J. H. Thomas

1.8k total citations
101 papers, 1.4k citations indexed

About

J. H. Thomas is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, J. H. Thomas has authored 101 papers receiving a total of 1.4k indexed citations (citations by other indexed papers that have themselves been cited), including 58 papers in Electrical and Electronic Engineering, 28 papers in Materials Chemistry and 22 papers in Surfaces, Coatings and Films. Recurrent topics in J. H. Thomas's work include Semiconductor materials and devices (39 papers), Electron and X-Ray Spectroscopy Techniques (21 papers) and Plasma Diagnostics and Applications (12 papers). J. H. Thomas is often cited by papers focused on Semiconductor materials and devices (39 papers), Electron and X-Ray Spectroscopy Techniques (21 papers) and Plasma Diagnostics and Applications (12 papers). J. H. Thomas collaborates with scholars based in United States, United Kingdom and Germany. J. H. Thomas's co-authors include S. Hofmann, A. Catalano, F. J. Feigl, N. Tudball, Alvin M. Goodman, Sanjeev Sharma, Uwe Kortshagen, H. Schade, Z E. Smith and R. W. Liptak and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

J. H. Thomas

98 papers receiving 1.3k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
J. H. Thomas United States	21	724	524	213	208	146	101	1.4k
M. Uda Japan	21	340 0.5×	552 1.1×	223 1.0×	121 0.6×	293 2.0×	96	1.6k
M. Folman Israel	23	462 0.6×	828 1.6×	547 2.6×	96 0.5×	98 0.7×	100	1.6k
Ian D. Morrison United States	16	342 0.5×	483 0.9×	173 0.8×	147 0.7×	95 0.7×	32	1.4k
R. B. Wright United States	27	824 1.1×	812 1.5×	297 1.4×	175 0.8×	46 0.3×	63	2.2k
John P. LaFemina United States	21	391 0.5×	708 1.4×	543 2.5×	100 0.5×	100 0.7×	41	1.5k
Yohichi Gohshi Japan	24	258 0.4×	659 1.3×	243 1.1×	175 0.8×	558 3.8×	180	1.9k
F. Adams Belgium	8	310 0.4×	314 0.6×	130 0.6×	69 0.3×	167 1.1×	14	920
Tomlinson Fort United States	24	286 0.4×	366 0.7×	372 1.7×	69 0.3×	168 1.2×	70	1.7k
F. C. Burns United States	11	301 0.4×	315 0.6×	177 0.8×	69 0.3×	96 0.7×	21	1.1k
G. Verbist Netherlands	20	387 0.5×	736 1.4×	259 1.2×	83 0.4×	69 0.5×	38	1.5k

Countries citing papers authored by J. H. Thomas

Since Specialization

Citations

This map shows the geographic impact of J. H. Thomas's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. H. Thomas with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. H. Thomas more than expected).

Fields of papers citing papers by J. H. Thomas

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. H. Thomas. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. H. Thomas. The network helps show where J. H. Thomas may publish in the future.

Co-authorship network of co-authors of J. H. Thomas

This figure shows the co-authorship network connecting the top 25 collaborators of J. H. Thomas. A scholar is included among the top collaborators of J. H. Thomas based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. H. Thomas. J. H. Thomas is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Messenger, Louisa A., et al.. (2014). Installation of insecticide-treated durable wall lining: evaluation of attachment materials and product durability under field conditions. Parasites & Vectors. 7(1). 508–508. 6 indexed citations

Stauffer, Douglas, Ryan C. Major, J. H. Thomas, et al.. (2012). Plastic response of the native oxide on Cr and Al thin films from in situ conductive nanoindentation. Journal of materials research/Pratt's guide to venture capital sources. 27(4). 685–693. 14 indexed citations

Liptak, R. W., et al.. (2009). ケイ素ナノ結晶のSF 6 プラズマエッチング. Nanotechnology. 20(3). 5. 46 indexed citations

Liptak, R. W., Brent M. DeVetter, J. H. Thomas, Uwe Kortshagen, & Stephen A. Campbell. (2008). SF₆plasma etching of silicon nanocrystals. Nanotechnology. 20(3). 35603–35603. 28 indexed citations

Gorbunov, A.A., K.D. Brand, H. Geisler, et al.. (1999). Nonconventional transition layer formation during PLD of nanometer-period multilayers. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3687. 244–244. 2 indexed citations

Thomas, J. H., et al.. (1994). Crustal evolution of the Namaqua-Natal Metamorphic Province, southern Africa. South African Journal of Geology. 97(1). 8–14. 51 indexed citations

Patel, Vipulkumar K., Bhupinder Pal Singh, & J. H. Thomas. (1992). Reactive ion etching end-point determination by plasma impedance monitoring. Applied Physics Letters. 61(16). 1912–1914. 21 indexed citations

Thomas, J. H. & Budhi Singh. (1992). X-ray photoemission study of SF6/O2 triode reactive ion etching of polycrystalline silicon, silicon dioxide, and their interface. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 10(5). 3039–3047. 2 indexed citations

Thomas, J. H., et al.. (1990). The effect of thin titanium oxide layers on the wettability of thin‐film nickel metallization. Surface and Interface Analysis. 15(2). 85–94. 4 indexed citations

10.

Thomas, J. H., et al.. (1987). An X‐Ray Photoelectron Spectroscopy Study of CF 4 / H 2 Reactive Ion Etching Residue on Silicon. Journal of The Electrochemical Society. 134(12). 3122–3125. 11 indexed citations

11.

Hoffman, D. M., et al.. (1987). Effect of thin titanium interfacial layers on the formation of palladium silicide on silicon. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 5(4). 1941–1945. 5 indexed citations

12.

Labib, Mohamed E., et al.. (1984). The effect of heat treatment on sulfur in an electrically-conductive carbon black. Carbon. 22(4-5). 445–451. 16 indexed citations

13.

Carlson, David, C. W. Magee, & J. H. Thomas. (1980). Hydrogenated amorphous silicon films in palladium Schottky barrier cells. Solar Cells. 1(4). 371–379. 6 indexed citations

14.

Thomas, J. H., et al.. (1973). Gas-phase reactions between NO2 and acetylenes. Symposium (International) on Combustion. 14(1). 493–500. 2 indexed citations

15.

Thomas, J. H.. (1971). a Photoemission Study of Electron Trapping Centers in Thermally Grown Silicon-Dioxide on Silicon.. PhDT. 1 indexed citations

16.

Thomas, J. H. & F. J. Feigl. (1970). Spectrally resolved photo depopulation of electron trapping defects in amorphous silica films. Solid State Communications. 8(21). 1669–1672. 16 indexed citations

17.

Tudball, N., J. H. Thomas, & James A. Fowler. (1969). A rat liver system that catalyses a pyridoxal phosphate-independent αβ-elimination. Biochemical Journal. 114(2). 299–305. 9 indexed citations

18.

Thomas, J. H., et al.. (1967). Reaction between methanol and nitrogen dioxide. Part 1.—Low-temperature reaction and the thermodynamic constants of methyl nitrite. Transactions of the Faraday Society. 63(0). 2476–2479. 20 indexed citations

19.

Thomas, J. H., et al.. (1957). Effect of Wire Metal on the Thermal Life of Enameled Magnet Wire. Transactions of the American Institute of Electrical Engineers Part III Power Apparatus and Systems. 76(3). 1009–1013. 2 indexed citations

20.

Evans, Alwyn G., A. H. Price, & J. H. Thomas. (1956). The effect of solvents on the ionization of organic halides. Part 4.—Ionization in chlorinated ethanes. Transactions of the Faraday Society. 52(0). 332–344. 11 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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