J. A. Soininen

1.2k citations
38 papers · 1.1k indexed · h-index 22
Topics
X-ray Spectroscopy and Fluorescence Analysis (21 papers)Electron and X-Ray Spectroscopy Techniques (13 papers)X-ray Diffraction in Crystallography (12 papers)

In The Last Decade

J. A. Soininen

38 papers receiving 1.1k citations

Peers

J. A. Soininen
Comparison fields: 5 of 57
  • Radiation 500
  • Materials Chemistry 494
  • Atomic and Molecular Physics, and Optics 407
  • Condensed Matter Physics 222
  • Surfaces, Coatings and Films 212
Replace W. Schülke with:
W. Schülke Germany
S. Nanao Japan
G. S. Lodha India
R. Grisenti Italy
Renaud Delaunay France
Y. Ishizawa Japan
Wataru Hayami Japan
H. Schulte‐Schrepping Germany
J. J. Jia United States
Cécile Malgrange France
J. A. Soininen relative to W. Schülke Germany W. Schülke's profile →
Citations per field
00.5×1.5×2.3×
W. Schülke · 1×
Citations per year

Countries citing papers authored by J. A. Soininen

Since Specialization
Citations

This map shows the geographic impact of J. A. Soininen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. A. Soininen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. A. Soininen more than expected).

Fields of papers citing papers by J. A. Soininen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. A. Soininen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. A. Soininen. The network helps show where J. A. Soininen may publish in the future.

Co-authorship network of co-authors of J. A. Soininen

This figure shows the co-authorship network connecting the top 25 collaborators of J. A. Soininen. A scholar is included among the top collaborators of J. A. Soininen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. A. Soininen. J. A. Soininen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 18
2 32
3 31
4 57
5 11
6 22
7 11
8 7
9 32
10 23
11 31
12 93
13 12
14 12
15 31
16 32
17 57
18 16
19 31
20 53

About J. A. Soininen

J. A. Soininen is a scholar working on Radiation, Surfaces, Coatings and Films and Condensed Matter Physics, having authored 38 papers that have together received 1.1k indexed citations. Recurring topics across this work include X-ray Spectroscopy and Fluorescence Analysis (21 papers), Electron and X-Ray Spectroscopy Techniques (13 papers) and X-ray Diffraction in Crystallography (12 papers). The work is most often cited by research in Radiation (500 citations), Surfaces, Coatings and Films (212 citations) and Condensed Matter Physics (222 citations). J. A. Soininen has collaborated with scholars based in Finland, United States and France. Frequent co-authors include Eric L. Shirley, J. J. Rehr, K. Hämäläinen, Simo Huotari, A. L. Ankudinov, J. J. Kas, Christian Sternemann, Metin Tolan, György Vankó and Tuomas Pylkkänen. Their work appears in journals such as Physical Review Letters, Physical review. B, Condensed matter and The Journal of Physical Chemistry B.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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