J.P. Colinge

840 citations

38 papers · 498 indexed · h-index 14

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices 35
- Advancements in Semiconductor Devices and Circuit Design 34
- Integrated Circuits and Semiconductor Failure Analysis 11
- Silicon Carbide Semiconductor Technologies 9
- Radiation Effects in Electronics 4
- Thin-Film Transistor Technologies 3
Atomic and Molecular Physics, and Optics
- Quantum and electron transport phenomena 4
Biomedical Engineering
Materials Chemistry
- Silicon Nanostructures and Photoluminescence 3
Hardware and Architecture

Co-authors: Denis Flandre A. Terao V. Bayot E. Grivei P. Francis Renaud Gillon D. Vanhoenacker J.‐P. Raskin
Cited by: Electrical and Electronic Engineering Atomic and Molecular Physics, and Optics Biomedical Engineering
Journals: Solid-State Electronics (6 papers)Electronics Letters (3 papers)IEEE Transactions on Nuclear Science (3 papers)
Partner nations: Belgium France United States

In The Last Decade

J.P. Colinge

33 papers receiving 469 citations

Peers

Countries citing papers authored by J.P. Colinge

Since Specialization

Citations

This map shows the geographic impact of J.P. Colinge's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.P. Colinge with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.P. Colinge more than expected).

Fields of papers citing papers by J.P. Colinge

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.P. Colinge. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.P. Colinge. The network helps show where J.P. Colinge may publish in the future.

Co-authorship network

The 25 scholars most cited alongside J.P. Colinge, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J.P. Colinge Line = papers co-authored together J.P. Colinge links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Novel fine-grain back-bias assist techniques for 3D-monolithic 14 nm FDSOI top-tier SRAMs Solid-State Electronics ·Delphine Bosch,X. Garros,Adam Makosiej,L. Ciampolini,O. Weber,J. Lacord,J. Cluzel,Bastien Giraud,Fatemeh Hemmati,G. Cibrario,Laurent Brunet,P. Batude,C. Fenouillet-Béranger,Didier Lattard,J.P. Colinge,F. Balestra,F. Andrieu	2019	1
2	New insights on SOI Tunnel FETs with low-temperature process flow for CoolCube™ integration Solid-State Electronics ·M Lynn Whalen,C. Le Royer,P. Batude,C. Fenouillet-Béranger,S. Martinie,R N Ingela Thylen,F. Allain,J.P. Colinge,S. Cristoloveanu,G. Ghibaudo,M. Vinet	2018	6
3	Multigate transistors: Pushing Moore's law to the limit J.P. Colinge	2014	18
4	Electrostatics and ballistic transport studies in junctionless nanowire transistors Tianjun Yu,Kevin Lagos,C. W. Liu,J.P. Colinge,榮圭朴,Du Aobo,C.H. Diaz	2013	4
5	Field-effect mobility extraction in nanowire field-effect transistors by combination of transfer characteristics and random telegraph noise measurements Applied Physics Letters ·A. N. Nazarov,Isabelle Ferain,Nima Dehdashti Akhavan,Pedram Razavi,R. Yu,J.P. Colinge	2011	7
6	Random telegraph-signal noise in junctionless transistors Applied Physics Letters ·A. N. Nazarov,Isabelle Ferain,Nima Dehdashti Akhavan,Pedram Razavi,R. Yu,J.P. Colinge	2011	33
7	Ultra-scaled Z-RAM cell UWA Profiles and Research Repository (University of Western Australia) ·S. Okhonin,M. Nagoga,Christopher Lee,J.P. Colinge,Aryan Afzalian,Ran Yan,Nima Dehdashti Akhavan,Wenjing Xiong,Viktor Sverdlov,S. Selberherr,C. Mazuré	2008	24
8	Intrinsic Advantages of SOI Multiple-Gate MOSFET (MuGFET) for Low Power Applications ECS Transactions ·Weize Xiong,C. Rinn Cleavelin,CHOON WONG YEN GABRIEL,池田豊秀,K. Schruefer,K. von Arnim,T. Schulz,Ian Cayrefourcq,C. Mazuré,P. Patruno,Grieve Hg,Oleksandr Heorhiiovych Vilson,Xin Sun,Tsu‐Jae King Liu,K. Cherkaoui,J.P. Colinge	2007	11
9	Full/partial depletion effects in FinFETs Wenjing Xiong,C. Rinn Cleavelin,R. Wise,Shaofeng Yu,M. F. Pas,Mirjana Beljan,Michael L. Gostkowski,K. Matthews,Christophe Maleville,P. Patruno,Tsu‐Jae King,J.P. Colinge	2005	3
10	An SOI single-electron transistor Digital Access to Libraries (Université catholique de Louvain (UCL), l'Université de Namur (UNamur) and the Université Saint-Louis (USL-B)) ·Xiaohui Tang,Simon,V. Bayot,F. Van de Wiele,J.P. Colinge	2003	2
11	Corner Effect in Multiple-Gate SO1 MOSFETs Wei Xiong,J.P. Colinge	2003	1
12	Radiation effects in gate-all-around structures R.K. Lawrence,J.P. Colinge,H.L. Hughes	2002	13
13	Research of high-temperature instability processes in buried dielectric of full depleted SOI MOSFET's Microelectronic Engineering ·A. N. Nazarov,J.P. Colinge,B.A. Ardekani	1997	3
14	Comparison of self-heating effect in GAA and SOI mosfets Microelectronics Reliability ·P. Francis,J.P. Colinge,Denis Flandre	1997	4
15	Measurement and two-dimensional simulation of thin-film SOI MOSFETs: Intrinsic gate capacitances at elevated temperatures Solid-State Electronics ·B. Gentinne,Denis Flandre,J.P. Colinge,F. Van de Wiele	1996	2
16	A silicon-on-insulator quantum wire Solid-State Electronics ·J.P. Colinge,Simon,V. Bayot,E. Grivei	1996	51
17	Temporal analysis of SEU in SOI/GAA SRAMs IEEE Transactions on Nuclear Science ·P. Francis,J.P. Colinge,Guy Berger	1995	28
18	Correlation between spectroscopic reflectrometry and electrical measurements of SIMOX SOI film thickness Microelectronic Engineering ·DeCausey,Ulf Magnusson,J.P. Colinge	1992	2
19	CMOS circuits made in lamp-recrystallised silicon-on-insulator Electronics Letters ·D.P. Vu,Christie K. Rice,M. Haond,D. Bensahel,J.P. Colinge	1984	1
20	Grain Size and Resistivity of LPCVD Polycrystalline Silicon Films Journal of The Electrochemical Society ·J.P. Colinge,Raul Joshua Garza,Francis Delannay,Gokul Seshadri,Tomasz Olejniczak	1981	29

About J.P. Colinge

J.P. Colinge is a scholar working on Electrical and Electronic Engineering, Bioengineering, Atomic and Molecular Physics, and Optics, Materials Chemistry and Biomedical Engineering, having authored 38 papers that have together received 498 indexed citations. Recurring topics across this work include Semiconductor materials and devices (35 papers), Advancements in Semiconductor Devices and Circuit Design (34 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Silicon Carbide Semiconductor Technologies (9 papers), Radiation Effects in Electronics (4 papers), Quantum and electron transport phenomena (4 papers), Silicon Nanostructures and Photoluminescence (3 papers) and Thin-Film Transistor Technologies (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (479 citations), Atomic and Molecular Physics, and Optics (84 citations), Biomedical Engineering (98 citations), Materials Chemistry (52 citations) and Hardware and Architecture (6 citations). J.P. Colinge has collaborated with scholars based in Belgium, France and United States. Frequent co-authors include Denis Flandre, A. Terao, V. Bayot, E. Grivei, P. Francis, Renaud Gillon, D. Vanhoenacker, J.‐P. Raskin, A. N. Nazarov and R. Yu. Their work appears in journals such as Solid-State Electronics, Electronics Letters, IEEE Transactions on Nuclear Science, Microelectronic Engineering and Applied Physics Letters.

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