Doh-Yeon Kim
- Materials Chemistry top 5%
- Electrical and Electronic Engineering top 10%
- Mechanical Engineering top 5%
- Ceramics and Composites top 1%
- Biomedical Engineering top 10%
- Co-authors
- Nong‐Moon HwangEuijoon YoonChong WangKai‐Ming HoGun‐Do LeeJoo‐Hwan HanJong‐Sook LeeHwan Kim
- Topics
- Advanced ceramic materials synthesis (15 papers)Ferroelectric and Piezoelectric Materials (13 papers)Advanced materials and composites (11 papers)
- Partner nations
- South KoreaGermanyIndia
In The Last Decade
Doh-Yeon Kim
70 papers receiving 1.9k citations
Peers
Comparison fields: 5 of 77
- Materials Chemistry 1.4k
- Electrical and Electronic Engineering 591
- Mechanical Engineering 563
- Ceramics and Composites 453
- Biomedical Engineering 338
Countries citing papers authored by Doh-Yeon Kim
This map shows the geographic impact of Doh-Yeon Kim's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Doh-Yeon Kim with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Doh-Yeon Kim more than expected).
Fields of papers citing papers by Doh-Yeon Kim
This network shows the impact of papers produced by Doh-Yeon Kim. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Doh-Yeon Kim. The network helps show where Doh-Yeon Kim may publish in the future.
Co-authorship network of co-authors of Doh-Yeon Kim
This figure shows the co-authorship network connecting the top 25 collaborators of Doh-Yeon Kim. A scholar is included among the top collaborators of Doh-Yeon Kim based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Doh-Yeon Kim. Doh-Yeon Kim is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 2 | |
| 3 | 2 | |
| 4 | 8 | |
| 5 | 5 | |
| 6 | 6 | |
| 7 | 38 | |
| 8 | 7 | |
| 9 | 435 | |
| 10 | 19 | |
| 11 | 6 | |
| 12 | Effect of grain boundary and texture on stress-induced surface damage in copper thin films | 1 |
| 13 | 5 | |
| 14 | 43 | |
| 15 | 56 | |
| 16 | 42 | |
| 17 | Dissolution and Reprecipitation Behavior of TiC-TiN-Ni Cermets During Liquid-Phase Sintering | 6 |
| 18 | 64 | |
| 19 | 11 | |
| 20 | 8 |
About Doh-Yeon Kim
Doh-Yeon Kim is a scholar working on Ceramics and Composites, Materials Chemistry and Mechanical Engineering, having authored 72 papers that have together received 1.9k indexed citations. Recurring topics across this work include Advanced ceramic materials synthesis (15 papers), Ferroelectric and Piezoelectric Materials (13 papers) and Advanced materials and composites (11 papers). The work is most often cited by research in Ceramics and Composites (453 citations), Materials Chemistry (1.4k citations) and Mechanical Engineering (563 citations). Doh-Yeon Kim has collaborated with scholars based in South Korea, Germany and India. Frequent co-authors include Nong‐Moon Hwang, Nong‐Moon Hwang, Euijoon Yoon, Chong Wang, Kai‐Ming Ho, Gun‐Do Lee, Joo‐Hwan Han, Jong‐Sook Lee, Hwan Kim and Ho-Yong Lee. Their work appears in journals such as Physical Review Letters, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.