Jangho Shin

704 total citations
21 papers, 534 citations indexed

About

Jangho Shin is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering and Biomedical Engineering. According to data from OpenAlex, Jangho Shin has authored 21 papers receiving a total of 534 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 7 papers in Mechanical Engineering and 6 papers in Biomedical Engineering. Recurrent topics in Jangho Shin's work include Advancements in Photolithography Techniques (15 papers), Advanced Measurement and Metrology Techniques (6 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). Jangho Shin is often cited by papers focused on Advancements in Photolithography Techniques (15 papers), Advanced Measurement and Metrology Techniques (6 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). Jangho Shin collaborates with scholars based in South Korea and United States. Jangho Shin's co-authors include Desmond R. Lim, F. Cerrina, Kevin C. Lee, Lionel C. Kimerling, Han-Ku Cho, Joo-Tae Moon, Woo-Sung Han, Hyunwoo Kim, Ji-Young Lee and Greg Shaw and has published in prestigious journals such as Optics Letters, IEEE Access and Accident Analysis & Prevention.

In The Last Decade

Jangho Shin

18 papers receiving 489 citations

Peers

Countries citing papers authored by Jangho Shin

Since Specialization

Citations

This map shows the geographic impact of Jangho Shin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jangho Shin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jangho Shin more than expected).

Fields of papers citing papers by Jangho Shin

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jangho Shin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jangho Shin. The network helps show where Jangho Shin may publish in the future.

Co-authorship network of co-authors of Jangho Shin

This figure shows the co-authorship network connecting the top 25 collaborators of Jangho Shin. A scholar is included among the top collaborators of Jangho Shin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jangho Shin. Jangho Shin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Learning Terminal State of the Trajectory Planner: Application for Collision Scenarios of Autonomous Vehicles 2024 ·(unknown), Kibeom Lee, Jangho Shin, Dongsuk Kum	0
2	Collision Prediction in an Integrated Framework of Scenario-Based and Data-Driven Approaches 2024 ·IEEE Access ·(unknown), Bongsob Song, Jangho Shin	3
3	Enhancing model accuracy and calibration efficiency with image based pattern selection using machine learning techniques 2021 ·(unknown), (unknown), (unknown), Meng Liu, (unknown), Young-Seok Kim, Jangho Shin, (unknown), (unknown), Feng Mu, (unknown), Shibing Wang, Sungho Kim, (unknown), Sinyoung Kim, (unknown), (unknown)	2
4	Nature and etiology of hollow-organ abdominal injuries in frontal crashes 2015 ·Accident Analysis & Prevention ·Gerald S. Poplin, Timothy L. McMurry, Jason Forman, (unknown), (unknown), Greg Shaw, Jangho Shin, Hyung Joo Kim, Jeff Crandall	19
5	Front and Side Car-To-Car CAE Based Crash Analysis of Different Class Vehicles 2011 ·Jangho Shin, (unknown), (unknown)	0
6	The impact of total measurement uncertainty (TMU) on overlay error correction 2010 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Jangho Shin, Jeongho Yeo, (unknown), Woo-Sung Han	1
7	Application results of lot-to-lot high-order and per-shot overlay correction for sub-<inline-formula><math display="inline" overflow="scroll"><mrow><mn>60</mn><mtext>-</mtext><mi>nm</mi></mrow></math></inline-formula> memory device fabrication 2009 ·Journal of Micro/Nanolithography MEMS and MOEMS ·Jangho Shin	4
8	Application results of lot-to-lot high-order overlay correction for sub-60-nm memory device fabrication 2009 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Jangho Shin, (unknown), Taegyu Kim, (unknown), (unknown)	1
9	Study of machine to machine overlay error for sub-60-nm memory devices 2008 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Jangho Shin, (unknown), Jeongho Yeo, (unknown), (unknown), Woo-Sung Han	3
10	Image analysis of alignment and overlay marks with compound structure 2007 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), Jangho Shin, (unknown), Han-Ku Cho, Joo-Tae Moon	2
11	Study of process contributions to total overlay error budget for sub-60-nm memory devices 2007 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Jangho Shin, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), Chang-Jin Kang	5
12	Overlay metrology for dark hard mask process: simulation and experiment study 2007 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Jangho Shin, (unknown), (unknown), (unknown), (unknown), Han-Ku Cho	2
13	Macro analysis of line edge and line width roughness 2006 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Jangho Shin, (unknown), (unknown), (unknown), (unknown), Han-Ku Cho, Joo-Tae Moon	7
14	Understanding the impact of source displacement error on sub-90nm patterns using a fresnel zone plate 2005 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Jangho Shin, (unknown), (unknown), (unknown), Han-Ku Cho, Joo-Tae Moon	2
15	Requirement of in-field illumination control for low k1 imaging below 0.3 2005 ·(unknown), Jangho Shin, (unknown), (unknown), Han-Ku Cho, Joo-Tae Moon	3
16	Measurement technique of nontelecentricity of pupil-fill and its application to 60 nm NAND flash memory patterns 2005 ·Jangho Shin, (unknown), (unknown), (unknown), (unknown), (unknown), Han-Ku Cho, Joo-Tae Moon	4
17	Effect of line-edge roughness (LER) and line-width roughness (LWR) on sub-100-nm device performance 2004 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Ji-Young Lee, Jangho Shin, Hyunwoo Kim, (unknown), Han-Ku Cho, Woo-Sung Han, Joo-Tae Moon	30
18	Evaluation of puddle time effect and optimization of development process in 193-nm lithography 2004 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Jangho Shin, Hyunwoo Kim, (unknown), Han-Ku Cho, Woo-Sung Han	1
19	Advanced module-based approach to effective CD prediction of sub-100nm patterns 2004 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Jangho Shin, Insung Kim, (unknown), (unknown), (unknown), Han-Ku Cho, Woo-Sung Han, Joo-Tae Moon	2
20	Fabrication of ultralow-loss Si/SiO_2 waveguides by roughness reduction 2001 ·Optics Letters ·Kevin C. Lee, Desmond R. Lim, Lionel C. Kimerling, Jangho Shin, F. Cerrina	438

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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