David P. Nackashi

1.3k total citations
30 papers, 996 citations indexed

About

David P. Nackashi is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Structural Biology. According to data from OpenAlex, David P. Nackashi has authored 30 papers receiving a total of 996 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 15 papers in Biomedical Engineering and 7 papers in Structural Biology. Recurrent topics in David P. Nackashi's work include Molecular Junctions and Nanostructures (10 papers), Nanowire Synthesis and Applications (8 papers) and Electron and X-Ray Spectroscopy Techniques (7 papers). David P. Nackashi is often cited by papers focused on Molecular Junctions and Nanostructures (10 papers), Nanowire Synthesis and Applications (8 papers) and Electron and X-Ray Spectroscopy Techniques (7 papers). David P. Nackashi collaborates with scholars based in United States, Australia and Germany. David P. Nackashi's co-authors include James M. Tour, Paul D. Franzon, John Damiano, Zhong Jin, Wei Lu, Carter Kittrell, Lawrence F. Allard, Wilbur C. Bigelow, Stephen Mick and Miguel José–Yacamán and has published in prestigious journals such as Journal of the American Chemical Society, Advanced Materials and Chemistry of Materials.

In The Last Decade

David P. Nackashi

29 papers receiving 954 citations

Peers

David P. Nackashi

EEE

AMPO

Thomas Blon France

Ningmu Zou China

Yasuyuki Yokota Japan

Kiseok Chang United States

Teya Topuria United States

R. Coratger France

Teng-Xiang Huang China

Yoshitaka Shingaya Japan

Manuela Schiek Germany

Michael D. Fischbein United States

Thomas Blon France

David P. Nackashi

439 ×0.8

EEE

454 ×1.1

464 ×2.1

407 ×2.3

AMPO

42 ×0.3

Citations per year, relative to David P. Nackashi David P. Nackashi (= 1×) peers Thomas Blon

Countries citing papers authored by David P. Nackashi

Since Specialization

Citations

This map shows the geographic impact of David P. Nackashi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David P. Nackashi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David P. Nackashi more than expected).

Fields of papers citing papers by David P. Nackashi

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David P. Nackashi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David P. Nackashi. The network helps show where David P. Nackashi may publish in the future.

Co-authorship network of co-authors of David P. Nackashi

This figure shows the co-authorship network connecting the top 25 collaborators of David P. Nackashi. A scholar is included among the top collaborators of David P. Nackashi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David P. Nackashi. David P. Nackashi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Krans, Nynke A., et al.. (2023). A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management. Journal of Visualized Experiments. 3 indexed citations

Guo, Yaofeng, et al.. (2022). AXON: An In-situ TEM Software Platform Streamlines Image Acquisition, Metadata Synchronization and Data Analysis, Enabling Deeper Understanding, and Improved Reproducibility of In-situ Experimental Results. Microscopy and Microanalysis. 28(S1). 108–109. 3 indexed citations

Damiano, John, et al.. (2022). AXON Dose: A Solution for Measuring and Managing Electron Dose in the TEM. Microscopy Today. 30(4). 22–25. 5 indexed citations

Unocic, Raymond R., Robert L. Sacci, Gilbert M. Brown, et al.. (2014). Quantitative Electrochemical Measurements Using In Situ ec-S/TEM Devices. Microscopy and Microanalysis. 20(2). 452–461. 71 indexed citations

Allard, Lawrence F., W. C. Bigelow, Xiaoqing Pan, et al.. (2014). Controlled _{In Situ} Gas Reaction Studies of Catalysts at High Temperature and Pressure with Atomic Resolution. Microscopy and Microanalysis. 20(S3). 1572–1573. 3 indexed citations

Allard, Lawrence F., Steven H. Overbury, Wilbur C. Bigelow, et al.. (2012). Novel MEMS-Based Gas-Cell/Heating Specimen Holder Provides Advanced Imaging Capabilities forIn SituReaction Studies. Microscopy and Microanalysis. 18(4). 656–666. 84 indexed citations

Jin, Zhong, David P. Nackashi, Wei Lu, Carter Kittrell, & James M. Tour. (2010). Decoration, Migration, and Aggregation of Palladium Nanoparticles on Graphene Sheets. Chemistry of Materials. 22(20). 5695–5699. 180 indexed citations

Allard, Lawrence F., Wilbur C. Bigelow, Miguel José–Yacamán, et al.. (2009). A new MEMS‐based system for ultra‐high‐resolution imaging at elevated temperatures. Microscopy Research and Technique. 72(3). 208–215. 118 indexed citations

He, Tao, David A. Corley, Meng Kai Lü, et al.. (2009). Controllable Molecular Modulation of Conductivity in Silicon-Based Devices. Journal of the American Chemical Society. 131(29). 10023–10030. 46 indexed citations

10.

Quispe, Joel, John Damiano, Stephen Mick, et al.. (2007). An Improved Holey Carbon Film for Cryo-Electron Microscopy. Microscopy and Microanalysis. 13(5). 365–371. 46 indexed citations

11.

He, Tao, Jianli He, Meng Kai Lü, et al.. (2006). Controlled Modulation of Conductance in Silicon Devices by Molecular Monolayers. Journal of the American Chemical Society. 128(45). 14537–14541. 91 indexed citations

12.

Nackashi, David P., et al.. (2006). Deterministic nanowire fanout and interconnect without any critical translational alignment. IEEE Transactions on Nanotechnology. 5(4). 356–361. 4 indexed citations

13.

Nackashi, David P., et al.. (2006). Physically based molecular device model in a transient circuit simulator. Chemical Physics. 326(1). 188–196. 4 indexed citations

14.

Barlage, Douglas W., et al.. (2005). Wafer scale aligned sub-25nm metal nanowires on Silicon (110) using PEDAL lift-off process. TechConnect Briefs. 3(2005). 255–258.

15.

Wilson, John, et al.. (2005). <title>An integrated self-masking technique for providing low-loss metallized RF MEMS devices in a polysilicon only MEMS process (Invited Paper)</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5836. 138–152. 1 indexed citations

16.

Nackashi, David P., et al.. (2005). Scaling constraints in nanoelectronic random-access memories. Nanotechnology. 16(10). 2251–2260. 73 indexed citations

17.

Cheng, Long, et al.. (2004). Discontinuous Gold Films for Nanocell Memories. TechConnect Briefs. 3(2004). 45–48. 2 indexed citations

18.

Seminario, Jorge M., Luis A. Agapito, Liuming Yan, et al.. (2004). Clustering Effects on Discontinuous Gold Film NanoCells. Journal of Nanoscience and Nanotechnology. 4(7). 907–917. 33 indexed citations

19.

Tour, James M., et al.. (2002). Nanocell logic gates for molecular computing. IEEE Transactions on Nanotechnology. 1(2). 100–109. 98 indexed citations

20.

Nackashi, David P. & Paul D. Franzon. (2001). Molectronics: a circuit design perspective. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4236. 80–80. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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