J. Greguš

562 total citations
33 papers, 426 citations indexed

About

J. Greguš is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, J. Greguš has authored 33 papers receiving a total of 426 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 5 papers in Biomedical Engineering and 5 papers in Materials Chemistry. Recurrent topics in J. Greguš's work include Semiconductor materials and devices (8 papers), Plasma Diagnostics and Applications (7 papers) and Advancements in Semiconductor Devices and Circuit Design (6 papers). J. Greguš is often cited by papers focused on Semiconductor materials and devices (8 papers), Plasma Diagnostics and Applications (7 papers) and Advancements in Semiconductor Devices and Circuit Design (6 papers). J. Greguš collaborates with scholars based in United States, Slovakia and Germany. J. Greguš's co-authors include Richard A. Gottscho, Eray S. Aydil, Andrew D. Bailey, M. C. M. van de Sanden, D. M. Tennant, J. E. Bjorkholm, M. Záhoran, O. R. Wood, W Mansfield and D. L. White and has published in prestigious journals such as Applied Physics Letters, Anesthesiology and Applied Surface Science.

In The Last Decade

J. Greguš

32 papers receiving 404 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
J. Greguš United States	11	331	85	80	73	69	33	426
B. Kaufmann Germany	12	212 0.6×	64 0.8×	147 1.8×	108 1.5×	49 0.7×	32	385
John P. Lehan United States	10	216 0.7×	43 0.5×	141 1.8×	78 1.1×	96 1.4×	46	399
Masaru Shimada Japan	14	420 1.3×	56 0.7×	153 1.9×	174 2.4×	72 1.0×	48	531
John Mazurowski United States	11	233 0.7×	47 0.6×	183 2.3×	169 2.3×	61 0.9×	41	418
M. Mertin Germany	9	134 0.4×	49 0.6×	137 1.7×	99 1.4×	86 1.2×	15	386
Řeža Valizadeh United Kingdom	13	333 1.0×	135 1.6×	156 1.9×	68 0.9×	171 2.5×	70	545
Sergiy Yulin Germany	12	178 0.5×	95 1.1×	75 0.9×	119 1.6×	68 1.0×	42	386
M. F. C. Willemsen Netherlands	13	429 1.3×	50 0.6×	189 2.4×	124 1.7×	139 2.0×	22	539
Stefan Günster Germany	11	191 0.6×	84 1.0×	70 0.9×	94 1.3×	36 0.5×	29	328
S. Reboh France	16	359 1.1×	103 1.2×	141 1.8×	166 2.3×	32 0.5×	57	528

Countries citing papers authored by J. Greguš

Since Specialization

Citations

This map shows the geographic impact of J. Greguš's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Greguš with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Greguš more than expected).

Fields of papers citing papers by J. Greguš

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Greguš. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Greguš. The network helps show where J. Greguš may publish in the future.

Co-authorship network of co-authors of J. Greguš

This figure shows the co-authorship network connecting the top 25 collaborators of J. Greguš. A scholar is included among the top collaborators of J. Greguš based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Greguš. J. Greguš is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Greguš, J., et al.. (2021). Numerical extrapolation method for complex conductivity of disordered metals. Physical review. B.. 103(13). 2 indexed citations

Pinčík, Emil, Róbert Brunner, H. Kobayashi, et al.. (2016). About the optical properties of oxidized black silicon structures. Applied Surface Science. 395. 185–194. 3 indexed citations

Řehák, M., Š. Gaži, J. Greguš, et al.. (2014). Superconducting MoC thin films with enhanced sheet resistance. Applied Surface Science. 312. 216–219. 11 indexed citations

Plesch, G., Azhar Ali Haidry, M. Gregor, et al.. (2013). Structure of Hydrogen Gas Sensing TiO<sub>2 </sub>Thin Films Prepared by Sol-Gel Method and their Comparison with Magnetron Sputtered Films. Key engineering materials. 543. 293–296. 5 indexed citations

Greguš, J., et al.. (2010). Energy Shift of Native 2.45 eV Related Defects in Annealed ZnO Films. IOP Conference Series Materials Science and Engineering. 15. 12041–12041. 5 indexed citations

Plecenı́k, A., P. Kúš, M. Záhoran, et al.. (2006). Preparation of MgB2 superconducting thin films by magnetron sputtering. Physica C Superconductivity. 435(1-2). 78–81. 14 indexed citations

Greguš, J., et al.. (2002). Chip-scale modules for high-level integration in the 21st century. Bell Labs Technical Journal. 3(3). 116–124. 2 indexed citations

Degani, Yinon, T. D. Dudderar, R.C. Frye, et al.. (2002). A novel MCM package for RF applications. 225–231. 3 indexed citations

Low, Y.L., et al.. (2002). RF flip-module BGA package. 1115–1119. 6 indexed citations

10.

O’Connor, Kevin, Y.L. Low, J. Greguš, & Yinon Degani. (2002). Memory performance in chip-on-chip packages: Optimizing memory/ASIC integration. 16–20. 2 indexed citations

11.

Low, Y.L., et al.. (1999). RF flip-module BGA package. IEEE Transactions on Advanced Packaging. 22(2). 111–115. 9 indexed citations

12.

Bailey, Andrew D., M. C. M. van de Sanden, J. Greguš, & Richard A. Gottscho. (1995). Scaling of Si and GaAs trench etch rates with aspect ratio, feature width, and substrate temperature. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(1). 92–104. 53 indexed citations

13.

Greguš, J., et al.. (1995). Photoluminescence in CdMnTe strained thin films. Journal of Physics and Chemistry of Solids. 56(3-4). 407–410. 1 indexed citations

14.

Greguš, J., Richard A. Gottscho, Geoffrey R. Scheller, et al.. (1993). Low-temperature plasma etching of GaAs, AlGaAs, and AlAs. Plasma Chemistry and Plasma Processing. 13(3). 521–537. 9 indexed citations

15.

Greguš, J., et al.. (1993). Control of an unstable electron cyclotron resonance plasma. Applied Physics Letters. 62(17). 2039–2041. 10 indexed citations

16.

Aydil, Eray S., J. Greguš, & Richard A. Gottscho. (1993). Multiple steady states in electron cyclotron resonance plasma reactors. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 11(6). 2883–2892. 33 indexed citations

17.

Aydil, Eray S., J. Greguš, & Richard A. Gottscho. (1993). Electron cyclotron resonance plasma reactor for cryogenic etching. Review of Scientific Instruments. 64(12). 3572–3584. 18 indexed citations

18.

Greguš, J., et al.. (1993). Real-time latent image monitoring during holographic fabrication of submicron diffraction gratings. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 11(6). 2468–2472. 3 indexed citations

19.

Gottscho, Richard A., J. Greguš, Konstantinos P. Giapis, et al.. (1992). <title>Light scattering methods for semiconductor process monitoring and control</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1594. 306–312. 1 indexed citations

20.

Freeman, R. R., Jeffrey Bokor, J. Greguš, et al.. (1991). X‐ray reduction imaging at the NSLS. Synchrotron Radiation News. 4(2). 13–15. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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