J.P. Colinge

840 total citations
38 papers, 498 citations indexed

About

J.P. Colinge is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, J.P. Colinge has authored 38 papers receiving a total of 498 indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Electrical and Electronic Engineering, 5 papers in Atomic and Molecular Physics, and Optics and 3 papers in Materials Chemistry. Recurrent topics in J.P. Colinge's work include Semiconductor materials and devices (35 papers), Advancements in Semiconductor Devices and Circuit Design (34 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). J.P. Colinge is often cited by papers focused on Semiconductor materials and devices (35 papers), Advancements in Semiconductor Devices and Circuit Design (34 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). J.P. Colinge collaborates with scholars based in Belgium, France and United States. J.P. Colinge's co-authors include Denis Flandre, A. Terao, V. Bayot, E. Grivei, P. Francis, Renaud Gillon, D. Vanhoenacker, J.‐P. Raskin, A. N. Nazarov and R. Yu and has published in prestigious journals such as Applied Physics Letters, Journal of The Electrochemical Society and Electronics Letters.

In The Last Decade

J.P. Colinge

33 papers receiving 469 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
J.P. Colinge Belgium	14	479	98	84	52	10	38	498
J. Sandford United States	5	490 1.0×	118 1.2×	60 0.7×	49 0.9×	5 0.5×	6	518
P. Charvát United States	4	390 0.8×	93 0.9×	56 0.7×	47 0.9×	4 0.4×	5	412
C. Kerner Belgium	11	347 0.7×	40 0.4×	63 0.8×	26 0.5×	6 0.6×	33	360
C. Ortolland Belgium	11	380 0.8×	55 0.6×	61 0.7×	21 0.4×	6 0.6×	37	392
Jean-Pierre Colinge Ireland	8	924 1.9×	227 2.3×	62 0.7×	75 1.4×	5 0.5×	20	963
C. Weber United States	11	380 0.8×	106 1.1×	56 0.7×	78 1.5×	11 1.1×	25	407
Jagar Singh United States	8	460 1.0×	60 0.6×	233 2.8×	55 1.1×	11 1.1×	13	479
K.G. Anil Belgium	14	437 0.9×	52 0.5×	141 1.7×	38 0.7×	4 0.4×	35	460
T. Yamaguchi United States	12	303 0.6×	57 0.6×	39 0.5×	85 1.6×	4 0.4×	32	315
A. Naem Canada	9	272 0.6×	40 0.4×	105 1.3×	62 1.2×	7 0.7×	28	311

Countries citing papers authored by J.P. Colinge

Since Specialization

Citations

This map shows the geographic impact of J.P. Colinge's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.P. Colinge with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.P. Colinge more than expected).

Fields of papers citing papers by J.P. Colinge

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.P. Colinge. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.P. Colinge. The network helps show where J.P. Colinge may publish in the future.

Co-authorship network of co-authors of J.P. Colinge

This figure shows the co-authorship network connecting the top 25 collaborators of J.P. Colinge. A scholar is included among the top collaborators of J.P. Colinge based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J.P. Colinge. J.P. Colinge is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Bosch, Delphine, X. Garros, Adam Makosiej, et al.. (2019). Novel fine-grain back-bias assist techniques for 3D-monolithic 14 nm FDSOI top-tier SRAMs. Solid-State Electronics. 168. 107720–107720. 1 indexed citations

Royer, C. Le, P. Batude, C. Fenouillet-Béranger, et al.. (2018). New insights on SOI Tunnel FETs with low-temperature process flow for CoolCube™ integration. Solid-State Electronics. 144. 78–85. 6 indexed citations

Colinge, J.P.. (2014). Multigate transistors: Pushing Moore's law to the limit. 313–316. 18 indexed citations

Yu, Tianjun, et al.. (2013). Electrostatics and ballistic transport studies in junctionless nanowire transistors. 85–88. 4 indexed citations

Nazarov, A. N., Isabelle Ferain, Nima Dehdashti Akhavan, et al.. (2011). Field-effect mobility extraction in nanowire field-effect transistors by combination of transfer characteristics and random telegraph noise measurements. Applied Physics Letters. 99(7). 7 indexed citations

Nazarov, A. N., Isabelle Ferain, Nima Dehdashti Akhavan, et al.. (2011). Random telegraph-signal noise in junctionless transistors. Applied Physics Letters. 98(9). 33 indexed citations

Okhonin, S., M. Nagoga, Christopher Lee, et al.. (2008). Ultra-scaled Z-RAM cell. UWA Profiles and Research Repository (University of Western Australia). 24 indexed citations

Xiong, Weize, C. Rinn Cleavelin, K. Schruefer, et al.. (2007). Intrinsic Advantages of SOI Multiple-Gate MOSFET (MuGFET) for Low Power Applications. ECS Transactions. 6(4). 59–69. 11 indexed citations

Xiong, Wenjing, C. Rinn Cleavelin, R. Wise, et al.. (2005). Full/partial depletion effects in FinFETs. 195–197. 3 indexed citations

10.

Tang, Xiaohui, et al.. (2003). An SOI single-electron transistor. Digital Access to Libraries (Université catholique de Louvain (UCL), l'Université de Namur (UNamur) and the Université Saint-Louis (USL-B)). 37. 46–47. 2 indexed citations

11.

Xiong, Wei & J.P. Colinge. (2003). Corner Effect in Multiple-Gate SO1 MOSFETs. 1 indexed citations

12.

Lawrence, R.K., J.P. Colinge, & H.L. Hughes. (2002). Radiation effects in gate-all-around structures. 80–81. 13 indexed citations

13.

Nazarov, A. N., et al.. (1997). Research of high-temperature instability processes in buried dielectric of full depleted SOI MOSFET's. Microelectronic Engineering. 36(1-4). 363–366. 3 indexed citations

14.

Francis, P., J.P. Colinge, & Denis Flandre. (1997). Comparison of self-heating effect in GAA and SOI mosfets. Microelectronics Reliability. 37(1). 61–75. 4 indexed citations

15.

Gentinne, B., Denis Flandre, J.P. Colinge, & F. Van de Wiele. (1996). Measurement and two-dimensional simulation of thin-film SOI MOSFETs: Intrinsic gate capacitances at elevated temperatures. Solid-State Electronics. 39(11). 1613–1619. 2 indexed citations

16.

Colinge, J.P., et al.. (1996). A silicon-on-insulator quantum wire. Solid-State Electronics. 39(1). 49–51. 51 indexed citations

17.

Francis, P., J.P. Colinge, & Guy Berger. (1995). Temporal analysis of SEU in SOI/GAA SRAMs. IEEE Transactions on Nuclear Science. 42(6). 2127–2137. 28 indexed citations

18.

Magnusson, Ulf, et al.. (1992). Correlation between spectroscopic reflectrometry and electrical measurements of SIMOX SOI film thickness. Microelectronic Engineering. 19(1-4). 823–826. 2 indexed citations

19.

Vu, D.P., et al.. (1984). CMOS circuits made in lamp-recrystallised silicon-on-insulator. Electronics Letters. 20(7). 298–299. 1 indexed citations

20.

Colinge, J.P., et al.. (1981). Grain Size and Resistivity of LPCVD Polycrystalline Silicon Films. Journal of The Electrochemical Society. 128(9). 2009–2014. 29 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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