Jaeyeon Jang
- Industrial and Manufacturing Engineering top 5%
- Artificial Intelligence
- Computer Vision and Pattern Recognition top 10%
- Control and Systems Engineering top 10%
- Electrical and Electronic Engineering
- Co-authors
- Chang Ouk KimByung Do ChungSeyoung ParkByung‐Wook MinKangjin KimSinyoung KimSoon‐Jae KwonKi Bum Lee
- Topics
- Industrial Vision Systems and Defect Detection (8 papers)Fault Detection and Control Systems (3 papers)Integrated Circuits and Semiconductor Failure Analysis (3 papers)
- Cited by
- Industrial and Manufacturing EngineeringComputer Vision and Pattern RecognitionControl and Systems Engineering
- Partner nations
- South KoreaUnited States
In The Last Decade
Jaeyeon Jang
19 papers receiving 265 citations
Peers
Comparison fields: 5 of 62
- Industrial and Manufacturing Engineering 117
- Artificial Intelligence 75
- Computer Vision and Pattern Recognition 67
- Control and Systems Engineering 65
- Electrical and Electronic Engineering 65
Countries citing papers authored by Jaeyeon Jang
This map shows the geographic impact of Jaeyeon Jang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jaeyeon Jang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jaeyeon Jang more than expected).
Fields of papers citing papers by Jaeyeon Jang
This network shows the impact of papers produced by Jaeyeon Jang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jaeyeon Jang. The network helps show where Jaeyeon Jang may publish in the future.
Co-authorship network of co-authors of Jaeyeon Jang
This figure shows the co-authorship network connecting the top 25 collaborators of Jaeyeon Jang. A scholar is included among the top collaborators of Jaeyeon Jang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jaeyeon Jang. Jaeyeon Jang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 5 | |
| 3 | 1 | |
| 4 | 4 | |
| 5 | 16 | |
| 6 | 8 | |
| 7 | 0 | |
| 8 | 8 | |
| 9 | 7 | |
| 10 | 3 | |
| 11 | 1 | |
| 12 | 23 | |
| 13 | 14 | |
| 14 | 32 | |
| 15 | 33 | |
| 16 | 29 | |
| 17 | 13 | |
| 18 | 22 | |
| 19 | 14 | |
| 20 | 12 |
About Jaeyeon Jang
Jaeyeon Jang is a scholar working on Industrial and Manufacturing Engineering, Artificial Intelligence and Computer Vision and Pattern Recognition, having authored 21 papers that have together received 270 indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (8 papers), Fault Detection and Control Systems (3 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (117 citations), Computer Vision and Pattern Recognition (67 citations) and Control and Systems Engineering (65 citations). Jaeyeon Jang has collaborated with scholars based in South Korea and United States. Frequent co-authors include Chang Ouk Kim, Byung Do Chung, Seyoung Park, Byung‐Wook Min, Kangjin Kim, Sinyoung Kim, Soon‐Jae Kwon, Ki Bum Lee, Xiuqi Li and Nital S. Patel. Their work appears in journals such as Expert Systems with Applications, IEEE Access and IEEE Transactions on Industrial Informatics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.