Chang Ouk Kim

2.4k total citations · 1 hit paper
67 papers, 1.8k citations indexed

About

Chang Ouk Kim is a scholar working on Industrial and Manufacturing Engineering, Artificial Intelligence and Control and Systems Engineering. According to data from OpenAlex, Chang Ouk Kim has authored 67 papers receiving a total of 1.8k indexed citations (citations by other indexed papers that have themselves been cited), including 31 papers in Industrial and Manufacturing Engineering, 21 papers in Artificial Intelligence and 14 papers in Control and Systems Engineering. Recurrent topics in Chang Ouk Kim's work include Industrial Vision Systems and Defect Detection (22 papers), Fault Detection and Control Systems (10 papers) and Scheduling and Optimization Algorithms (8 papers). Chang Ouk Kim is often cited by papers focused on Industrial Vision Systems and Defect Detection (22 papers), Fault Detection and Control Systems (10 papers) and Scheduling and Optimization Algorithms (8 papers). Chang Ouk Kim collaborates with scholars based in South Korea and United States. Chang Ouk Kim's co-authors include Ki Bum Lee, Jaeyeon Jang, Ick-Hyun Kwon, Hoyeop Lee, Youngju Kim, Choonjong Kwak, Tae‐Hyung Lee, Hyun Joon Shin, Jun‐Geol Baek and Keeheon Lee and has published in prestigious journals such as Expert Systems with Applications, IEEE Access and Journal of the Operational Research Society.

In The Last Decade

Chang Ouk Kim

62 papers receiving 1.7k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes

2017 383 citations Ki Bum Lee, Chang Ouk Kim et al. IEEE Transactions on Semiconductor Manufacturing profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Chang Ouk Kim South Korea	22	785	451	387	331	255	67	1.8k
Bernd Scholz‐Reiter Germany	25	1.8k 2.3×	379 0.8×	360 0.9×	156 0.5×	292 1.1×	156	2.8k
Fan‐Tien Cheng Taiwan	32	1.6k 2.0×	182 0.4×	1.1k 2.9×	284 0.9×	565 2.2×	202	3.0k
Wei-Hua Lin United States	23	626 0.8×	188 0.4×	1.0k 2.6×	339 1.0×	50 0.2×	83	2.9k
Qingyun Dai China	21	948 1.2×	218 0.5×	119 0.3×	121 0.4×	68 0.3×	108	2.1k
Xiwang Guo China	28	2.1k 2.7×	318 0.7×	379 1.0×	200 0.6×	405 1.6×	173	3.2k
Jerker Delsing Sweden	25	687 0.9×	227 0.5×	361 0.9×	773 2.3×	163 0.6×	204	2.8k
Pieter J. Mosterman United States	23	231 0.3×	367 0.8×	790 2.0×	116 0.4×	139 0.5×	127	2.0k
Peter Gorm Larsen Denmark	21	389 0.5×	554 1.2×	530 1.4×	165 0.5×	118 0.5×	150	2.1k
Alexander Fay Germany	26	2.1k 2.7×	537 1.2×	705 1.8×	225 0.7×	193 0.8×	402	3.3k
Martin Wollschlaeger Germany	11	646 0.8×	173 0.4×	253 0.7×	381 1.2×	56 0.2×	104	1.7k

Countries citing papers authored by Chang Ouk Kim

Since Specialization

Citations

This map shows the geographic impact of Chang Ouk Kim's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chang Ouk Kim with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chang Ouk Kim more than expected).

Fields of papers citing papers by Chang Ouk Kim

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Chang Ouk Kim. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chang Ouk Kim. The network helps show where Chang Ouk Kim may publish in the future.

Co-authorship network of co-authors of Chang Ouk Kim

This figure shows the co-authorship network connecting the top 25 collaborators of Chang Ouk Kim. A scholar is included among the top collaborators of Chang Ouk Kim based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Chang Ouk Kim. Chang Ouk Kim is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Kim, Chang Ouk, et al.. (2025). Global feature identification layer for mixed-type wafer bin map classification. Expert Systems with Applications. 271. 126709–126709. 1 indexed citations

Kim, Chang Ouk, et al.. (2025). Long-tailed classification based on dynamic class average loss. Expert Systems with Applications. 288. 128292–128292.

Kim, Chang Ouk, et al.. (2024). SAFE : Unsupervised image feature extraction using self‐attention based feature extraction network. Expert Systems. 41(8). 1 indexed citations

Shin, Hyun Soo, et al.. (2022). Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuits. Expert Systems with Applications. 202. 117341–117341.

Park, Seyoung, Jaeyeon Jang, & Chang Ouk Kim. (2020). Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels. Journal of Intelligent Manufacturing. 32(1). 251–263. 33 indexed citations

Kim, Chang Ouk, et al.. (2020). Semisupervised sentiment analysis method for online text reviews. Journal of Information Science. 47(3). 387–403. 13 indexed citations

Kim, Chang Ouk, et al.. (2019). Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class. IEEE Transactions on Semiconductor Manufacturing. 32(2). 163–170. 216 indexed citations

Kim, Chang Ouk, et al.. (2019). Degradation-Based Remaining Useful Life Analysis for Predictive Maintenance in a Steel Galvanizing Kettle. Journal of the Korean Chemical Society. 10(12). 271–280. 1 indexed citations

Kim, Sang Jin, et al.. (2019). Hybrid Overlay Modeling for Field-by-Field Error Correction in the Photolithography Process. IEEE Transactions on Semiconductor Manufacturing. 33(1). 53–61. 2 indexed citations

10.

Jang, Jaeyeon, Byung‐Wook Min, & Chang Ouk Kim. (2019). Denoised Residual Trace Analysis for Monitoring Semiconductor Process Faults. IEEE Transactions on Semiconductor Manufacturing. 32(3). 293–301. 22 indexed citations

11.

Lee, Tae‐Hyung, Ki Bum Lee, & Chang Ouk Kim. (2016). Performance of Machine Learning Algorithms for Class-Imbalanced Process Fault Detection Problems. IEEE Transactions on Semiconductor Manufacturing. 29(4). 436–445. 47 indexed citations

12.

Kim, Hyungjun, et al.. (2016). Opinion polarity detection in Twitter data combining shrinkage regression and topic modeling. Journal of Informetrics. 10(2). 634–644. 29 indexed citations

13.

Lee, Tae‐Hyung, et al.. (2015). An Incremental Clustering-Based Fault Detection Algorithm for Class-Imbalanced Process Data. IEEE Transactions on Semiconductor Manufacturing. 28(3). 318–328. 44 indexed citations

14.

Kim, Chang Ouk, et al.. (2011). A multivariate parameter trace analysis for online fault detection in a semiconductor etch tool. International Journal of Production Research. 50(23). 6639–6654. 11 indexed citations

15.

Shin, Kyu H., et al.. (2010). Performance trajectory-based optimised supply chain dynamics. International Journal of Computer Integrated Manufacturing. 23(1). 87–100. 10 indexed citations

16.

Kwak, Choonjong, Eunmi Park, & Chang Ouk Kim. (2010). Situation dependent decision selector for production control in testing and rework cell. International Journal of Production Research. 49(15). 4505–4516. 1 indexed citations

17.

Kim, Chang Ouk, et al.. (2008). Multi-Stage Supply Chain Inventory Control Using Simulation Optimization. IE interfaces. 21(4). 444–455.

18.

Kim, Chang Ouk, et al.. (2008). Service level management of nonstationary supply chain using direct neural network controller. Expert Systems with Applications. 36(2). 3574–3586. 17 indexed citations

19.

Kwak, Choonjong & Chang Ouk Kim. (2005). Dispatching decisions within preemption procedure. International journal of industrial engineering. 12(1). 23–27. 4 indexed citations

20.

Kim, Chang Ouk & Shimon Y. Nof. (1998). A collaboration scheme for distributed CIM data activities. International journal of industrial engineering. 5(1). 68–77. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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