G.W. Ray

571 total citations
21 papers, 407 citations indexed

About

G.W. Ray is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Biomedical Engineering. According to data from OpenAlex, G.W. Ray has authored 21 papers receiving a total of 407 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 10 papers in Electronic, Optical and Magnetic Materials and 4 papers in Biomedical Engineering. Recurrent topics in G.W. Ray's work include Copper Interconnects and Reliability (10 papers), Semiconductor materials and devices (8 papers) and Electronic Packaging and Soldering Technologies (6 papers). G.W. Ray is often cited by papers focused on Copper Interconnects and Reliability (10 papers), Semiconductor materials and devices (8 papers) and Electronic Packaging and Soldering Technologies (6 papers). G.W. Ray collaborates with scholars based in United States. G.W. Ray's co-authors include Robert T. Watson, Alvin L. S. Loke, S.S. Wong, Changsup Ryu, Kee-Won Kwon, Valery M. Dubin, T. Nogami, Stanley P. Sander, Glenn Alers and Roey Shaviv and has published in prestigious journals such as Journal of The Electrochemical Society, The Journal of Physical Chemistry and IEEE Transactions on Electron Devices.

In The Last Decade

G.W. Ray

21 papers receiving 376 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
G.W. Ray United States 12 278 178 83 64 60 21 407
Guoqiang Xing China 11 173 0.6× 28 0.2× 77 0.9× 29 0.5× 150 2.5× 54 419
Lee M. Loewenstein United States 11 180 0.6× 15 0.1× 80 1.0× 21 0.3× 56 0.9× 33 315
A. K. George Oman 10 40 0.1× 169 0.9× 132 1.6× 62 1.0× 54 0.9× 54 358
Jeff D. Byers United States 12 285 1.0× 23 0.1× 25 0.3× 22 0.3× 38 0.6× 47 400
Richard Hopper United Kingdom 12 209 0.8× 29 0.2× 72 0.9× 23 0.4× 64 1.1× 30 365
Feifei Chen China 11 171 0.6× 73 0.4× 196 2.4× 59 0.9× 137 2.3× 51 453
G. Derkachov Poland 12 154 0.6× 62 0.3× 92 1.1× 9 0.1× 50 0.8× 29 327
Adriaan C. Carter United States 9 257 0.9× 67 0.4× 295 3.6× 9 0.1× 30 0.5× 23 417
Seán Kelly Ireland 15 374 1.3× 28 0.2× 193 2.3× 45 0.7× 104 1.7× 31 681
G. F. Sauter United States 8 121 0.4× 89 0.5× 37 0.4× 20 0.3× 171 2.9× 19 347

Countries citing papers authored by G.W. Ray

Since Specialization
Citations

This map shows the geographic impact of G.W. Ray's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G.W. Ray with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G.W. Ray more than expected).

Fields of papers citing papers by G.W. Ray

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G.W. Ray. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G.W. Ray. The network helps show where G.W. Ray may publish in the future.

Co-authorship network of co-authors of G.W. Ray

This figure shows the co-authorship network connecting the top 25 collaborators of G.W. Ray. A scholar is included among the top collaborators of G.W. Ray based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G.W. Ray. G.W. Ray is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ray, G.W., et al.. (2007). Analog to Feature Conversion. II–365. 1 indexed citations
2.
Alers, Glenn, et al.. (2004). Barrier-first integration for improved reliability in copper dual damascene interconnects. 27–29. 10 indexed citations
3.
4.
Nakagawa, O.S., Soo‐Young Oh, & G.W. Ray. (2002). Modeling of pattern-dependent on-chip interconnect geometry variation for deep-submicron process and design technology. 137–140. 12 indexed citations
5.
6.
Ryu, Changsup, Kee-Won Kwon, Alvin L. S. Loke, et al.. (2002). Electromigration of submicron Damascene copper interconnects. 156–157. 13 indexed citations
7.
Stine, B.E., Duane S. Boning, J.E. Chung, et al.. (2002). Using a statistical metrology framework to identify systematic and random sources of die- and wafer-level ILD thickness variation in CMP processes. 2334. 499–502. 19 indexed citations
8.
Theil, Jeremy, et al.. (2000). Hydrogenated Amorphous Silicon Photodiode Technology for Advanced CMOS Active Pixel Sensor Imagers. MRS Proceedings. 609. 10 indexed citations
9.
Theil, Jeremy, et al.. (2000). Mid-gap states measurements of low-level boron-doped a-Si:H films. Journal of Non-Crystalline Solids. 266-269. 569–573. 6 indexed citations
10.
Ryu, Changsup, Kee-Won Kwon, Alvin L. S. Loke, et al.. (1999). Microstructure and reliability of copper interconnects. IEEE Transactions on Electron Devices. 46(6). 1113–1120. 139 indexed citations
11.
Liu, Huayu, C.H. Diaz, Peng Cheng, et al.. (1998). 100-nm CMOS gates patterned with 3 sigma below 10 nm. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3331. 375–375. 2 indexed citations
12.
Stine, B.E., Dennis O. Ouma, Duane S. Boning, et al.. (1998). A Novel Statistical Metrology Framework for Identifying Sources of Variation in Oxide Chemical‐Mechanical Polishing. Journal of The Electrochemical Society. 145(3). 1052–1059. 3 indexed citations
13.
Ray, G.W.. (1998). Low Dielectric Constant Materials Integration Challenges. MRS Proceedings. 511. 11 indexed citations
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15.
16.
Marcoux, Paul, et al.. (1985). Endpoint detection in plasma etching. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 3(3). 631–636. 14 indexed citations
17.
Ray, G.W., et al.. (1982). Spin‐On Glass as an Intermediate Layer in a Tri‐Layer Resist Process. Journal of The Electrochemical Society. 129(9). 2152–2154. 11 indexed citations
18.
Sander, Stanley P., G.W. Ray, & Robert T. Watson. (1981). Kinetics study of the pressure dependence of the BrO + NO2 reaction at 298 K. The Journal of Physical Chemistry. 85(2). 199–210. 39 indexed citations
19.
Ray, G.W. & Robert T. Watson. (1981). Kinetics of the reaction nitric oxide + ozone .fwdarw. nitrogen dioxide + oxygen from 212 to 422 K. The Journal of Physical Chemistry. 85(12). 1673–1676. 14 indexed citations
20.
Ray, G.W. & Robert T. Watson. (1981). Kinetics study of the reactions of nitric oxide with oxygen fluoride, chlorine oxide, bromine oxide, and iodine oxide at 298 K. The Journal of Physical Chemistry. 85(20). 2955–2960. 33 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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