Ghaith Bany Hamad
- Computer Networks and Communications top 5%
- Hardware and Architecture top 5%
- Electrical and Electronic Engineering
- Computational Theory and Mathematics top 10%
- Artificial Intelligence
- Co-authors
- Otmane Aı̈t MohamedYvon SavariaSyed Rafay HasanŽeljko ŽilićMingjie LiuHaoxing RenRaoul VelazcoYunsheng Bai
- Topics
- Radiation Effects in Electronics (19 papers)VLSI and Analog Circuit Testing (13 papers)Formal Methods in Verification (11 papers)
- Partner nations
- CanadaUnited StatesFrance
In The Last Decade
Ghaith Bany Hamad
31 papers receiving 330 citations
Peers
Comparison fields: 5 of 42
- Computer Networks and Communications 179
- Hardware and Architecture 133
- Electrical and Electronic Engineering 92
- Computational Theory and Mathematics 47
- Artificial Intelligence 32
Countries citing papers authored by Ghaith Bany Hamad
This map shows the geographic impact of Ghaith Bany Hamad's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ghaith Bany Hamad with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ghaith Bany Hamad more than expected).
Fields of papers citing papers by Ghaith Bany Hamad
This network shows the impact of papers produced by Ghaith Bany Hamad. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ghaith Bany Hamad. The network helps show where Ghaith Bany Hamad may publish in the future.
Co-authorship network of co-authors of Ghaith Bany Hamad
This figure shows the co-authorship network connecting the top 25 collaborators of Ghaith Bany Hamad. A scholar is included among the top collaborators of Ghaith Bany Hamad based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ghaith Bany Hamad. Ghaith Bany Hamad is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 5 | |
| 3 | 11 | |
| 4 | 2 | |
| 5 | 18 | |
| 6 | 29 | |
| 7 | 128 | |
| 8 | 7 | |
| 9 | 5 | |
| 10 | 3 | |
| 11 | 1 | |
| 12 | 1 | |
| 13 | 1 | |
| 14 | 1 | |
| 15 | 5 | |
| 16 | 7 | |
| 17 | 4 | |
| 18 | 12 | |
| 19 | 12 | |
| 20 | 3 |
About Ghaith Bany Hamad
Ghaith Bany Hamad is a scholar working on Software, Hardware and Architecture and Safety, Risk, Reliability and Quality, having authored 34 papers that have together received 337 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (19 papers), VLSI and Analog Circuit Testing (13 papers) and Formal Methods in Verification (11 papers). The work is most often cited by research in Hardware and Architecture (133 citations), Computer Networks and Communications (179 citations) and Software (25 citations). Ghaith Bany Hamad has collaborated with scholars based in Canada, United States and France. Frequent co-authors include Otmane Aı̈t Mohamed, Yvon Savaria, Syed Rafay Hasan, Željko Žilić, Mingjie Liu, Haoxing Ren, Raoul Velazco and Yunsheng Bai. Their work appears in journals such as IEEE Access, IEEE Transactions on Industrial Informatics and IEEE Transactions on Nuclear Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.