Dawei Bi
Impact in
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- Semiconductor materials and devices
- Radiation Effects in Electronics
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Memory and Neural Computing
- Low-power high-performance VLSI design
- Photonic and Optical Devices
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- VLSI and Analog Circuit Testing
Papers in
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- Semiconductor materials and devices 63
- Radiation Effects in Electronics 51
- Advancements in Semiconductor Devices and Circuit Design 48
- Integrated Circuits and Semiconductor Failure Analysis 15
- Advanced Memory and Neural Computing 6
- Low-power high-performance VLSI design 4
- Electrostatic Discharge in Electronics 3
- Co-authors
- Zhiyuan Hu (48 shared papers)Bingxu Ning (34 shared papers)Shichang Zou (37 shared papers)Zhengxuan Zhang (44 shared papers)Zhangli Liu (22 shared papers)Ming Chen (13 shared papers)Chao Peng (10 shared papers)Yunfei En (2 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (14 papers)Microelectronics Reliability (10 papers)International Journal of Circuit Theory and Applications (6 papers)Journal of Semiconductors (4 papers)Chinese Physics Letters (4 papers)
- Partner nations
- ChinaUnited StatesAustralia
In The Last Decade
Dawei Bi
68 papers receiving 388 citations
Peers
Comparison fields: 5 of 35
- Electrical and Electronic Engineering 406
- Hardware and Architecture 22
- Instrumentation 6
- Radiation 8
- Bioengineering 2
Countries citing papers authored by Dawei Bi
This map shows the geographic impact of Dawei Bi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Dawei Bi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Dawei Bi more than expected).
Fields of papers citing papers by Dawei Bi
This network shows the impact of papers produced by Dawei Bi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Dawei Bi. The network helps show where Dawei Bi may publish in the future.
Co-authors
The 25 scholars most cited alongside Dawei Bi, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 76 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2014 | 34 | |
| 2 | 2012 | 28 | |
| 3 | 2011 | 22 | |
| 4 | 2011 | 13 | |
| 5 | 2014 | 13 | |
| 6 | 2022 | 12 | |
| 7 | 2011 | 11 | |
| 8 | 2011 | 11 | |
| 9 | 2011 | 11 | |
| 10 | 2019 | 10 | |
| 11 | 2022 | 9 | |
| 12 | 2011 | 9 | |
| 13 | 2017 | 9 | |
| 14 | 2014 | 9 | |
| 15 | 2011 | 9 | |
| 16 | 2016 | 9 | |
| 17 | 2022 | 8 | |
| 18 | 2011 | 8 | |
| 19 | 2011 | 8 | |
| 20 | 2013 | 8 |
About Dawei Bi
Dawei Bi is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Hardware and Architecture, Automotive Engineering and Computer Vision and Pattern Recognition, having authored 76 papers that have together received 428 indexed citations. Recurring topics across this work include Semiconductor materials and devices (63 papers), Radiation Effects in Electronics (51 papers), Advancements in Semiconductor Devices and Circuit Design (48 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers), Advanced Memory and Neural Computing (6 papers), VLSI and Analog Circuit Testing (4 papers), Low-power high-performance VLSI design (4 papers) and Electrostatic Discharge in Electronics (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (406 citations), Hardware and Architecture (22 citations), Instrumentation (6 citations), Radiation (8 citations) and Bioengineering (2 citations). Dawei Bi has collaborated with scholars based in China, United States and Australia. Frequent co-authors include Zhiyuan Hu, Bingxu Ning, Shichang Zou, Zhengxuan Zhang, Zhangli Liu, Ming Chen, Chao Peng, Yunfei En, Aimin Wu and Ming Chen. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, International Journal of Circuit Theory and Applications, Journal of Semiconductors and Chinese Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.