J. R. Young
- Electrical and Electronic Engineering
- Surfaces, Coatings and Films top 2%
- Materials Chemistry
- Radiation top 5%
- Atomic and Molecular Physics, and Optics top 10%
- Co-authors
- N. R. WhettenS ManattMichael J. CarrierChen‐Ching LiuC. Thomas AvedisianP.-A. GourdainKung‐Hau DingBruce R. Land
- Topics
- Laser-Plasma Interactions and Diagnostics (6 papers)Electron and X-Ray Spectroscopy Techniques (6 papers)Mass Spectrometry Techniques and Applications (4 papers)
- Journals
- Journal of Applied PhysicsJournal of The Electrochemical SocietyIEEE Transactions on Power Electronics
- Partner nations
- United StatesNetherlandsSwitzerland
In The Last Decade
J. R. Young
41 papers receiving 644 citations
Peers
Comparison fields: 5 of 67
- Electrical and Electronic Engineering 286
- Surfaces, Coatings and Films 225
- Materials Chemistry 175
- Radiation 168
- Atomic and Molecular Physics, and Optics 166
Countries citing papers authored by J. R. Young
This map shows the geographic impact of J. R. Young's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. R. Young with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. R. Young more than expected).
Fields of papers citing papers by J. R. Young
This network shows the impact of papers produced by J. R. Young. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. R. Young. The network helps show where J. R. Young may publish in the future.
Co-authorship network of co-authors of J. R. Young
This figure shows the co-authorship network connecting the top 25 collaborators of J. R. Young. A scholar is included among the top collaborators of J. R. Young based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. R. Young. J. R. Young is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 0 | |
| 4 | 0 | |
| 5 | 1 | |
| 6 | 4 | |
| 7 | 5 | |
| 8 | 14 | |
| 9 | 1 | |
| 10 | 28 | |
| 11 | 5 | |
| 12 | 3 | |
| 13 | 24 | |
| 14 | 1 | |
| 15 | 1 | |
| 16 | 4 | |
| 17 | 86 | |
| 18 | 124 | |
| 19 | 19 | |
| 20 | 0 |
About J. R. Young
J. R. Young is a scholar working on Chemical Health and Safety, Surfaces, Coatings and Films and Nuclear and High Energy Physics, having authored 46 papers that have together received 722 indexed citations. Recurring topics across this work include Laser-Plasma Interactions and Diagnostics (6 papers), Electron and X-Ray Spectroscopy Techniques (6 papers) and Mass Spectrometry Techniques and Applications (4 papers). The work is most often cited by research in Surfaces, Coatings and Films (225 citations), Radiation (168 citations) and Atomic and Molecular Physics, and Optics (166 citations). J. R. Young has collaborated with scholars based in United States, Netherlands and Switzerland. Frequent co-authors include N. R. Whetten, S Manatt, Michael J. Carrier, Chen‐Ching Liu, C. Thomas Avedisian, P.-A. Gourdain, Kung‐Hau Ding, Bruce R. Land, Eric J. Ching and Роман Шаповалов. Their work appears in journals such as Journal of Applied Physics, Journal of The Electrochemical Society and IEEE Transactions on Power Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.