Lubomír Grmela

837 total citations
60 papers, 683 citations indexed

About

Lubomír Grmela is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Lubomír Grmela has authored 60 papers receiving a total of 683 indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Electrical and Electronic Engineering, 28 papers in Biomedical Engineering and 22 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Lubomír Grmela's work include Near-Field Optical Microscopy (15 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers) and Advanced Semiconductor Detectors and Materials (13 papers). Lubomír Grmela is often cited by papers focused on Near-Field Optical Microscopy (15 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers) and Advanced Semiconductor Detectors and Materials (13 papers). Lubomír Grmela collaborates with scholars based in Czechia, United States and Romania. Lubomír Grmela's co-authors include Dinara Sobola, Ştefan Ţălu, Pavel Tománek, Pavel Škarvada, Pavel Kaspar, Rashid Dallaev, Sebastian Stach, Shahram Solaymani, Shikhgasan Ramazanov and Sahar Rezaee and has published in prestigious journals such as Applied Surface Science, Solar Energy Materials and Solar Cells and Meat Science.

In The Last Decade

Lubomír Grmela

53 papers receiving 669 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Lubomír Grmela Czechia 11 259 223 185 171 123 60 683
Zhizhong Wu United States 10 312 1.2× 125 0.6× 339 1.8× 408 2.4× 195 1.6× 12 1.3k
Jinjun Deng China 17 238 0.9× 104 0.5× 369 2.0× 102 0.6× 77 0.6× 88 683
Chenguang Lu China 16 261 1.0× 188 0.8× 277 1.5× 250 1.5× 86 0.7× 32 834
Huangping Yan China 14 219 0.8× 78 0.3× 233 1.3× 163 1.0× 93 0.8× 50 558
Mika Latikka Finland 14 275 1.1× 209 0.9× 451 2.4× 231 1.4× 210 1.7× 17 1.1k
Xiaodong Lv China 13 193 0.7× 140 0.6× 189 1.0× 272 1.6× 112 0.9× 34 670
C. E. Kendrick United States 14 492 1.9× 109 0.5× 220 1.2× 262 1.5× 48 0.4× 25 854
А. В. Волков Russia 11 118 0.5× 85 0.4× 261 1.4× 160 0.9× 41 0.3× 76 609
Shan Gao China 16 262 1.0× 243 1.1× 148 0.8× 179 1.0× 64 0.5× 55 796
В. А. Марков Russia 14 140 0.5× 106 0.5× 179 1.0× 260 1.5× 45 0.4× 104 731

Countries citing papers authored by Lubomír Grmela

Since Specialization
Citations

This map shows the geographic impact of Lubomír Grmela's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Lubomír Grmela with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Lubomír Grmela more than expected).

Fields of papers citing papers by Lubomír Grmela

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Lubomír Grmela. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Lubomír Grmela. The network helps show where Lubomír Grmela may publish in the future.

Co-authorship network of co-authors of Lubomír Grmela

This figure shows the co-authorship network connecting the top 25 collaborators of Lubomír Grmela. A scholar is included among the top collaborators of Lubomír Grmela based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Lubomír Grmela. Lubomír Grmela is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kaspar, Pavel, Rashid Dallaev, Nikola Papěž, et al.. (2025). Structural analysis of imperfections in contacts of graphene chemiresistors. Applied Surface Science. 704. 163501–163501.
2.
Kaspar, Pavel, Dinara Sobola, Klára Částková, et al.. (2020). Characterization of Polyvinylidene Fluoride (PVDF) Electrospun Fibers Doped by Carbon Flakes. Polymers. 12(12). 2766–2766. 90 indexed citations
3.
Kaspar, Pavel, Pavel Škarvada, Vladimír Holcman, & Lubomír Grmela. (2019). Characterization of argon etched Ta2O5 thin films. Applied Physics A. 125(12). 3 indexed citations
4.
Dallaev, Rashid, Sebastian Stach, Ştefan Ţălu, et al.. (2019). Stereometric Analysis of Effects of Heat Stressing on Micromorphology of Si Single Crystals. Silicon. 11(6). 2945–2959. 7 indexed citations
5.
Bábor, Petr, et al.. (2018). Low energy ion scattering as a depth profiling tool for thin layers - Case of bromine methanol etched CdTe. Vacuum. 152. 138–144. 5 indexed citations
6.
Kaspar, Pavel, et al.. (2016). Angular absorption of light used for evaluation of structural damage to porcine meat caused by aging, drying and freezing. Meat Science. 126. 22–28. 2 indexed citations
7.
Ramazanov, Shikhgasan, et al.. (2015). Local topography of optoelectronic substrates prepared by dry plasma etching process. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9442. 944208–944208.
8.
Škarvada, Pavel, et al.. (2015). SEM and AFM imaging of solar cells defects. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9450. 94501M–94501M. 1 indexed citations
9.
Ţălu, Ştefan, et al.. (2014). AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates. Applied Surface Science. 312. 81–86. 78 indexed citations
10.
Kuberský, Petr, Petr Sedlák, Aleš Hamáček, et al.. (2014). Quantitative fluctuation-enhanced sensing in amperometric NO2 sensors. Chemical Physics. 456. 111–117. 9 indexed citations
11.
Tománek, Pavel, et al.. (2013). Comparison of optical and electrical investigations of meat ageing. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8774. 87741L–87741L. 4 indexed citations
12.
Škarvada, Pavel, et al.. (2013). Contact quality analysis and noise sources determination of CdZnTe-based high-energy photon detectors. Physica Scripta. T157. 14064–14064. 5 indexed citations
13.
Tománek, Pavel, et al.. (2011). Local investigation of monocrystalline silicon solar cells defects. 1686–1690.
14.
Grmela, Lubomír, et al.. (2011). Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells. Solar Energy Materials and Solar Cells. 96. 108–111. 8 indexed citations
15.
Grmela, Lubomír, et al.. (2010). Investigation of excess 1/fnoise in CdTe single crystals. Semiconductor Science and Technology. 25(5). 55016–55016. 6 indexed citations
16.
Grmela, Lubomír, et al.. (2008). Near‐field measurement of ZnS:Mn nanocrystal and bulk thin‐film electroluminescent devices. Journal of Microscopy. 229(2). 275–280. 6 indexed citations
17.
Holcman, Vladimír, et al.. (2008). Relaxation time in CdTe single crystals. 28–31.
18.
Tománek, Pavel & Lubomír Grmela. (2008). <title>Optics of nano-objects</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 70081F–70081F. 1 indexed citations
19.
Grmela, Lubomír, et al.. (2007). Optoelectronic Noise and Photocurrent Measurement on GaAs/AlGaAs Laser Diode with Single Quantum Well. International Journal of Optomechatronics. 1(1). 73–80. 1 indexed citations
20.
Pavelka, Jan, et al.. (2001). LOW FREQUENCY NOISE OF THIN Ta2O5 AMORPHOUS FILMS. 91–94. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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