A. Tataroğlu
About
In The Last Decade
A. Tataroğlu
116 papers receiving 3.0k citations
Peers
Comparison fields: 5 of 56
- Electrical and Electronic Engineering 2.4k
- Atomic and Molecular Physics, and Optics 2.3k
- Materials Chemistry 1.6k
- Polymers and Plastics 410
- Biomedical Engineering 339
Countries citing papers authored by A. Tataroğlu
This map shows the geographic impact of A. Tataroğlu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Tataroğlu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Tataroğlu more than expected).
Fields of papers citing papers by A. Tataroğlu
This network shows the impact of papers produced by A. Tataroğlu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Tataroğlu. The network helps show where A. Tataroğlu may publish in the future.
Co-authorship network of co-authors of A. Tataroğlu
This figure shows the co-authorship network connecting the top 25 collaborators of A. Tataroğlu. A scholar is included among the top collaborators of A. Tataroğlu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Tataroğlu. A. Tataroğlu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 7 | |
| 3 | 3 | |
| 4 | 9 | |
| 5 | 4 | |
| 6 | 9 | |
| 7 | 4 | |
| 8 | 1 | |
| 9 | 12 | |
| 10 | 10 | |
| 11 | 35 | |
| 12 | 1 | |
| 13 | 4 | |
| 14 | 6 | |
| 15 | 17 | |
| 16 | 20 | |
| 17 | Electrical characterization of MIS diode prepared by magnetron sputtering | 14 |
| 18 | Analysis of density and time constant of interface states of MIS device by conductance method | 2 |
| 19 | Analysis of Barrier Height and Carrier Concentration of MOS Capacitor Using C-f and G/ω-f Measurement | 5 |
| 20 | Current-Voltage (I-V) and Capacitance-Voltage (C-V) Characteristics of Au/Bi4Ti3O12/SnO2 Structures | 6 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.