J. Brison

821 citations

29 papers · 697 indexed · h-index 15

Impact in

Computational Mechanics top 2%
- Ion-surface interactions and analysis
Analytical Chemistry top 5%
- Analytical chemistry methods development

Papers in ⓘ

Computational Mechanics 23
- Ion-surface interactions and analysis 23
Electrical and Electronic Engineering 19
- Integrated Circuits and Semiconductor Failure Analysis 15
- Semiconductor materials and devices 4
- Molecular Junctions and Nanostructures 2

Co-authors: David G. Castner (10 shared papers)Shin Muramoto (5 shared papers)Laurent Houssiau (16 shared papers)Michael Robinson (3 shared papers)Daniel J. Graham (2 shared papers)Bastien Douhard (4 shared papers)Danielle S. W. Benoit (2 shared papers)Patrick S. Stayton (2 shared papers)
Journals: Applied Surface Science (6 papers)Surface and Interface Analysis (6 papers)Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (4 papers)Analytical Chemistry (3 papers)Surface Science (2 papers)
Partner nations: Belgium United States Germany

In The Last Decade

J. Brison

29 papers receiving 684 citations

Peers

Countries citing papers authored by J. Brison

Since Specialization

Citations

This map shows the geographic impact of J. Brison's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Brison with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Brison more than expected).

Fields of papers citing papers by J. Brison

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Brison. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Brison. The network helps show where J. Brison may publish in the future.

Co-authors

The 25 scholars most cited alongside J. Brison, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Brison Line = papers co-authored together J. Brison links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 29 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Amine terminated SAMs: Investigating why oxygen is present in these films Journal of Electron Spectroscopy and Related Phenomena ·Joe E. Baio, Tobias Weidner, J. Brison, Daniel J. Graham, Lara J. Gamble, David G. Castner	2009	100
2	The surface molecular functionality of decellularized extracellular matrices Biomaterials ·Christopher A. Barnes, J. Brison, Michel Roger, Bryan N. Brown, David G. Castner, Stephen F. Badylak, Buddy D. Ratner	2010	75
3	TOF-SIMS 3D Imaging of Native and Non-Native Species within HeLa Cells Analytical Chemistry ·J. Brison, Michael Robinson, Danielle S. W. Benoit, Shin Muramoto, Patrick S. Stayton, David G. Castner	2013	70
4	Exploring the Surface Sensitivity of TOF-Secondary Ion Mass Spectrometry by Measuring the Implantation and Sampling Depths of Bi_n and C₆₀ Ions in Organic Films Analytical Chemistry ·Shin Muramoto, J. Brison, David G. Castner	2011	64
5	ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single-Beam and Dual-Beam Analysis The Journal of Physical Chemistry C ·J. Brison, Shin Muramoto, David G. Castner	2010	57
6	Molecular depth‐profiling of polycarbonate with low‐energy Cs ⁺ ions Rapid Communications in Mass Spectrometry ·N. Mine, Bastien Douhard, J. Brison, Laurent Houssiau	2007	51
7	ToF‐SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridine Surface and Interface Analysis ·J. Brison, Danielle S. W. Benoit, Shin Muramoto, Michael Robinson, Patrick S. Stayton, David G. Castner	2010	44
8	Identifying Individual Cell Types in Heterogeneous Cultures Using Secondary Ion Mass Spectrometry Imaging with C₆₀ Etching and Multivariate Analysis Analytical Chemistry ·Christopher A. Barnes, J. Brison, Michael Robinson, Daniel J. Graham, David G. Castner, Buddy D. Ratner	2011	36
9	Measurement and modeling of work function changes during low energy cesium sputtering Surface Science ·J. Brison, N. Mine, S. Poisseroux, Bastien Douhard, R.G. Vitchev, Laurent Houssiau	2006	25
10	ToF‐SIMS depth profiling of trehalose: the effect of analysis beam dose on the quality of depth profiles Surface and Interface Analysis ·Shin Muramoto, J. Brison, David G. Castner	2010	24
11	Study of ionization processes during TOF-SIMS analysis by co-sputtering cesium and xenon Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·J. Brison, Laurent Houssiau	2007	23
12	Comparison of Bi ₁ ⁺ , Bi ₃ ⁺ and C ₆₀ ⁺ primary ion sources for ToF‐SIMS imaging of patterned protein samples Surface and Interface Analysis ·Manish Dubey, J. Brison, David W. Grainger, David G. Castner	2010	21
13	On the understanding of positive and negative ionization processes during ToF-SIMS depth profiling by co-sputtering with cesium and xenon Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·J. Brison, J. Guillot, Bastien Douhard, R.G. Vitchev, H.‐N. Migeon, Laurent Houssiau	2008	16
14	TOF‐SIMS depth profiling of multilayer amino‐acid films using large Argon cluster Ar _n ⁺ , C ₆₀ ⁺ and Cs ⁺ sputtering ions: A comparative study Surface and Interface Analysis ·Nimer Wehbe, Tijani Tabarrant, J. Brison, Taoufiq Mouhib, Arnaud Delcorte, P. A. Bertrand, Rudolf Moellers, E. Niehuis, Laurent Houssiau	2012	15
15	Cesium/xenon co-sputtering at different energies during ToF-SIMS depth profiling Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·J. Brison, R.G. Vitchev, Laurent Houssiau	2008	14
16	COOH-terminated SAMs on gold fabricated from an azobenzene derivative with a 1,2-dithiolane headgroup Applied Surface Science ·Ulrich Siemeling, Stefan Rittinghaus, Tobias Weidner, J. Brison, David G. Castner	2009	11
17	Molecular depth profiling of model biological films using low energy monoatomic ions International Journal of Mass Spectrometry ·J. Brison, N. Mine, Nimer Wehbe, Xavier Gillon, Tijani Tabarrant, R. Sporken, Laurent Houssiau	2012	11
18	Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M+, MCs+, and M2Cs2+ yields Applied Surface Science ·J. Brison, Thierry Conard, W. Vandervorst, Laurent Houssiau	2004	10
19	On the understanding and the optimization of ToF‐SIMS depth profiles by cosputtering cesium and xenon Surface and Interface Analysis ·J. Brison, Laurent Houssiau	2006	4
20	Depth distribution of Cs implanted into Si at steady-state during dual beam ToF-SIMS profiling Applied Surface Science ·R.G. Vitchev, J. Brison, Laurent Houssiau	2008	4

About J. Brison

J. Brison is a scholar working on Computational Mechanics, Electrical and Electronic Engineering, Materials Chemistry, Mechanics of Materials and Radiation, having authored 29 papers that have together received 697 indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (23 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers), Diamond and Carbon-based Materials Research (6 papers), Semiconductor materials and devices (4 papers), Metal and Thin Film Mechanics (3 papers), Nuclear Physics and Applications (3 papers), ZnO doping and properties (2 papers) and Molecular Junctions and Nanostructures (2 papers). The work is most often cited by research in Computational Mechanics (399 citations), Analytical Chemistry (102 citations), Spectroscopy (138 citations), Surfaces, Coatings and Films (51 citations) and Biophysics (26 citations). J. Brison has collaborated with scholars based in Belgium, United States and Germany. Frequent co-authors include David G. Castner, Shin Muramoto, Laurent Houssiau, Michael Robinson, Daniel J. Graham, Bastien Douhard, Danielle S. W. Benoit, Patrick S. Stayton, Tobias Weidner and N. Mine. Their work appears in journals such as Applied Surface Science, Surface and Interface Analysis, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Analytical Chemistry and Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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