Halil İbrahim Efkere

422 total citations
22 papers, 343 citations indexed

About

Halil İbrahim Efkere is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Halil İbrahim Efkere has authored 22 papers receiving a total of 343 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 15 papers in Materials Chemistry and 9 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Halil İbrahim Efkere's work include ZnO doping and properties (11 papers), Semiconductor materials and interfaces (9 papers) and Gas Sensing Nanomaterials and Sensors (6 papers). Halil İbrahim Efkere is often cited by papers focused on ZnO doping and properties (11 papers), Semiconductor materials and interfaces (9 papers) and Gas Sensing Nanomaterials and Sensors (6 papers). Halil İbrahim Efkere collaborates with scholars based in Türkiye, Austria and Iran. Halil İbrahim Efkere's co-authors include Süleyman Özçelik, Yunus Özen, Barış Kınacı, Çağlar Çetinkaya, Feyza Güzelçimen, Nihan Akın Sönmez, Mehmet Burçin Ünlü, M. Çakmak, Hakan Ateş and A. Tataroğlu and has published in prestigious journals such as Scientific Reports, IEEE Sensors Journal and Physica B Condensed Matter.

In The Last Decade

Halil İbrahim Efkere

20 papers receiving 334 citations

Peers

Halil İbrahim Efkere
Halil İbrahim Efkere
Citations per year, relative to Halil İbrahim Efkere Halil İbrahim Efkere (= 1×) peers İlker Yıldız

Countries citing papers authored by Halil İbrahim Efkere

Since Specialization
Citations

This map shows the geographic impact of Halil İbrahim Efkere's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Halil İbrahim Efkere with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Halil İbrahim Efkere more than expected).

Fields of papers citing papers by Halil İbrahim Efkere

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Halil İbrahim Efkere. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Halil İbrahim Efkere. The network helps show where Halil İbrahim Efkere may publish in the future.

Co-authorship network of co-authors of Halil İbrahim Efkere

This figure shows the co-authorship network connecting the top 25 collaborators of Halil İbrahim Efkere. A scholar is included among the top collaborators of Halil İbrahim Efkere based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Halil İbrahim Efkere. Halil İbrahim Efkere is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
2.
Gökcen, Dinçer, et al.. (2025). Comprehensive study on fabrication, characterization and performance evaluation of Ag/TiOx/ITO and Au/Ag/TiOx/ITO memristors. Journal of Materials Science Materials in Electronics. 36(14).
3.
Efkere, Halil İbrahim, et al.. (2025). Multi element (Al+Cu) doping on ZnO films by ultrasonically spray pyrolysis. Physica B Condensed Matter. 700. 416957–416957. 1 indexed citations
4.
Azizian‐Kalandaragh, Yashar, Halil İbrahim Efkere, Ali Barkhordari, et al.. (2025). Effect of TiO2-Surfactant Interface on the Electrical and Dielectric Properties of a Metal–Insulator–Semiconductor (MIS) Structure. Journal of Electronic Materials. 54(3). 2388–2403. 8 indexed citations
5.
Efkere, Halil İbrahim, et al.. (2024). Structural, morphological, optical and electrical characterization of MgO thin films grown by sputtering technique on different substrates. Journal of Materials Science Materials in Electronics. 35(20). 11 indexed citations
6.
Efkere, Halil İbrahim, Ali Barkhordari, Benedetta Marmiroli, et al.. (2024). Electrical and dielectric behaviors of Al/SiO2-surfactant/n-Si schottky structure in wide range of voltage and frequency. Physica Scripta. 99(5). 55967–55967. 7 indexed citations
7.
Efkere, Halil İbrahim & Süleyman Özçelik. (2023). Detailed analysis of the structural, morphological, optical, electrical, and dielectric properties of the reactively produced WO3 nanostructure. Journal of Materials Science Materials in Electronics. 34(29). 4 indexed citations
8.
Efkere, Halil İbrahim, et al.. (2021). Investigations of some physical properties of ALD growth ZnO films: effect of crystal orientation on photocatalytic activity. Journal of Materials Science Materials in Electronics. 32(9). 12059–12074. 10 indexed citations
9.
Çetinkaya, Çağlar, Barış Kınacı, Feyza Güzelçimen, et al.. (2021). Design and fabrication of a semi-transparent solar cell considering the effect of the layer thickness of MoO3/Ag/MoO3 transparent top contact on optical and electrical properties. Scientific Reports. 11(1). 13079–13079. 39 indexed citations
10.
Efkere, Halil İbrahim, et al.. (2021). Investigation of the effect of annealing on the structural, morphological and optical properties of RF sputtered WO3 nanostructure. Physica B Condensed Matter. 622. 413350–413350. 14 indexed citations
11.
Çetinkaya, Çağlar, Barış Kınacı, Feyza Güzelçimen, et al.. (2021). Evaluation on output parameters of the inverted organic solar cells depending on transition-metal-oxide based hole-transporting materials. Optical Materials. 120. 111457–111457. 20 indexed citations
12.
Efkere, Halil İbrahim, et al.. (2021). Structural, morphological, optical and electrical properties of the Ti doped-ZnO (TZO) thin film prepared by RF sputter technique. Physica B Condensed Matter. 616. 413126–413126. 18 indexed citations
13.
Kınacı, Barış, E. Çelik, Çağlar Çetinkaya, et al.. (2021). Effect of Annealing on the Surface Morphology and Current–Voltage Characterization of a CZO Structure Prepared by RF Magnetron Sputtering. Semiconductors. 55(1). 28–36. 3 indexed citations
14.
Efkere, Halil İbrahim, et al.. (2020). Gas Sensing Properties of Cr Doped TiO2 Films Against Propane. IEEE Sensors Journal. 20(22). 13436–13443. 19 indexed citations
15.
Kınacı, Barış, et al.. (2020). Negative capacitance phenomena in Au/SrTiO3/p-Si heterojunction structure. Journal of Materials Science Materials in Electronics. 31(11). 8718–8726. 13 indexed citations
16.
Güzelçimen, Feyza, Çağlar Çetinkaya, Halil İbrahim Efkere, et al.. (2020). The effect of thickness on surface structure of rf sputtered TiO2 thin films by XPS, SEM/EDS, AFM and SAM. Vacuum. 182. 109766–109766. 99 indexed citations
17.
Çetin, Saime Şebnem, et al.. (2020). Electrical Properties of MOS Capacitor with TiO2/SiO2 Dielectric Layer. Silicon. 12(12). 2879–2883. 13 indexed citations
18.
Efkere, Halil İbrahim, et al.. (2018). The effect of thickness on the optical, structural and electrical properties of ZnO thin film deposited on n-type Si. Journal of Molecular Structure. 1165. 376–380. 15 indexed citations
19.
Sönmez, Nihan Akın, et al.. (2014). Structural and Optical Properties of Reactive Sputtered ZnO Thin Films on Flexible-Transparent Substrates. Gazi university journal of science. 27(4). 1111–1114. 1 indexed citations
20.
Sönmez, Nihan Akın, Yunus Özen, Halil İbrahim Efkere, M. Çakmak, & Süleyman Özçelik. (2014). Surface structure and photoluminescence properties of AZO thin films on polymer substrates. Surface and Interface Analysis. 47(1). 93–98. 42 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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