J. Barth

5.2k citations

33 papers · 434 indexed · h-index 12

Impact in

Structural Biology top 1%
- Advanced Electron Microscopy Techniques and Applications
Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques

Papers in

Structural Biology 8
- Advanced Electron Microscopy Techniques and Applications 8
Surfaces, Coatings and Films 19
- Electron and X-Ray Spectroscopy Techniques 14
- Optical Coatings and Gratings 5

Co-authors: P. Kruit L. W. Swanson K. HAGEN I. Schulday Xinpeng Jiang W. J. Schwille M. Ostrick J. Hannappel
Journals: Microelectronic Engineering (5 papers)Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment (5 papers)Ultramicroscopy (4 papers)The European Physical Journal A (3 papers)Optik (1 paper)
Partner nations: Netherlands Germany Czechia

In The Last Decade

J. Barth

33 papers receiving 408 citations

Peers

Countries citing papers authored by J. Barth

Since Specialization

Citations

This map shows the geographic impact of J. Barth's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Barth with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Barth more than expected).

Fields of papers citing papers by J. Barth

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Barth. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Barth. The network helps show where J. Barth may publish in the future.

Co-authorship network

The 25 scholars most cited alongside J. Barth, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Barth Line = papers co-authored together J. Barth links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Study of the reaction γp → K+Λ(1520) at photon energies up to 2.65 GeV The European Physical Journal A ·F. W. Wieland, J. Barth, K.-H. Glander, J. Hannappel, N. Jöpen, Ф. Клейн, E. Klempt, R. Lawall, D. Menze, M. Ostrick, E. Paul, I. Schulday, W. J. Schwille	2011	10
2	Design of an aberration corrected low-voltage SEM Ultramicroscopy ·A. Zirh Gürsoy ., Diederik Maas, K. HAGEN, J. Barth, P. Kruit	2010	5
3	Probe current, probe size, and the practical brightness for probe forming systems Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·ISABELLA CRISTINA MORALES, J. Barth, L. W. Swanson, P. Kruit	2008	58
4	Extracting the Boersch effect contribution from experimental energy spread measurements for Schottky electron emitters Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·ISABELLA CRISTINA MORALES, J. Barth, G. A. Schwind, L. W. Swanson, P. Kruit	2007	16
5	Source brightness and useful beam current of carbon nanotubes and other very small emitters Journal of Applied Physics ·P. Kruit, 俊夫小林, J. Barth	2006	32
6	Observation of the positive-strangeness pentaquark $\Theta^+$ in photoproduction with the SAPHIR detector at ELSA arXiv (Cornell University) ·J. Barth	2003	4
7	Aberration integrals for the low-voltage foil corrector Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·A. Zirh Gürsoy ., Maíra Guimarães Araújo De la Cruz, J. Barth	2003	7
8	Low-energy foil aberration corrector Ultramicroscopy ·A. Zirh Gürsoy ., K. HAGEN, J. Barth, P. Kruit	2002	8
9	Influence of the microchannel plate and anode gap parameters on the spatial resolution of an image intensifier Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Enrique Medano, K. HAGEN, J. Barth, P. Kruit, Tatjana Winkler	2001	6
10	Dependence of the chromatic aberration spot size on the form of the energy distribution of the charged particles Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·J. Barth, A Comley	1999	15
11	Addition of different contributions to the charged particle probe size Optik ·J. Barth, P. Kruit	1996	80
12	Combined calculation of lens aberrations, space charge aberrations, and statistical Coulomb effects in charged particle optical columns Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Xinpeng Jiang, J. Barth, P. Kruit	1996	11
13	<title>Improvements to the electrostatic lens optimization method SOEM</title> Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·J. Barth, 石田均, Joshua Coates	1995	5
14	Optical design of a remoderation section AIP conference proceedings ·H. Héla, P. Kruit, J. Barth, A. van Veen, H. Schut	1994	1
15	Engineering constraints and computer-aided optimization of electrostatic lens systems Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·石田均, J. Barth, Mi Hyang	1990	6
16	Practical optimization of electrostatic lenses Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ·Mi Hyang, 石田均, J. Barth	1989	12
17	Realistic comparison of gun lens designs Ultramicroscopy ·J. Barth	1988	1
18	Gas ion source for focused beams Microelectronic Engineering ·J. Barth, Mavlonov Bahodir Biloljonovich, Gurpreet Oshan, P. Kruit, Rongjian Bian, Jill Poole, Wilbert Tapia	1985	3
19	Feasibility of multi-beam electron lithography Microelectronic Engineering ·B.J.G.M. Roelofs, J. Barth	1984	4
20	Low voltage electron microscopy — how low? Ultramicroscopy ·J. Barth, Jill Poole	1976	5

About J. Barth

J. Barth is a scholar working on Structural Biology, Surfaces, Coatings and Films, Nuclear and High Energy Physics, Electrical and Electronic Engineering and Radiation, having authored 33 papers that have together received 434 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (14 papers), Advancements in Photolithography Techniques (13 papers), Advanced Electron Microscopy Techniques and Applications (8 papers), Optical Coatings and Gratings (5 papers), High-Energy Particle Collisions Research (4 papers), Electrowetting and Microfluidic Technologies (4 papers), Particle physics theoretical and experimental studies (4 papers) and Surface and Thin Film Phenomena (4 papers). The work is most often cited by research in Structural Biology (163 citations), Surfaces, Coatings and Films (215 citations), Nuclear and High Energy Physics (73 citations), Electrical and Electronic Engineering (249 citations) and Atomic and Molecular Physics, and Optics (84 citations). J. Barth has collaborated with scholars based in Netherlands, Germany and Czechia. Frequent co-authors include P. Kruit, L. W. Swanson, K. HAGEN, I. Schulday, Xinpeng Jiang, W. J. Schwille, M. Ostrick, J. Hannappel, E. Paul and Bohumila Lencová. Their work appears in journals such as Microelectronic Engineering, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, Ultramicroscopy, The European Physical Journal A and Optik.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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