Jun-Sik Yoon

1.6k total citations
74 papers, 1.1k citations indexed

About

Jun-Sik Yoon is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Computer Networks and Communications. According to data from OpenAlex, Jun-Sik Yoon has authored 74 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 69 papers in Electrical and Electronic Engineering, 20 papers in Biomedical Engineering and 6 papers in Computer Networks and Communications. Recurrent topics in Jun-Sik Yoon's work include Semiconductor materials and devices (57 papers), Advancements in Semiconductor Devices and Circuit Design (54 papers) and Nanowire Synthesis and Applications (19 papers). Jun-Sik Yoon is often cited by papers focused on Semiconductor materials and devices (57 papers), Advancements in Semiconductor Devices and Circuit Design (54 papers) and Nanowire Synthesis and Applications (19 papers). Jun-Sik Yoon collaborates with scholars based in South Korea, United States and United Kingdom. Jun-Sik Yoon's co-authors include Rock‐Hyun Baek, Jinsu Jeong, Seunghwan Lee, Chang‐Ki Baek, Kihyun Kim, Taiuk Rim, Yoon‐Ha Jeong, M. Meyyappan, Seung‐Jun Shin and Jumyung Um and has published in prestigious journals such as Applied Physics Letters, Scientific Reports and Journal of Materials Chemistry A.

In The Last Decade

Jun-Sik Yoon

73 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jun-Sik Yoon South Korea 22 1.0k 261 78 53 51 74 1.1k
Rock‐Hyun Baek South Korea 20 1.1k 1.0× 258 1.0× 78 1.0× 59 1.1× 55 1.1× 121 1.1k
Neha Gupta India 16 646 0.6× 152 0.6× 143 1.8× 78 1.5× 25 0.5× 72 1.0k
Doyoung Jang Belgium 23 1.3k 1.3× 356 1.4× 184 2.4× 29 0.5× 90 1.8× 58 1.5k
Jaehyun Lee South Korea 16 680 0.7× 168 0.6× 199 2.6× 7 0.1× 85 1.7× 104 906
Haoting Shen United States 17 463 0.4× 149 0.6× 225 2.9× 24 0.5× 32 0.6× 57 701
Ziyu Zhang China 14 428 0.4× 138 0.5× 155 2.0× 81 1.5× 103 2.0× 58 704
Samar K. Saha United States 16 733 0.7× 134 0.5× 43 0.6× 22 0.4× 47 0.9× 79 857
David Fried United States 15 1.1k 1.1× 145 0.6× 64 0.8× 32 0.6× 69 1.4× 42 1.3k
Raffaele De Rose Italy 17 674 0.7× 159 0.6× 31 0.4× 20 0.4× 244 4.8× 64 749
Christophe Lallement France 20 1.2k 1.2× 363 1.4× 85 1.1× 33 0.6× 42 0.8× 84 1.4k

Countries citing papers authored by Jun-Sik Yoon

Since Specialization
Citations

This map shows the geographic impact of Jun-Sik Yoon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jun-Sik Yoon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jun-Sik Yoon more than expected).

Fields of papers citing papers by Jun-Sik Yoon

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jun-Sik Yoon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jun-Sik Yoon. The network helps show where Jun-Sik Yoon may publish in the future.

Co-authorship network of co-authors of Jun-Sik Yoon

This figure shows the co-authorship network connecting the top 25 collaborators of Jun-Sik Yoon. A scholar is included among the top collaborators of Jun-Sik Yoon based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jun-Sik Yoon. Jun-Sik Yoon is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Yoon, Jun-Sik, et al.. (2023). Investigation of Program Efficiency Overshoot in 3D Vertical Channel NAND Flash with Randomly Distributed Traps. Nanomaterials. 13(9). 1451–1451. 1 indexed citations
2.
Yoon, Jun-Sik, et al.. (2023). Quantitative analysis of irregular channel shape effects on charge-trapping efficiency using massive 3D NAND data. Materials Science in Semiconductor Processing. 157. 107333–107333. 5 indexed citations
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Yoon, Jun-Sik & Rock‐Hyun Baek. (2020). Device Design Guideline of 5-nm-Node FinFETs and Nanosheet FETs for Analog/RF Applications. IEEE Access. 8. 189395–189403. 35 indexed citations
7.
Yoon, Jun-Sik, Jinsu Jeong, Seunghwan Lee, & Rock‐Hyun Baek. (2019). Optimization of nanosheet number and width of multi-stacked nanosheet FETs for sub-7-nm node system on chip applications. Japanese Journal of Applied Physics. 58(SB). SBBA12–SBBA12. 26 indexed citations
8.
Yoon, Jun-Sik, et al.. (2019). Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node. IEEE Access. 7. 172290–172295. 15 indexed citations
9.
Yoon, Jun-Sik, Jinsu Jeong, Seunghwan Lee, & Rock‐Hyun Baek. (2019). Sensitivity of Source/Drain Critical Dimension Variations for Sub-5-nm Node Fin and Nanosheet FETs. IEEE Transactions on Electron Devices. 67(1). 258–262. 31 indexed citations
10.
Kang, Gyeongho, Jun-Sik Yoon, Guan‐Woo Kim, et al.. (2019). Electron trapping and extraction kinetics on carrier diffusion in metal halide perovskite thin films. Journal of Materials Chemistry A. 7(45). 25838–25844. 14 indexed citations
11.
Yoon, Jun-Sik, Jinsu Jeong, Seunghwan Lee, & Rock‐Hyun Baek. (2019). Metal Source-/Drain-Induced Performance Boosting of Sub-7-nm Node Nanosheet FETs. IEEE Transactions on Electron Devices. 66(4). 1868–1873. 26 indexed citations
12.
Lee, Yuna, Hyunah Kwon, Jun-Sik Yoon, & Jong Kyu Kim. (2018). Overcoming ineffective resistance modulation in p-type NiO gas sensor by nanoscale Schottky contacts. Nanotechnology. 30(11). 115501–115501. 9 indexed citations
13.
Yoon, Jun-Sik, Jinsu Jeong, Seunghwan Lee, & Rock‐Hyun Baek. (2018). Systematic DC/AC Performance Benchmarking of Sub-7-nm Node FinFETs and Nanosheet FETs. IEEE Journal of the Electron Devices Society. 6. 942–947. 68 indexed citations
14.
Yoon, Jun-Sik, Kihyun Kim, & Chang‐Ki Baek. (2017). Core-shell homojunction silicon vertical nanowire tunneling field-effect transistors. Scientific Reports. 7(1). 41142–41142. 12 indexed citations
15.
Yoon, Jun-Sik, Eui-Young Jeong, Chang‐Ki Baek, et al.. (2015). Junction Design Strategy for Si Bulk FinFETs for System-on-Chip Applications Down to the 7-nm Node. IEEE Electron Device Letters. 36(10). 994–996. 37 indexed citations
16.
Yoon, Jun-Sik, Taiuk Rim, Jungsik Kim, et al.. (2015). Statistical variability study of random dopant fluctuation on gate-all-around inversion-mode silicon nanowire field-effect transistors. Applied Physics Letters. 106(10). 30 indexed citations
17.
Lee, Sanghyun, Eui-Young Jeong, Jun-Sik Yoon, et al.. (2015). Impact of the spacer dielectric constant on parasitic RC and design guidelines to optimize DC/AC performance in 10-nm-node Si-nanowire FETs. Japanese Journal of Applied Physics. 54(4S). 04DN05–04DN05. 10 indexed citations
18.
Lee, Sanghyun, Eui-Young Jeong, Junwoo Jang, et al.. (2013). Characterization of low frequency noise in nanowire FETs considering variability and quantum effects. 123–124. 2 indexed citations
19.
Chung, Phil‐Sang, et al.. (2005). Comparison of Radiotherapy with Laser Cordectomy for T1 Glottic Cancer. Korean Journal of Otorhinolaryngology-head and Neck Surgery. 48(9). 1161–1165. 3 indexed citations
20.
Yoon, Jun-Sik, et al.. (2002). Development of Fault Monitoring Technique for Agitator Driving System. 제어로봇시스템학회 국제학술대회 논문집. 1–6. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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