F. Paumier

884 total citations
45 papers, 737 citations indexed

About

F. Paumier is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, F. Paumier has authored 45 papers receiving a total of 737 indexed citations (citations by other indexed papers that have themselves been cited), including 36 papers in Materials Chemistry, 26 papers in Electrical and Electronic Engineering and 9 papers in Surfaces, Coatings and Films. Recurrent topics in F. Paumier's work include Semiconductor materials and devices (19 papers), Electronic and Structural Properties of Oxides (17 papers) and ZnO doping and properties (11 papers). F. Paumier is often cited by papers focused on Semiconductor materials and devices (19 papers), Electronic and Structural Properties of Oxides (17 papers) and ZnO doping and properties (11 papers). F. Paumier collaborates with scholars based in France, Spain and United States. F. Paumier's co-authors include R.J. Gaboriaud, Bertrand Lacroix, F. Pailloux, P. Guérin, T. Girardeau, Michaël Jublot, A. R. Kaul, E. Alves, F. Vaz and S. Carvalho and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Advanced Functional Materials.

In The Last Decade

F. Paumier

44 papers receiving 720 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F. Paumier France 16 532 379 137 123 78 45 737
S. Tripura Sundari India 13 306 0.6× 266 0.7× 89 0.6× 121 1.0× 72 0.9× 45 548
Eita Tochigi Japan 18 581 1.1× 467 1.2× 155 1.1× 118 1.0× 127 1.6× 68 990
Akira Izumi Japan 18 432 0.8× 630 1.7× 62 0.5× 137 1.1× 89 1.1× 70 774
Z. A. Sechrist United States 7 582 1.1× 457 1.2× 103 0.8× 87 0.7× 69 0.9× 9 758
Z. H. Barber United Kingdom 14 547 1.0× 245 0.6× 130 0.9× 356 2.9× 113 1.4× 30 871
Sakari Sintonen Finland 15 425 0.8× 485 1.3× 171 1.2× 148 1.2× 75 1.0× 35 758
S. Thakur India 18 380 0.7× 495 1.3× 111 0.8× 115 0.9× 229 2.9× 50 861
H.C. Kim United States 8 242 0.5× 282 0.7× 132 1.0× 38 0.3× 76 1.0× 10 448
S. Jena India 19 405 0.8× 497 1.3× 114 0.8× 90 0.7× 253 3.2× 53 841
S. W. Whangbo South Korea 11 328 0.6× 284 0.7× 108 0.8× 51 0.4× 53 0.7× 22 458

Countries citing papers authored by F. Paumier

Since Specialization
Citations

This map shows the geographic impact of F. Paumier's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Paumier with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Paumier more than expected).

Fields of papers citing papers by F. Paumier

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Paumier. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Paumier. The network helps show where F. Paumier may publish in the future.

Co-authorship network of co-authors of F. Paumier

This figure shows the co-authorship network connecting the top 25 collaborators of F. Paumier. A scholar is included among the top collaborators of F. Paumier based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Paumier. F. Paumier is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Hurand, Simon, et al.. (2022). Anisotropic optical properties of indium tin oxide thin films prepared by ion beam sputtering under oblique angle deposition. Applied Surface Science. 595. 152945–152945. 10 indexed citations
3.
Renault, P.-O., Dominique Thiaudière, P. Godard, et al.. (2021). In situ electrical and mechanical study of Indium Tin Oxide films deposited on polyimide substrate by Xe ion beam sputtering. Thin Solid Films. 741. 139035–139035. 2 indexed citations
4.
Lacroix, Bertrand, et al.. (2018). Towards perfect MWIR transparency using oblique angle deposition. Applied Surface Science. 470. 943–950. 9 indexed citations
5.
Alves, C.F. Almeida, C. Мансилла, L. Pereira, et al.. (2017). Influence of magnetron sputtering conditions on the chemical bonding, structural, morphological and optical behavior of Ta1−xOx coatings. Surface and Coatings Technology. 334. 105–115. 7 indexed citations
6.
Gaboriaud, R.J., F. Paumier, & Bertrand Lacroix. (2014). Synthesis, structuring and characterization of rare earth oxide thin films: Modeling of the effects of stress and defects on the phase stability. Thin Solid Films. 553. 43–46. 3 indexed citations
7.
Debelle, A., Marie Backman, L. Thomé, et al.. (2014). Swift heavy ion induced recrystallization in cubic silicon carbide: New insights from designed experiments and MD simulations. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 326. 326–331. 20 indexed citations
8.
Borges, Joel, Carlos Fonseca, N.P. Barradas, et al.. (2013). Influence of composition, bonding characteristics and microstructure on the electrochemical and optical stability of AlOxNy thin films. Electrochimica Acta. 106. 23–34. 12 indexed citations
9.
Thanh, Pham Van, D. Faurie, Philippe Djémia, et al.. (2013). Phase transition signature on elastic constants in Al1-xCrxNy ternary alloys thin films. Applied Physics Letters. 103(4). 6 indexed citations
10.
Gaboriaud, R.J., Michaël Jublot, F. Paumier, & Bertrand Lacroix. (2013). Phase transformations in Y2O3 thin films under swift Xe ions irradiation. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 310. 6–9. 15 indexed citations
11.
Gaboriaud, R.J., F. Paumier, Michaël Jublot, & Bertrand Lacroix. (2013). Ion irradiation-induced phase transformation mechanisms in Y2O3 thin films. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 311. 86–92. 28 indexed citations
12.
Girardeau, T., et al.. (2011). Microstructural and conductivity changes induced by annealing of ZnO:B thin films deposited by chemical vapour deposition. Journal of Physics Condensed Matter. 23(33). 334209–334209. 15 indexed citations
13.
Zighem, F., et al.. (2010). Magnetic properties of exchange biased and of unbiased oxide/permalloy thin layers: a ferromagnetic resonance and Brillouin scattering study. Journal of Physics Condensed Matter. 22(40). 406001–406001. 2 indexed citations
14.
Abadias, G., F. Paumier, D. Eyidi, Philippe Guérin, & T. Girardeau. (2010). Structure and properties of nitrogen‐doped titanium dioxide thin films produced by reactive magnetron sputtering. Surface and Interface Analysis. 42(6-7). 970–973. 14 indexed citations
15.
Parry, Valérie, F. Paumier, M.-J. Guittet, & M. Gautier-Soyer. (2008). Dielectric properties of pure and Nb-doped SrTiO3surfaces: a reflection electron energy loss spectroscopy study. Journal of Physics Conference Series. 94. 12010–12010. 2 indexed citations
16.
Pailloux, F., D. Imhoff, Michaël Jublot, et al.. (2006). HRTEM and EELS study of Y2O3/MgO thin films. Micron. 37(5). 420–425. 7 indexed citations
17.
Paumier, F., M.-J. Guittet, M. Gautier-Soyer, et al.. (2006). Reflection electron energy loss spectroscopy of nanometric oxide layers and of their interfaces with a substrate. Materials Science and Engineering A. 422(1-2). 29–40. 13 indexed citations
18.
Paumier, F., R.J. Gaboriaud, & C. Coupeau. (2003). Buckling phenomena in Y2O3 thin films on GaAs substrates. Applied Physics Letters. 82(13). 2056–2058. 9 indexed citations
19.
Paumier, F., R.J. Gaboriaud, & A. R. Kaul. (2002). Yttrium oxide thin films: chemistry- stoichiometry-strain and microstructure. 5(3-4). 169–175. 25 indexed citations
20.
Gaboriaud, R.J., F. Pailloux, P. Guérin, & F. Paumier. (2000). Yttrium oxide thin films, Y2O3, grown by ion beam sputtering on Si. Journal of Physics D Applied Physics. 33(22). 2884–2889. 63 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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