J. Brison

821 total citations
29 papers, 697 citations indexed

About

J. Brison is a scholar working on Computational Mechanics, Electrical and Electronic Engineering and Materials Chemistry. According to data from OpenAlex, J. Brison has authored 29 papers receiving a total of 697 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Computational Mechanics, 19 papers in Electrical and Electronic Engineering and 12 papers in Materials Chemistry. Recurrent topics in J. Brison's work include Ion-surface interactions and analysis (23 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and Diamond and Carbon-based Materials Research (6 papers). J. Brison is often cited by papers focused on Ion-surface interactions and analysis (23 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and Diamond and Carbon-based Materials Research (6 papers). J. Brison collaborates with scholars based in Belgium, United States and Germany. J. Brison's co-authors include David G. Castner, Shin Muramoto, Laurent Houssiau, Michael Robinson, Daniel J. Graham, Bastien Douhard, Patrick S. Stayton, Danielle S. W. Benoit, Tobias Weidner and N. Mine and has published in prestigious journals such as Biomaterials, Analytical Chemistry and The Journal of Physical Chemistry C.

In The Last Decade

J. Brison

29 papers receiving 684 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. Brison Belgium 15 399 259 187 138 137 29 697
Christine M. Mahoney United States 19 788 2.0× 421 1.6× 498 2.7× 314 2.3× 171 1.2× 38 1.2k
J. H. Callahan United States 15 205 0.5× 240 0.9× 245 1.3× 145 1.1× 318 2.3× 19 867
M. Hartshorne United Kingdom 8 65 0.2× 221 0.9× 150 0.8× 40 0.3× 217 1.6× 12 725
David Barton United Kingdom 11 61 0.2× 216 0.8× 193 1.0× 55 0.4× 184 1.3× 13 559
Kristen L. Steffens United States 17 54 0.1× 313 1.2× 151 0.8× 77 0.6× 169 1.2× 33 602
Arne Langhoff Germany 13 44 0.1× 182 0.7× 136 0.7× 59 0.4× 357 2.6× 36 659
Yueh‐Chung Yu Taiwan 7 87 0.2× 178 0.7× 1.0k 5.4× 27 0.2× 375 2.7× 11 1.2k
Bernhard Wunderlich United States 16 43 0.1× 96 0.4× 241 1.3× 29 0.2× 161 1.2× 29 666
H.‐U. Poll Germany 12 78 0.2× 247 1.0× 130 0.7× 178 1.3× 122 0.9× 25 644
Yuejiang Liang Germany 8 74 0.2× 92 0.4× 891 4.8× 16 0.1× 283 2.1× 8 1.0k

Countries citing papers authored by J. Brison

Since Specialization
Citations

This map shows the geographic impact of J. Brison's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Brison with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Brison more than expected).

Fields of papers citing papers by J. Brison

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Brison. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Brison. The network helps show where J. Brison may publish in the future.

Co-authorship network of co-authors of J. Brison

This figure shows the co-authorship network connecting the top 25 collaborators of J. Brison. A scholar is included among the top collaborators of J. Brison based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Brison. J. Brison is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Wehbe, Nimer, J. Brison, Taoufiq Mouhib, et al.. (2012). TOF‐SIMS depth profiling of multilayer amino‐acid films using large Argon cluster Ar n + , C 60 + and Cs + sputtering ions: A comparative study. Surface and Interface Analysis. 45(1). 178–180. 15 indexed citations
2.
Brison, J., et al.. (2012). Molecular depth profiling of model biological films using low energy monoatomic ions. International Journal of Mass Spectrometry. 321-322. 1–7. 11 indexed citations
3.
Muramoto, Shin, J. Brison, & David G. Castner. (2010). ToF‐SIMS depth profiling of trehalose: the effect of analysis beam dose on the quality of depth profiles. Surface and Interface Analysis. 43(1-2). 58–61. 24 indexed citations
4.
Dubey, Manish, J. Brison, David W. Grainger, & David G. Castner. (2010). Comparison of Bi 1 + , Bi 3 + and C 60 + primary ion sources for ToF‐SIMS imaging of patterned protein samples. Surface and Interface Analysis. 43(1-2). 261–264. 21 indexed citations
5.
Brison, J., Danielle S. W. Benoit, Shin Muramoto, et al.. (2010). ToF‐SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridine. Surface and Interface Analysis. 43(1-2). 354–357. 44 indexed citations
6.
Barnes, Christopher A., J. Brison, Michel Roger, et al.. (2010). The surface molecular functionality of decellularized extracellular matrices. Biomaterials. 32(1). 137–143. 75 indexed citations
7.
Brison, J., Shin Muramoto, & David G. Castner. (2010). ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single-Beam and Dual-Beam Analysis. The Journal of Physical Chemistry C. 114(12). 5565–5573. 57 indexed citations
8.
Siemeling, Ulrich, et al.. (2009). COOH-terminated SAMs on gold fabricated from an azobenzene derivative with a 1,2-dithiolane headgroup. Applied Surface Science. 256(6). 1832–1836. 11 indexed citations
9.
Baio, Joe E., Tobias Weidner, J. Brison, et al.. (2009). Amine terminated SAMs: Investigating why oxygen is present in these films. Journal of Electron Spectroscopy and Related Phenomena. 172(1-3). 2–8. 100 indexed citations
10.
Vitchev, R.G., J. Brison, & Laurent Houssiau. (2009). Cesium redeposition artifacts during low energy ToF-SIMS depth profiling. Applied Surface Science. 255(17). 7586–7589. 3 indexed citations
11.
Brison, J., R.G. Vitchev, & Laurent Houssiau. (2008). Cesium/xenon co-sputtering at different energies during ToF-SIMS depth profiling. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 266(24). 5159–5165. 14 indexed citations
12.
Brison, J., J. Guillot, Bastien Douhard, et al.. (2008). On the understanding of positive and negative ionization processes during ToF-SIMS depth profiling by co-sputtering with cesium and xenon. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 267(3). 519–524. 16 indexed citations
13.
Vitchev, R.G., J. Brison, & Laurent Houssiau. (2008). Depth distribution of Cs implanted into Si at steady-state during dual beam ToF-SIMS profiling. Applied Surface Science. 255(4). 1331–1333. 4 indexed citations
14.
Mine, N., Bastien Douhard, J. Brison, & Laurent Houssiau. (2007). Molecular depth‐profiling of polycarbonate with low‐energy Cs + ions. Rapid Communications in Mass Spectrometry. 21(16). 2680–2684. 51 indexed citations
15.
Brison, J., et al.. (2006). Study of the Pd–Rh interdiffusion by ToF-SIMS, RBS and PIXE: Semi-quantitative depth profiles with MCs+ clusters. Applied Surface Science. 252(19). 7038–7040. 2 indexed citations
16.
Kowalik, I.A., B.J. Kowalski, P. Kaczor, et al.. (2006). Resonant photoemission study of Ti interaction with GaN surface. Surface Science. 600(4). 873–879. 3 indexed citations
17.
Couet, Sébastien, et al.. (2006). Towards clean and atomically flat ZnO (000&1macr;) surfaces. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 3(4). 1051–1054. 2 indexed citations
18.
Brison, J., et al.. (2006). An application of cesium–xenon co‐sputtering: quantitative study of a Pd–Rh thin film by ToF‐SIMS. Surface and Interface Analysis. 38(12-13). 1654–1657. 3 indexed citations
19.
Brison, J., et al.. (2006). Measurement and modeling of work function changes during low energy cesium sputtering. Surface Science. 601(6). 1467–1472. 25 indexed citations
20.
Vernière, A., P. Léjay, P. Bordet, et al.. (1994). ChemInform Abstract: Crystal Structures and Physical Properties of Some New Ternary Compounds U2T3X (T: Ru, Os; X: Si, Ge).. ChemInform. 25(47). 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Christine M. Mahoney Breakdown of academic impact, for papers by J. H. Callahan Breakdown of academic impact, for papers by M. Hartshorne Breakdown of academic impact, for papers by David Barton Breakdown of academic impact, for papers by Kristen L. Steffens Breakdown of academic impact, for papers by Arne Langhoff Breakdown of academic impact, for papers by Yueh‐Chung Yu Breakdown of academic impact, for papers by Bernhard Wunderlich Breakdown of academic impact, for papers by H.‐U. Poll Breakdown of academic impact, for papers by Yuejiang Liang
Rankless by CCL
2026