J. M. Leng

1.0k total citations
30 papers, 908 citations indexed

About

J. M. Leng is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Polymers and Plastics. According to data from OpenAlex, J. M. Leng has authored 30 papers receiving a total of 908 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 10 papers in Materials Chemistry and 8 papers in Polymers and Plastics. Recurrent topics in J. M. Leng's work include Conducting polymers and applications (8 papers), Analytical Chemistry and Sensors (7 papers) and Organic Electronics and Photovoltaics (5 papers). J. M. Leng is often cited by papers focused on Conducting polymers and applications (8 papers), Analytical Chemistry and Sensors (7 papers) and Organic Electronics and Photovoltaics (5 papers). J. M. Leng collaborates with scholars based in United States, South Korea and Germany. J. M. Leng's co-authors include R. P. McCall, Z. Valy Vardeny, Xing Wei, S. Mazumdar, Robert E. Benner, Sanjeev K. Manohar, J. M. Ginder, S. Jeglinski, Fan Guo and G.E. Asturias and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Journal of Applied Physics.

In The Last Decade

J. M. Leng

27 papers receiving 856 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. M. Leng United States 13 678 554 222 184 157 30 908
J. O. Nilsson Sweden 12 448 0.7× 388 0.7× 69 0.3× 167 0.9× 88 0.6× 14 647
P. Kuivalainen Finland 15 605 0.9× 335 0.6× 104 0.5× 240 1.3× 172 1.1× 90 907
D. Chinn United States 12 417 0.6× 218 0.4× 71 0.3× 119 0.6× 107 0.7× 20 526
Akio Takahashi Japan 10 280 0.4× 317 0.6× 53 0.2× 134 0.7× 84 0.5× 26 514
S. Scheinert Germany 19 1.2k 1.7× 433 0.8× 50 0.2× 180 1.0× 143 0.9× 45 1.3k
Sangmin Chae South Korea 18 621 0.9× 393 0.7× 51 0.2× 223 1.2× 148 0.9× 47 800
V. van Elsbergen Germany 12 616 0.9× 262 0.5× 30 0.1× 329 1.8× 124 0.8× 24 766
Alfred Neuhold Austria 13 546 0.8× 186 0.3× 74 0.3× 288 1.6× 136 0.9× 18 666
Hirotake Kajii Japan 19 1.1k 1.6× 526 0.9× 23 0.1× 425 2.3× 140 0.9× 127 1.3k
Staf Borghs Belgium 9 669 1.0× 329 0.6× 95 0.4× 125 0.7× 185 1.2× 18 824

Countries citing papers authored by J. M. Leng

Since Specialization
Citations

This map shows the geographic impact of J. M. Leng's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. M. Leng with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. M. Leng more than expected).

Fields of papers citing papers by J. M. Leng

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. M. Leng. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. M. Leng. The network helps show where J. M. Leng may publish in the future.

Co-authorship network of co-authors of J. M. Leng

This figure shows the co-authorship network connecting the top 25 collaborators of J. M. Leng. A scholar is included among the top collaborators of J. M. Leng based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. M. Leng. J. M. Leng is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Leng, J. M., Jon Opsal, H. Pois, et al.. (2005). Multi-Technology Measurements of Amorphous Carbon Films. MRS Proceedings. 872. 1 indexed citations
2.
Leng, J. M., Jon Opsal, & H. Pois. (2005). Optical characterization of 193nm amorphous carbon ARC films. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5752. 1161–1161.
3.
Leng, J. M., Shifang Li, Jon Opsal, et al.. (2000). Rotating compensator spectroscopic ellipsometry (RCSE) and its application to high-k dielectric film HfO 2. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4099. 228–228. 4 indexed citations
4.
Leng, J. M., Jon Opsal, & D. E. Aspnes. (1999). Combined beam profile reflectometry, beam profile ellipsometry and ultraviolet-visible spectrophotometry for the characterization of ultrathin oxide-nitride-oxide films on silicon. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 17(2). 380–384. 14 indexed citations
5.
Opsal, Jon, et al.. (1998). Broadband spectral operation of a rotating-compensator ellipsometer. Thin Solid Films. 313-314. 58–61. 22 indexed citations
6.
7.
Leng, J. M., et al.. (1998). Analytic representations of the dielectric functions of crystalline and amorphous Si and crystalline Ge for very large scale integrated device and structural modeling. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 16(3). 1654–1657. 18 indexed citations
8.
Leng, J. M., John J. Sidorowich, Michael W. Senko, & Jon Opsal. (1998). Simultaneous measurement of six layers in a silicon on insulator film stack using visible-near-IR spectrophotometry and single-wavelength beam profile reflectometry. Thin Solid Films. 313-314. 270–275. 4 indexed citations
9.
Leng, J. M., et al.. (1997). Simultaneous measurement of six layers in a silicon on insulator film stack using spectrophotometry and beam profile reflectometry. Journal of Applied Physics. 81(8). 3570–3578. 10 indexed citations
10.
Leng, J. M., S. Jeglinski, Xing Wei, et al.. (1994). Optical probes of excited states in poly(p-phenylenevinylene). Physical Review Letters. 72(1). 156–159. 279 indexed citations
11.
Leng, J. M., S. Jeglinski, Xing Wei, et al.. (1994). Lenget al.Reply. Physical Review Letters. 73(23). 3180–3180. 5 indexed citations
12.
Leng, J. M., et al.. (1994). Excited Energy States in Poly(P-Phenylenevinylene). Molecular crystals and liquid crystals science technology. Section A, Molecular crystals and liquid crystals. 256(1). 1–8. 4 indexed citations
13.
Leng, J. M., et al.. (1994). Picosecond to Millisecond Photoexcitations in Poly(Phenylene Acetylene). Molecular crystals and liquid crystals science technology. Section A, Molecular crystals and liquid crystals. 256(1). 697–703. 5 indexed citations
14.
Фролов, С. В., J. M. Leng, & Z. Valy Vardeny. (1994). Picosecond Transient Photomodulation in Poly(2,5-Thienylene Vinylene). Molecular crystals and liquid crystals science technology. Section A, Molecular crystals and liquid crystals. 256(1). 473–479. 5 indexed citations
15.
Leng, J. M., Z. Valy Vardeny, Brett A. Hooper, et al.. (1994). Two Photon Absorption Spectroscopy of Polydiacetylene PTS. Molecular crystals and liquid crystals science technology. Section A, Molecular crystals and liquid crystals. 256(1). 617–623. 6 indexed citations
16.
Leng, J. M., J. M. Ginder, W. E. Farneth, S. Ismat Shah, & Andrew J. Epstein. (1991). Absorption and photoinduced-absorption spectroscopy in semiconductingYBa2Cu3O6+x. Physical review. B, Condensed matter. 43(13). 10582–10588. 12 indexed citations
17.
McCall, R. P., J. M. Ginder, J. M. Leng, et al.. (1991). Photoinduced absorption and erasable optical information storage in polyanilines. Synthetic Metals. 41(3). 1329–1332. 23 indexed citations
18.
McCall, R. P., et al.. (1990). Infrared properties of the highTcsuperconductor Tl2Ba2CaCu2O8. Journal of materials research/Pratt's guide to venture capital sources. 5(8). 1616–1619.
19.
McCall, R. P., J. M. Ginder, J. M. Leng, et al.. (1990). Spectroscopy and defect states in polyaniline. Physical review. B, Condensed matter. 41(8). 5202–5213. 227 indexed citations
20.
Zuo, F., R. P. McCall, J. M. Ginder, et al.. (1989). Solution studies of the emeraldine oxidation state of polyaniline. Synthetic Metals. 29(1). 445–450. 56 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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