Josef Šikula

1.0k total citations
103 papers, 810 citations indexed

About

Josef Šikula is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, Josef Šikula has authored 103 papers receiving a total of 810 indexed citations (citations by other indexed papers that have themselves been cited), including 78 papers in Electrical and Electronic Engineering, 26 papers in Atomic and Molecular Physics, and Optics and 26 papers in Biomedical Engineering. Recurrent topics in Josef Šikula's work include Semiconductor materials and devices (24 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). Josef Šikula is often cited by papers focused on Semiconductor materials and devices (24 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). Josef Šikula collaborates with scholars based in Czechia, Japan and Belgium. Josef Šikula's co-authors include Petr Sedlák, Vlasta Sedláková, Petr Vašina, Jan Pavelka, Manabu Enoki, Brandon Buergler, Sabrina Alam Khan, H. Elhadidy, J. Franc and M. E. Levinshteĭn and has published in prestigious journals such as SHILAP Revista de lepidopterología, Journal of Applied Physics and Journal of Power Sources.

In The Last Decade

Josef Šikula

91 papers receiving 760 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Josef Šikula Czechia 14 442 165 158 132 120 103 810
Pei Zheng China 12 207 0.5× 38 0.2× 122 0.8× 47 0.4× 133 1.1× 21 487
Tong Zhao China 17 343 0.8× 237 1.4× 19 0.1× 62 0.5× 78 0.7× 82 909
Jin Ho Lee South Korea 18 761 1.7× 160 1.0× 56 0.4× 16 0.1× 405 3.4× 117 1.2k
Christopher M. Kube United States 16 161 0.4× 103 0.6× 129 0.8× 58 0.4× 413 3.4× 60 1.1k
О. В. Захаров Russia 15 485 1.1× 246 1.5× 114 0.7× 31 0.2× 569 4.7× 80 1.2k
Qingyu Ma China 20 311 0.7× 678 4.1× 128 0.8× 15 0.1× 78 0.7× 97 1.2k
M.F. Rose United States 15 284 0.6× 75 0.5× 79 0.5× 43 0.3× 258 2.1× 86 594
Olivier Poncelet France 17 90 0.2× 770 4.7× 297 1.9× 48 0.4× 84 0.7× 62 1.2k
Baozhu Wang China 16 351 0.8× 162 1.0× 171 1.1× 30 0.2× 206 1.7× 82 883
Fangjing Hu China 15 400 0.9× 141 0.9× 223 1.4× 17 0.1× 106 0.9× 62 888

Countries citing papers authored by Josef Šikula

Since Specialization
Citations

This map shows the geographic impact of Josef Šikula's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Josef Šikula with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Josef Šikula more than expected).

Fields of papers citing papers by Josef Šikula

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Josef Šikula. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Josef Šikula. The network helps show where Josef Šikula may publish in the future.

Co-authorship network of co-authors of Josef Šikula

This figure shows the co-authorship network connecting the top 25 collaborators of Josef Šikula. A scholar is included among the top collaborators of Josef Šikula based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Josef Šikula. Josef Šikula is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Klučka, Jozef, et al.. (2022). Causes of Intensive Care Unit Admissions in Children with SARS-CoV-2: A Single-Centre Observational Study. Children. 10(1). 75–75. 1 indexed citations
2.
Knápek, Alexandr, et al.. (2019). Fluctuations of focused electron beam in a conventional SEM. Ultramicroscopy. 204. 49–54. 1 indexed citations
3.
Sedláková, Vlasta, et al.. (2016). Supercapacitor Degradation Assesment by Power Cycling and Calendar Life Tests. Metrology and Measurement Systems. 23(3). 345–358. 31 indexed citations
4.
Šikula, Josef, et al.. (2016). Voltage Dependence of Supercapacitor Capacitance. Metrology and Measurement Systems. 23(3). 403–411. 32 indexed citations
5.
Sedláková, Vlasta, Josef Šikula, Radimı́r Vrba, et al.. (2015). Noise in piezoresistive pressure sensors. 1–4. 3 indexed citations
6.
Kuberský, Petr, Petr Sedlák, Aleš Hamáček, et al.. (2014). Quantitative fluctuation-enhanced sensing in amperometric NO2 sensors. Chemical Physics. 456. 111–117. 9 indexed citations
7.
Zarnik, Marina Santo, et al.. (2013). Comparison of the Intrinsic Characteristics of LTCC and Silicon Pressure Sensors by Means of 1/f Noise Measurements. SHILAP Revista de lepidopterología. 6 indexed citations
8.
Škarvada, Pavel, et al.. (2013). Contact quality analysis and noise sources determination of CdZnTe-based high-energy photon detectors. Physica Scripta. T157. 14064–14064. 5 indexed citations
9.
Sedlák, Petr, et al.. (2012). Noise Measurement Setup for Quartz Crystal Microbalance. SHILAP Revista de lepidopterología. 2 indexed citations
10.
Sedláková, Vlasta, et al.. (2012). Noise in Submicron Metal–Oxide–Semiconductor Field Effect Transistors: Lateral Electron Density Distribution and Active Trap Position. Japanese Journal of Applied Physics. 51(2R). 24105–24105. 1 indexed citations
11.
Sedlák, Petr, et al.. (2011). Noise in piezoelectric ceramics at the low temperatures. SHILAP Revista de lepidopterología. 4 indexed citations
12.
Sedláková, Vlasta, Pavel Tofel, & Josef Šikula. (2009). Long term stability of polymer based resistors tested by noise, non-linearity and electro-ultrasonic spectroscopy. European Microelectronics and Packaging Conference. 1–5. 2 indexed citations
13.
Sedlák, Petr, et al.. (2008). New automatic localization technique of acoustic emission signals in thin metal plates. Ultrasonics. 49(2). 254–262. 92 indexed citations
14.
Sedláková, Vlasta, et al.. (2008). Resistors testing by noise, non-linearity and Electro-Ultrasonic Spectroscopy. 32. 387–392.
15.
Šikula, Josef, et al.. (2007). Quantum 1/f Noise in Bio-Chemical Resonant ZnO Sensors. AIP conference proceedings. 922. 339–342. 2 indexed citations
16.
Šikula, Josef, et al.. (2004). RTS in submicron MOSFETS and quantum dots. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5472. 64–64. 4 indexed citations
17.
Pavelka, Jan, et al.. (2001). LOW FREQUENCY NOISE OF THIN Ta2O5 AMORPHOUS FILMS. 91–94. 1 indexed citations
18.
Tacano, Munecazu, et al.. (1999). Dependence of Hooge parameter of compound semiconductors on temperature. AIP conference proceedings. 35–41. 2 indexed citations
19.
Šikula, Josef & A. Touboul. (1993). Noise spectroscopy, diagnostics, and reliability of electronic devices. AIP conference proceedings. 285. 206–211. 5 indexed citations
20.
Šikula, Josef, et al.. (1989). The Noise of the GaAlAs Super-LED Radiation. physica status solidi (a). 111(1). 367–370. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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