Han Haitjema

4.6k total citations · 3 hit papers
108 papers, 3.5k citations indexed

About

Han Haitjema is a scholar working on Mechanical Engineering, Computational Mechanics and Biomedical Engineering. According to data from OpenAlex, Han Haitjema has authored 108 papers receiving a total of 3.5k indexed citations (citations by other indexed papers that have themselves been cited), including 86 papers in Mechanical Engineering, 58 papers in Computational Mechanics and 38 papers in Biomedical Engineering. Recurrent topics in Han Haitjema's work include Advanced Measurement and Metrology Techniques (80 papers), Surface Roughness and Optical Measurements (51 papers) and Scientific Measurement and Uncertainty Evaluation (30 papers). Han Haitjema is often cited by papers focused on Advanced Measurement and Metrology Techniques (80 papers), Surface Roughness and Optical Measurements (51 papers) and Scientific Measurement and Uncertainty Evaluation (30 papers). Han Haitjema collaborates with scholars based in Netherlands, Belgium and United Kingdom. Han Haitjema's co-authors include Albert Weckenmann, Wolfgang Knapp, Richard Leach, Frank Delbressine, H. Schwenke, Robert Schmitt, Wei Gao, P.H.J. Schellekens, Hans Nørgaard Hansen and K. Carneiro and has published in prestigious journals such as SHILAP Revista de lepidopterología, Sensors and Thin Solid Films.

In The Last Decade

Han Haitjema

103 papers receiving 3.2k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Geometric error measurement and compensation of machines—An update

2008 767 citations Han Haitjema et al. CIRP Annals profile →
Measurement technologies for precision positioning

2015 430 citations Han Haitjema et al. CIRP Annals profile →
On-machine and in-process surface metrology for precision manufacturing

2019 309 citations Han Haitjema, Richard Leach et al. CIRP Annals profile →

Peers

Han Haitjema

CVPR

EEE

H. Kunzmann Germany

D.G. Chetwynd United Kingdom

Enrico Savio Italy

Seung-Han Yang South Korea

Tino Hausotte Germany

G.N. Peggs United Kingdom

Guoqing Zhang China

Bongtae Han United States

Paul Shore United Kingdom

Kazuo Yamazaki United States

H. Kunzmann Germany

Han Haitjema

1.7k ×0.6

651 ×0.5

691 ×0.7

532 ×0.6

CVPR

358 ×0.6

EEE

Citations per year, relative to Han Haitjema Han Haitjema (= 1×) peers H. Kunzmann

Countries citing papers authored by Han Haitjema

Since Specialization

Citations

This map shows the geographic impact of Han Haitjema's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Han Haitjema with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Han Haitjema more than expected).

Fields of papers citing papers by Han Haitjema

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Han Haitjema. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Han Haitjema. The network helps show where Han Haitjema may publish in the future.

Co-authorship network of co-authors of Han Haitjema

This figure shows the co-authorship network connecting the top 25 collaborators of Han Haitjema. A scholar is included among the top collaborators of Han Haitjema based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Han Haitjema. Han Haitjema is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Su, Rong, et al.. (2025). Framework for uncertainty evaluation in optical surface topography measurement using a virtual instrument. Measurement. 253. 117604–117604.

Haitjema, Han, et al.. (2023). Viewpoint Planning for Range Sensors Using Feature Cluster Constrained Spaces for Robot Vision Systems. Sensors. 23(18). 7964–7964. 4 indexed citations

Haitjema, Han, et al.. (2023). Characterization of measurement and instrument noise in areal surface topography measurements by the Allan deviation. CIRP Annals. 72(1). 485–488. 10 indexed citations

Thanki, Aditi, Brian G. Booth, Rob Heylen, et al.. (2023). Off-axis high-speed camera-based real-time monitoring and simulation study for laser powder bed fusion of 316L stainless steel. The International Journal of Advanced Manufacturing Technology. 125(11-12). 4909–4924. 3 indexed citations

Haitjema, Han, et al.. (2022). Geometric qualification for robot CT with flexible trajectories. e-Journal of Nondestructive Testing. 27(3). 7 indexed citations

Mullany, Brigid, Enrico Savio, Han Haitjema, & Richard Leach. (2022). The implication and evaluation of geometrical imperfections on manufactured surfaces. CIRP Annals. 71(2). 717–739. 12 indexed citations

Ye, Long, Jun Qian, Han Haitjema, & Dominiek Reynaerts. (2022). On-machine chromatic confocal measurement for micro-EDM drilling and milling. Precision Engineering. 76. 110–123. 28 indexed citations

Haitjema, Han & Aditi Thanki. (2022). Stylus tip radius and wear estimation using the Rsk or the Rp and Rv parameter of a sine wave (Type C1) standard. Surface Topography Metrology and Properties. 10(1). 15025–15025. 2 indexed citations

Yin, Jingfei, Qian Bai, Han Haitjema, & Bi Zhang. (2021). Depolarization of surface scattering in polarized laser scattering detection for machined silicon wafers. Precision Engineering. 73. 203–213. 9 indexed citations

10.

Haitjema, Han, et al.. (2021). International comparison of noise in areal surface topography measurements. Surface Topography Metrology and Properties. 9(2). 25015–25015. 21 indexed citations

11.

Metelková, Jitka, et al.. (2021). Hybrid dual laser processing for improved quality of inclined up-facing surfaces in laser powder bed fusion of metals. Journal of Materials Processing Technology. 298. 117263–117263. 26 indexed citations

12.

Haitjema, Han, et al.. (2021). Digital Twin of an Optical Measurement System. Sensors. 21(19). 6638–6638. 27 indexed citations

13.

Heylen, Rob, Aditi Thanki, Jan De Beenhouwer, et al.. (2021). 3D total variation denoising in X-CT imaging applied to pore extraction in additively manufactured parts. Measurement Science and Technology. 33(4). 45602–45602. 5 indexed citations

14.

Leach, Richard, Han Haitjema, Rong Su, & Adam Thompson. (2020). Metrological characteristics for the calibration of surface topography measuring instruments: a review. Measurement Science and Technology. 32(3). 32001–32001. 52 indexed citations

15.

Yin, Jingfei, Qian Bai, Han Haitjema, & Bi Zhang. (2020). Two-dimensional detection of subsurface damage in silicon wafers with polarized laser scattering. Journal of Materials Processing Technology. 284. 116746–116746. 23 indexed citations

16.

Dewulf, Wim, et al.. (2020). Description and validation of a circular padding method for linear roughness measurements of short data lengths. MethodsX. 7. 101122–101122.

17.

Haitjema, Han. (2019). Calibration of Displacement Laser Interferometer Systems for Industrial Metrology. Sensors. 19(19). 4100–4100. 36 indexed citations

18.

Leach, Richard, Claudiu Giusca, Han Haitjema, C. J. Evans, & Xiangqian Jiang. (2015). Calibration and verification of areal surface texture measuring instruments. CIRP Annals. 64(2). 797–813. 88 indexed citations

19.

Haitjema, Han. (2015). Uncertainty in measurement of surface topography. Surface Topography Metrology and Properties. 3(3). 35004–35004. 56 indexed citations

20.

Millerioux, Y., et al.. (1999). International comparisons of He-Ne lasers stabilized with (sup. 127) I (sub 2) at [lambda] approximately equals 633 nm (July 1993 to September 1995). Part IV: Comparison of Western European lasers at [lambda] approximately equals 633 nm. Metrologia. 36(3). 199–206. 12 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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