Jan Geilhufe

1.2k citations
13 papers · 620 indexed · h-index 10
Topics
Advanced X-ray Imaging Techniques (10 papers)Advanced Electron Microscopy Techniques and Applications (8 papers)Magnetic properties of thin films (6 papers)
Partner nations
GermanyFranceSwitzerland

In The Last Decade

Jan Geilhufe

12 papers receiving 608 citations

Peers

Jan Geilhufe
Comparison fields: 5 of 39
  • Atomic and Molecular Physics, and Optics 512
  • Condensed Matter Physics 221
  • Electronic, Optical and Magnetic Materials 200
  • Electrical and Electronic Engineering 149
  • Radiation 133
Replace S. Schaffert with:
S. Schaffert Germany
Lars Bocklage Germany
Piet Hessing Germany
Matthias Noske Germany
Sina Mayr Switzerland
Dennis Rudolf Germany
Ivan Madan Switzerland
M. Buess Switzerland
A. Bisig Germany
Phoebe Tengdin United States
Jan Geilhufe relative to S. Schaffert Germany S. Schaffert's profile →
Citations per field
00.5×3.5×
S. Schaffert · 1×
Citations per year

Countries citing papers authored by Jan Geilhufe

Since Specialization
Citations

This map shows the geographic impact of Jan Geilhufe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jan Geilhufe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jan Geilhufe more than expected).

Fields of papers citing papers by Jan Geilhufe

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jan Geilhufe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jan Geilhufe. The network helps show where Jan Geilhufe may publish in the future.

Co-authorship network of co-authors of Jan Geilhufe

This figure shows the co-authorship network connecting the top 25 collaborators of Jan Geilhufe. A scholar is included among the top collaborators of Jan Geilhufe based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jan Geilhufe. Jan Geilhufe is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

13 of 13 papers shown
#WorkIndexed citations
1 16
2 9
3 19
4 6
5 210
6 12
7 258
8 29
9 10
10 0
11 24
12 14
13 13

About Jan Geilhufe

Jan Geilhufe is a scholar working on Structural Biology, Radiation and Condensed Matter Physics, having authored 13 papers that have together received 620 indexed citations. Recurring topics across this work include Advanced X-ray Imaging Techniques (10 papers), Advanced Electron Microscopy Techniques and Applications (8 papers) and Magnetic properties of thin films (6 papers). The work is most often cited by research in Structural Biology (76 citations), Condensed Matter Physics (221 citations) and Atomic and Molecular Physics, and Optics (512 citations). Jan Geilhufe has collaborated with scholars based in Germany, France and Switzerland. Frequent co-authors include Stefan Eisebitt, Bastian Pfau, C. Günther, Michael Schneider, Felix Büttner, Benjamin Krüger, S. Schaffert, Clemens von Korff Schmising, Piet Hessing and Mathias Kläui. Their work appears in journals such as Physical Review Letters, Nature Communications and Nature Nanotechnology.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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