Detlef Eich
Impact in
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- Advanced Semiconductor Detectors and Materials
- Chalcogenide Semiconductor Thin Films
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- X-ray Spectroscopy and Fluorescence Analysis
Papers in
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- Advanced Semiconductor Detectors and Materials 49
- Chalcogenide Semiconductor Thin Films 4
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- Semiconductor materials and interfaces 2
- Surface and Thin Film Phenomena 1
- Co-authors
- R. Fink (14 shared papers)Eberhard Umbach (14 shared papers)Heinrich Figgemeier (39 shared papers)Stefan Hanna (31 shared papers)S. K. Kulkarni (2 shared papers)Ulf Winkler (3 shared papers)Rainer Breiter (21 shared papers)Clemens Heske (7 shared papers)
- Journals
- Journal of Electronic Materials (11 papers)Applied Physics Letters (3 papers)IEEE Journal of Selected Topics in Quantum Electronics (2 papers)Thin Solid Films (2 papers)Applied Optics (2 papers)
- Partner nations
- GermanyItalyUnited States
In The Last Decade
Detlef Eich
56 papers receiving 680 citations
Peers
Comparison fields: 5 of 18
- Electrical and Electronic Engineering 501
- Radiation 22
- Surfaces, Coatings and Films 13
- Materials Chemistry 81
- Instrumentation 3
Countries citing papers authored by Detlef Eich
This map shows the geographic impact of Detlef Eich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Detlef Eich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Detlef Eich more than expected).
Fields of papers citing papers by Detlef Eich
This network shows the impact of papers produced by Detlef Eich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Detlef Eich. The network helps show where Detlef Eich may publish in the future.
Co-authors
The 25 scholars most cited alongside Detlef Eich, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 62 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 121 | |
| 2 | 1999 | 91 | |
| 3 | 2005 | 41 | |
| 4 | 2000 | 38 | |
| 5 | 1999 | 35 | |
| 6 | 1999 | 30 | |
| 7 | 2017 | 28 | |
| 8 | 2006 | 27 | |
| 9 | 1999 | 23 | |
| 10 | 2016 | 18 | |
| 11 | 2018 | 18 | |
| 12 | 2012 | 15 | |
| 13 | 2014 | 15 | |
| 14 | 1998 | 14 | |
| 15 | 2016 | 14 | |
| 16 | 2018 | 13 | |
| 17 | 2019 | 13 | |
| 18 | 2000 | 12 | |
| 19 | 2000 | 11 | |
| 20 | 2000 | 11 |
About Detlef Eich
Detlef Eich is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Radiation and Nuclear Energy and Engineering, having authored 62 papers that have together received 787 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (49 papers), Chalcogenide Semiconductor Thin Films (4 papers), Semiconductor materials and interfaces (2 papers), Surface and Thin Film Phenomena (1 paper), X-ray Spectroscopy and Fluorescence Analysis (1 paper) and Electron and X-Ray Spectroscopy Techniques (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (501 citations), Radiation (22 citations), Surfaces, Coatings and Films (13 citations), Materials Chemistry (81 citations) and Instrumentation (3 citations). Detlef Eich has collaborated with scholars based in Germany, Italy and United States. Frequent co-authors include R. Fink, Eberhard Umbach, Heinrich Figgemeier, Stefan Hanna, S. K. Kulkarni, Ulf Winkler, Rainer Breiter, Clemens Heske, J. Wendler and W. Riedl. Their work appears in journals such as Journal of Electronic Materials, Applied Physics Letters, IEEE Journal of Selected Topics in Quantum Electronics, Thin Solid Films and Applied Optics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.