Eric Costard

837 citations
66 papers · 646 indexed · h-index 12

Eric Costard

63 papers receiving 569 citations

Peers

Eric Costard
Comparison fields: 5 of 40
  • Atomic and Molecular Physics, and Optics 444
  • Surfaces, Coatings and Films 92
  • Electrical and Electronic Engineering 500
  • Instrumentation 24
  • Spectroscopy 110
Replace Ajit V. Barve with:
Ajit V. Barve United States
C. Janke Germany
Yueming Qiu United States
H. D. Shih United States
P. Bois France
Wolfgang A. Cabanski Germany
Andreas Vetter United States
M.H. MacDougal United States
P. Kern France
M. Sundaram United States
Eric Costard relative to Ajit V. Barve United States Ajit V. Barve's profile →
Citations per field
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Ajit V. Barve · 1×
Citations per year

Countries citing papers authored by Eric Costard

Since Specialization
Citations

This map shows the geographic impact of Eric Costard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric Costard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric Costard more than expected).

Fields of papers citing papers by Eric Costard

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Eric Costard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric Costard. The network helps show where Eric Costard may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Eric Costard, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Eric Costard Line = papers co-authored together Eric Costard links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20234
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5 20234
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10 20194
11 20122
12 20082
13 20074
14 20066
15 20036
16 200339
17 19953
18 19953
19 199139
20 19892

About Eric Costard

Eric Costard is a scholar working on Aerospace Engineering, Spectroscopy, Electrical and Electronic Engineering, Instrumentation and Atomic and Molecular Physics, and Optics, having authored 66 papers that have together received 646 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (39 papers), Calibration and Measurement Techniques (21 papers), Semiconductor Quantum Structures and Devices (20 papers), Infrared Target Detection Methodologies (19 papers), Spectroscopy and Laser Applications (15 papers), Photonic and Optical Devices (11 papers), CCD and CMOS Imaging Sensors (7 papers) and Chalcogenide Semiconductor Thin Films (5 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (444 citations), Surfaces, Coatings and Films (92 citations), Electrical and Electronic Engineering (500 citations), Instrumentation (24 citations) and Spectroscopy (110 citations). Eric Costard has collaborated with scholars based in France, Sweden and Germany. Frequent co-authors include V. Berger, Olivier Gauthier‐Lafaye, P. Bois, N. Vodjdani, X. Marcadet, Alfredo De Rossi, Nicolas Guérineau, J. Nagle, Linda Höglund and B. Vinter. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, IEEE Transactions on Electron Devices, physica status solidi (a) and Comptes Rendus Physique.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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