Jaehong Yoon
- Mechanical Engineering top 5%
- Materials Chemistry
- Aerospace Engineering top 5%
- Mechanics of Materials top 10%
- Electrical and Electronic Engineering
- Co-authors
- Han‐Bo‐Ram LeeShihong ZhangTong‐Yul ChoMingxi LiWei FangS.I. KwunJun Hyun HanHyungjun Kim
- Topics
- Semiconductor materials and devices (15 papers)High-Temperature Coating Behaviors (8 papers)Metal and Thin Film Mechanics (7 papers)
- Journals
- IEEE Transactions on Pattern Analysis and Machine IntelligenceJournal of The Electrochemical SocietyLangmuir
- Partner nations
- South KoreaChinaUnited States
In The Last Decade
Jaehong Yoon
37 papers receiving 702 citations
Peers
Comparison fields: 5 of 63
- Mechanical Engineering 387
- Materials Chemistry 285
- Aerospace Engineering 267
- Mechanics of Materials 193
- Electrical and Electronic Engineering 188
Countries citing papers authored by Jaehong Yoon
This map shows the geographic impact of Jaehong Yoon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jaehong Yoon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jaehong Yoon more than expected).
Fields of papers citing papers by Jaehong Yoon
This network shows the impact of papers produced by Jaehong Yoon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jaehong Yoon. The network helps show where Jaehong Yoon may publish in the future.
Co-authorship network of co-authors of Jaehong Yoon
This figure shows the co-authorship network connecting the top 25 collaborators of Jaehong Yoon. A scholar is included among the top collaborators of Jaehong Yoon based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jaehong Yoon. Jaehong Yoon is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 0 | |
| 3 | 1 | |
| 4 | 7 | |
| 5 | 0 | |
| 6 | 26 | |
| 7 | 12 | |
| 8 | 4 | |
| 9 | 58 | |
| 10 | 8 | |
| 11 | 10 | |
| 12 | 16 | |
| 13 | 5 | |
| 14 | 2 | |
| 15 | 30 | |
| 16 | 2 | |
| 17 | 94 | |
| 18 | 49 | |
| 19 | 23 | |
| 20 | 7 |
About Jaehong Yoon
Jaehong Yoon is a scholar working on Ecological Modeling, Electronic, Optical and Magnetic Materials and Materials Chemistry, having authored 39 papers that have together received 742 indexed citations. Recurring topics across this work include Semiconductor materials and devices (15 papers), High-Temperature Coating Behaviors (8 papers) and Metal and Thin Film Mechanics (7 papers). The work is most often cited by research in Ecological Modeling (49 citations), Aerospace Engineering (267 citations) and Mechanical Engineering (387 citations). Jaehong Yoon has collaborated with scholars based in South Korea, China and United States. Frequent co-authors include Han‐Bo‐Ram Lee, Shihong Zhang, Tong‐Yul Cho, Mingxi Li, Wei Fang, S.I. Kwun, Jun Hyun Han, Hyungjun Kim, R. M. Latanision and Heoung‐Jae Chun. Their work appears in journals such as IEEE Transactions on Pattern Analysis and Machine Intelligence, Journal of The Electrochemical Society and Langmuir.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.