David H. Ziger

775 total citations
21 papers, 671 citations indexed

About

David H. Ziger is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, David H. Ziger has authored 21 papers receiving a total of 671 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Electrical and Electronic Engineering, 12 papers in Biomedical Engineering and 4 papers in Surfaces, Coatings and Films. Recurrent topics in David H. Ziger's work include Advancements in Photolithography Techniques (13 papers), Advanced Surface Polishing Techniques (5 papers) and Phase Equilibria and Thermodynamics (5 papers). David H. Ziger is often cited by papers focused on Advancements in Photolithography Techniques (13 papers), Advanced Surface Polishing Techniques (5 papers) and Phase Equilibria and Thermodynamics (5 papers). David H. Ziger collaborates with scholars based in United States, Netherlands and Bulgaria. David H. Ziger's co-authors include Charles A. Eckert, Keith P. Johnston, Chris A. Mack, Gary N. Taylor, Pierre Leroux, Thomas Wolf, William Connor, J. Davis, J. Klatt and M. Carmen Ruiz Delgado and has published in prestigious journals such as The Journal of Physical Chemistry, Industrial & Engineering Chemistry Research and AIChE Journal.

In The Last Decade

David H. Ziger

19 papers receiving 648 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
David H. Ziger United States 7 610 237 233 172 139 21 671
Andreas Kordikowski United Kingdom 12 628 1.0× 184 0.8× 229 1.0× 165 1.0× 157 1.1× 16 762
Yasuhiro Uosaki Japan 14 234 0.4× 177 0.7× 63 0.3× 100 0.6× 223 1.6× 53 513
Michael Frenkel United States 15 349 0.6× 379 1.6× 53 0.2× 191 1.1× 170 1.2× 29 744
Constantinos G. Panayiotou Greece 17 676 1.1× 268 1.1× 124 0.5× 119 0.7× 517 3.7× 30 847
Ana C. Gómez Marigliano Argentina 13 258 0.4× 217 0.9× 86 0.4× 124 0.7× 325 2.3× 25 533
Jacques R. Quint France 16 400 0.7× 332 1.4× 66 0.3× 79 0.5× 396 2.8× 30 749
Toshiharu Takagi Japan 17 561 0.9× 392 1.7× 76 0.3× 81 0.5× 525 3.8× 73 800
Ignacio Medina Spain 21 730 1.2× 105 0.4× 619 2.7× 80 0.5× 157 1.1× 39 899
María J. Dávila Spain 17 352 0.6× 269 1.1× 46 0.2× 213 1.2× 335 2.4× 25 677
J. Pick Czechia 17 609 1.0× 507 2.1× 114 0.5× 52 0.3× 487 3.5× 70 961

Countries citing papers authored by David H. Ziger

Since Specialization
Citations

This map shows the geographic impact of David H. Ziger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David H. Ziger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David H. Ziger more than expected).

Fields of papers citing papers by David H. Ziger

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David H. Ziger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David H. Ziger. The network helps show where David H. Ziger may publish in the future.

Co-authorship network of co-authors of David H. Ziger

This figure shows the co-authorship network connecting the top 25 collaborators of David H. Ziger. A scholar is included among the top collaborators of David H. Ziger based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David H. Ziger. David H. Ziger is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ziger, David H., et al.. (2005). A new methodology for quantifying OPC recipe accuracy. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5992. 599258–599258. 1 indexed citations
2.
Ziger, David H.. (2004). Swing curve prediction from reflectance spectra: a new method to predict optimal resist thicknesses and compare processes. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5377. 988–988. 2 indexed citations
3.
Ziger, David H., et al.. (2002). Silicide-related yield enhancement in a deep submicrometer CMOS process. 14. 287–290.
4.
Ziger, David H. & Pierre Leroux. (2002). Linear alignment correction algorithm for deep-submicron lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4689. 1057–1057. 1 indexed citations
5.
Ziger, David H.. (2000). Understanding optical end of line metrology. Optical Engineering. 39(7). 1951–1951. 3 indexed citations
6.
Leroux, Pierre, et al.. (2000). Focus characterization using end of line metrology. IEEE Transactions on Semiconductor Manufacturing. 13(3). 322–330. 1 indexed citations
7.
Ziger, David H. & Pierre Leroux. (1999). Understanding optical end of line metrology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3677. 194–194.
8.
Ziger, David H.. (1992). Understanding IC lithography. IEEE Circuits and Devices Magazine. 8(5). 42–47. 3 indexed citations
9.
Ziger, David H.. (1992). Generalized characteristic model for lithography: application to negative chemically amplified resists. Optical Engineering. 31(1). 98–98. 1 indexed citations
10.
Ziger, David H. & Chris A. Mack. (1991). Generalized approach toward modeling resist performance. AIChE Journal. 37(12). 1863–1874. 5 indexed citations
11.
Ziger, David H., et al.. (1991). Resist tracking: a lithographic diagnostic tool. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1464. 206–206. 1 indexed citations
12.
Ziger, David H., et al.. (1991). <title>Use of antireflective coatings in deep-UV lithography</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1463. 30–40. 7 indexed citations
13.
Ziger, David H., et al.. (1991). <title>Generalized characteristic model for lithography: application to negative chemically amplified resists</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1466. 270–282. 7 indexed citations
14.
Ziger, David H., et al.. (1991). Kinetic study of ammonia-catalyzed image reversal in positive photoresist. Industrial & Engineering Chemistry Research. 30(7). 1461–1468. 1 indexed citations
15.
Ziger, David H., Thomas Wolf, & Gary N. Taylor. (1987). Compressed fluid technology: Application to RIE‐developed resists. AIChE Journal. 33(10). 1585–1591. 2 indexed citations
16.
Eckert, Charles A., et al.. (1986). Solute partial molal volumes in supercritical fluids. The Journal of Physical Chemistry. 90(12). 2738–2746. 258 indexed citations
17.
Eckert, Charles A., et al.. (1983). The use of partial molal volume data to evaluate equations of state for supercritical fluid mixtures. Fluid Phase Equilibria. 14. 167–175. 103 indexed citations
18.
Ziger, David H. & Charles A. Eckert. (1983). Correlation and prediction of solid-supercritical fluid phase equilibriums. Industrial & Engineering Chemistry Process Design and Development. 22(4). 582–588. 65 indexed citations
19.
Ziger, David H. & Charles A. Eckert. (1982). Simple high-pressure magnetic pump. Review of Scientific Instruments. 53(8). 1296–1297. 13 indexed citations
20.
Johnston, Keith P., David H. Ziger, & Charles A. Eckert. (1982). Solubilities of hydrocarbon solids in supercritical fluids. The augmented van der Waals treatment. Industrial & Engineering Chemistry Fundamentals. 21(3). 191–197. 193 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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