Hideki Ina
Impact in
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- Optical measurement and interference techniques
- Media Technology top 0.5%
- Image Processing Techniques and Applications
Papers in
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- Image Processing Techniques and Applications 5
- Co-authors
- Mitsuo TakedaSeiji KobayashiSatoru OishiMuneyoshi SuitaYutaka TANAKAJunichi SekiEiichi MurakamiYutaka Watanabe
- Journals
- Japanese Journal of Applied Physics (2 papers)Beilstein Journal of Nanotechnology (1 paper)Journal of the Optical Society of America (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (15 papers)
- Partner nations
- JapanUnited StatesGermany
In The Last Decade
Hideki Ina
19 papers receiving 2.9k citations
Hit Papers
Peers
Comparison fields: 5 of 96
- Computer Vision and Pattern Recognition 1.8k
- Media Technology 693
- Atomic and Molecular Physics, and Optics 1.4k
- Radiation 366
- Acoustics and Ultrasonics 37
Countries citing papers authored by Hideki Ina
This map shows the geographic impact of Hideki Ina's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hideki Ina with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hideki Ina more than expected).
Fields of papers citing papers by Hideki Ina
This network shows the impact of papers produced by Hideki Ina. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hideki Ina. The network helps show where Hideki Ina may publish in the future.
Co-authors
The 17 scholars most cited alongside Hideki Ina, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 1 | |
| 2 | 2025 | 0 | |
| 3 | 2011 | 2 | |
| 4 | 2011 | 1 | |
| 5 | 2010 | 1 | |
| 6 | 2008 | 1 | |
| 7 | 2008 | 1 | |
| 8 | 2007 | 1 | |
| 9 | 2007 | 7 | |
| 10 | 2007 | 2 | |
| 11 | 2007 | 3 | |
| 12 | 2005 | 3 | |
| 13 | 2005 | 2 | |
| 14 | 2005 | 1 | |
| 15 | 2002 | 2 | |
| 16 | 2002 | 0 | |
| 17 | 1999 | 4 | |
| 18 | 1998 | 3 | |
| 19 | 1997 | 4 | |
| 20 | Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry Hit paper breakdown → | 1982 | 3075 |
About Hideki Ina
Hideki Ina is a scholar working on Media Technology, Surfaces, Coatings and Films, Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Mechanical Engineering, having authored 22 papers that have together received 3.1k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (15 papers), Advanced Measurement and Metrology Techniques (8 papers), Advanced Surface Polishing Techniques (7 papers), Image Processing Techniques and Applications (5 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Industrial Vision Systems and Defect Detection (3 papers), Laser-Ablation Synthesis of Nanoparticles (2 papers) and Optical Systems and Laser Technology (2 papers). The work is most often cited by research in Computer Vision and Pattern Recognition (1.8k citations), Media Technology (693 citations), Atomic and Molecular Physics, and Optics (1.4k citations), Radiation (366 citations) and Acoustics and Ultrasonics (37 citations). Hideki Ina has collaborated with scholars based in Japan, United States and Germany. Frequent co-authors include Mitsuo Takeda, Seiji Kobayashi, Satoru Oishi, Muneyoshi Suita, Yutaka TANAKA, Junichi Seki, Eiichi Murakami, Yutaka Watanabe, Takahiro Matsumoto and Takahiro Matsumoto. Their work appears in journals such as Japanese Journal of Applied Physics, Beilstein Journal of Nanotechnology, Journal of the Optical Society of America, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.