atomic force microscopy. Thin Solid Films. 257(1). 15–21. 43 indexed citations
11.
Westra, K. L. & D. J. Thomson. (1994). Atomic force microscope tip radius needed for accurate imaging of thin film surfaces. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(6). 3176–3181. 36 indexed citations
12.
Westra, K. L., et al.. (1993). Tip artifacts in atomic force microscope imaging of thin film surfaces. Journal of Applied Physics. 74(5). 3608–3610. 84 indexed citations
13.
Westra, K. L. & D. J. Thomson. (1992). A Comparison of AFM, SEM, and TEM Analysis of AL/SI/CU Thin Films. MRS Proceedings. 260.
14.
Kornelsen, K., Martin Dressel, J. E. Eldridge, Michael J. Brett, & K. L. Westra. (1991). Far-infrared optical absorption and reflectivity of a superconducting NbN film. Physical review. B, Condensed matter. 44(21). 11882–11887. 22 indexed citations
15.
Westra, K. L., et al.. (1990). Properties of reactively sputtered NbN films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8(3). 1288–1293. 14 indexed citations
16.
Westra, K. L. & Michael J. Brett. (1990). Near IR optical properties of sputtered InN films. Thin Solid Films. 192(2). 227–234. 12 indexed citations
17.
Smy, T., K. L. Westra, & Michael J. Brett. (1990). Simulation of density variation and step coverage for a variety of via/contact geometries using SIMBAD. IEEE Transactions on Electron Devices. 37(3). 591–598. 28 indexed citations
18.
Brett, Michael J., K. L. Westra, & T. Smy. (1989). Simulation of thin film step coverage and microstructure. Canadian Journal of Physics. 67(4). 347–350. 2 indexed citations
19.
Sullivan, Brian, R. R. Parsons, K. L. Westra, & Michael J. Brett. (1988). Optical properties and microstructure of reactively sputtered indium nitride thin films. Journal of Applied Physics. 64(8). 4144–4149. 32 indexed citations
20.
Westra, K. L., et al.. (1988). The effects of oxygen contamination on the properties of reactively sputtered indium nitride films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 6(3). 1730–1732. 67 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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