Wu Lu

520 total citations
34 papers, 232 citations indexed

About

Wu Lu is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics and Hardware and Architecture. According to data from OpenAlex, Wu Lu has authored 34 papers receiving a total of 232 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 4 papers in Condensed Matter Physics and 4 papers in Hardware and Architecture. Recurrent topics in Wu Lu's work include Radiation Effects in Electronics (27 papers), Semiconductor materials and devices (26 papers) and Advancements in Semiconductor Devices and Circuit Design (13 papers). Wu Lu is often cited by papers focused on Radiation Effects in Electronics (27 papers), Semiconductor materials and devices (26 papers) and Advancements in Semiconductor Devices and Circuit Design (13 papers). Wu Lu collaborates with scholars based in China, United States and South Korea. Wu Lu's co-authors include Qi Guo, Atazaz Hassan, Sajid Abbas, Quanfang Chen, Qiwen Zheng, Jiangwei Cui, Chengfa He, Xue‐Feng Yu, Mohan Liu and Ying Wei and has published in prestigious journals such as IEEE Access, Renewable Energy and Journal of Alloys and Compounds.

In The Last Decade

Wu Lu

33 papers receiving 213 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Wu Lu China 9 170 69 26 20 17 34 232
Jinsu Jeong South Korea 13 457 2.7× 18 0.3× 6 0.2× 12 0.6× 9 0.5× 39 489
Dirk Kranzer Germany 13 416 2.4× 118 1.7× 11 0.6× 6 0.4× 21 425
J. D. López-Cardona Spain 13 464 2.7× 25 0.4× 9 0.5× 7 0.4× 25 476
A. Terao Belgium 12 472 2.8× 108 1.6× 2 0.1× 3 0.1× 35 2.1× 26 538
R. Zhang United States 9 393 2.3× 21 0.3× 2 0.1× 6 0.3× 3 0.2× 14 427
Haoqing Xu China 9 133 0.8× 4 0.1× 7 0.3× 78 3.9× 7 0.4× 21 229
Takanobu Shimada Japan 5 68 0.4× 34 0.5× 17 0.8× 4 0.2× 17 141
Alejandro Paredes Spain 9 319 1.9× 25 0.4× 16 0.8× 1 0.1× 26 332
M.Y. Lau United States 8 219 1.3× 6 0.1× 23 0.9× 3 0.1× 1 0.1× 24 236
Junfeng Xu United States 8 303 1.8× 12 0.2× 2 0.1× 13 0.7× 1 0.1× 14 320

Countries citing papers authored by Wu Lu

Since Specialization
Citations

This map shows the geographic impact of Wu Lu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wu Lu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wu Lu more than expected).

Fields of papers citing papers by Wu Lu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Wu Lu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wu Lu. The network helps show where Wu Lu may publish in the future.

Co-authorship network of co-authors of Wu Lu

This figure shows the co-authorship network connecting the top 25 collaborators of Wu Lu. A scholar is included among the top collaborators of Wu Lu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Wu Lu. Wu Lu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Li, Xiaolong, Mohan Liu, Qiwen Zheng, et al.. (2024). Degradation Mechanisms of Gate Leakage in GaN-Based HEMTs at Low Dose Rate Irradiation. IEEE Access. 12. 35410–35416.
2.
Li, Xuhui, Yingjie Cao, Wu Lu, et al.. (2024). CuO@Cu2V2O7 Z-scheme heterojunction achieves selective CO2 photoreduction to C2H4. Journal of Alloys and Compounds. 984. 173986–173986. 7 indexed citations
3.
Zheng, Qiwen, Jiangwei Cui, Yudong Li, et al.. (2022). Bias Dependence of Total Ionizing Dose Response in UTBB FD-SOI Transistors. IEEE Transactions on Nuclear Science. 69(12). 2314–2323. 3 indexed citations
4.
Zheng, Qiwen, Jiangwei Cui, Xue‐Feng Yu, et al.. (2021). Measurement and Evaluation of the Within-Wafer TID Response Variability on BOX Layer of SOI Technology. IEEE Transactions on Nuclear Science. 68(10). 2516–2523. 3 indexed citations
5.
6.
Zheng, Qiwen, et al.. (2020). Modeling of TID-induced leakage current in ultra-deep submicron SOI NMOSFETs. Microelectronics Journal. 102. 104829–104829. 9 indexed citations
7.
Chen, Siyuan, Xin Yu, Wu Lu, et al.. (2020). Effects of Total-Ionizing-Dose Irradiation on Single-Event Burnout for Commercial Enhancement-Mode AlGaN/GaN High-Electron Mobility Transistors*. Chinese Physics Letters. 37(4). 46101–46101. 10 indexed citations
8.
Lu, Wu, Xin Yu, Qi Guo, et al.. (2019). Using a Temperature-Switching Approach to Evaluate Low-Dose-Rate Ionizing Radiation Effects on SET in Linear Bipolar Circuits. IEEE Transactions on Nuclear Science. 66(7). 1557–1565. 2 indexed citations
9.
Li, Xiaolong, Wu Lu, Qi Guo, et al.. (2018). Temperature-Switching During Irradiation as a Test for ELDRS in Linear Bipolar Devices. IEEE Transactions on Nuclear Science. 66(1). 199–206. 14 indexed citations
10.
Zheng, Qiwen, Jiangwei Cui, Wu Lu, et al.. (2018). Total Ionizing Dose Influence on the Single-Event Multiple-Cell Upsets in 65-nm 6-T SRAM. IEEE Transactions on Nuclear Science. 66(6). 892–898. 6 indexed citations
11.
Li, Xiaolong, Wu Lu, Xin Wang, et al.. (2018). Estimation of enhanced low dose rate sensitivity mechanisms using temperature switching irradiation on gate-controlled lateral PNP transistor. Chinese Physics B. 27(3). 36102–36102. 6 indexed citations
12.
Zhang, Jinxin, Qi Guo, Hongxia Guo, et al.. (2018). Investigation of enhanced low dose rate sensitivity in SiGe HBTs by 60Co γ irradiation under different biases. Microelectronics Reliability. 84. 105–111. 12 indexed citations
13.
Zheng, Qiwen, Jiangwei Cui, Mengxin Liu, et al.. (2017). Total Ionizing Dose Influence on the Single-Event Upset Sensitivity of 130-nm PD SOI SRAMs. IEEE Transactions on Nuclear Science. 64(7). 1897–1904. 11 indexed citations
14.
Zheng, Qiwen, Jiangwei Cui, Xue‐Feng Yu, et al.. (2017). Read Static Noise Margin Decrease of 65-nm 6-T SRAM Cell Induced by Total Ionizing Dose. IEEE Transactions on Nuclear Science. 65(2). 691–697. 9 indexed citations
15.
Zheng, Qiwen, Jiangwei Cui, Mengxin Liu, et al.. (2017). Direct measurement and analysis of total ionizing dose effect on 130 nm PD SOI SRAM cell static noise margin*. Chinese Physics B. 26(9). 96103–96103. 2 indexed citations
16.
Wang, Yuxin, et al.. (2014). The total dose effects on the 1/fnoise of deep submicron CMOS transistors. Journal of Semiconductors. 35(2). 24006–24006. 2 indexed citations
17.
Wang, Yuji, et al.. (2014). (Invited) Planar Field Effect Transistor Biosensors: Toward Single Molecular Detection and Clinical Applications. ECS Meeting Abstracts. MA2014-01(41). 1520–1520. 1 indexed citations
18.
Wu, Xue, et al.. (2013). Total ionizing dose effects on a radiation-induced BiMOS analog-to-digital converter. Journal of Semiconductors. 34(1). 15006–15006. 1 indexed citations
19.
Lu, Wu, et al.. (2011). The enhanced low dose rate sensitivity of a linear voltage regulator with different biases. Journal of Semiconductors. 32(3). 34007–34007. 2 indexed citations
20.
Lu, Wu, et al.. (2007). Secure routing protocol for Ad hoc based on WMPLS supporting recovery. Computer Engineering and Applications Journal. 43(27). 148–151. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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