Josef Šikula

1.0k citations
103 papers · 810 indexed · h-index 14
Topics
Semiconductor materials and devices (24 papers)Advancements in Semiconductor Devices and Circuit Design (22 papers)Integrated Circuits and Semiconductor Failure Analysis (15 papers)
Journals
SHILAP Revista de lepidopterologíaJournal of Applied PhysicsJournal of Power Sources
Partner nations
CzechiaJapanBelgium

In The Last Decade

Josef Šikula

91 papers receiving 760 citations

Peers

Josef Šikula
Comparison fields: 5 of 66
  • Electrical and Electronic Engineering 442
  • Biomedical Engineering 165
  • Electronic, Optical and Magnetic Materials 158
  • Automotive Engineering 132
  • Materials Chemistry 120
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Tong Zhao China
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Marc Lethiecq France
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Citations per field
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Citations per year

Countries citing papers authored by Josef Šikula

Since Specialization
Citations

This map shows the geographic impact of Josef Šikula's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Josef Šikula with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Josef Šikula more than expected).

Fields of papers citing papers by Josef Šikula

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Josef Šikula. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Josef Šikula. The network helps show where Josef Šikula may publish in the future.

Co-authorship network of co-authors of Josef Šikula

This figure shows the co-authorship network connecting the top 25 collaborators of Josef Šikula. A scholar is included among the top collaborators of Josef Šikula based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Josef Šikula. Josef Šikula is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 1
2 1
3 31
4 32
5 3
6 9
7
Comparison of the Intrinsic Characteristics of LTCC and Silicon Pressure Sensors by Means of 1/f Noise Measurements
6
8 5
9
Noise Measurement Setup for Quartz Crystal Microbalance
2
10 1
11
Noise in piezoelectric ceramics at the low temperatures
4
12
Long term stability of polymer based resistors tested by noise, non-linearity and electro-ultrasonic spectroscopy
2
13 92
14 0
15 2
16 4
17 1
18 2
19 5
20 1

About Josef Šikula

Josef Šikula is a scholar working on Bioengineering, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics, having authored 103 papers that have together received 810 indexed citations. Recurring topics across this work include Semiconductor materials and devices (24 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). The work is most often cited by research in Automotive Engineering (132 citations), Geophysics (117 citations) and Electronic, Optical and Magnetic Materials (158 citations). Josef Šikula has collaborated with scholars based in Czechia, Japan and Belgium. Frequent co-authors include Petr Sedlák, Vlasta Sedláková, Petr Vašina, Jan Pavelka, Manabu Enoki, Brandon Buergler, Sabrina Alam Khan, H. Elhadidy, J. Franc and M. E. Levinshteĭn. Their work appears in journals such as SHILAP Revista de lepidopterología, Journal of Applied Physics and Journal of Power Sources.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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