David C. Ferranti
Impact in
- Structural Biology top 2%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 15
-
- Integrated Circuits and Semiconductor Failure Analysis 11
- Advancements in Photolithography Techniques 6
- Semiconductor materials and devices 3
- Electrochemical sensors and biosensors 1
- Co-authors
- Lewis Stern (10 shared papers)Colin A. Sanford (2 shared papers)Adam R. Hall (1 shared paper)Jijin Yang (1 shared paper)Zheng Ren (1 shared paper)Jason Huang (1 shared paper)Larry Scipioni (5 shared papers)Chuong Huynh (6 shared papers)
- Journals
- Microscopy and Microanalysis (6 papers)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (2 papers)Scientific Reports (1 paper)Journal of Materials Science Materials in Electronics (1 paper)Journal of Applied Physics (1 paper)
- Partner nations
- United StatesGermanyIsrael
In The Last Decade
David C. Ferranti
19 papers receiving 515 citations
Peers
Comparison fields: 5 of 80
- Structural Biology 103
- Surfaces, Coatings and Films 97
- Computational Mechanics 177
- Biomedical Engineering 252
- Electrical and Electronic Engineering 243
Countries citing papers authored by David C. Ferranti
This map shows the geographic impact of David C. Ferranti's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David C. Ferranti with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David C. Ferranti more than expected).
Fields of papers citing papers by David C. Ferranti
This network shows the impact of papers produced by David C. Ferranti. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David C. Ferranti. The network helps show where David C. Ferranti may publish in the future.
Co-authors
The 25 scholars most cited alongside David C. Ferranti, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 21 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 163 | |
| 2 | 2013 | 119 | |
| 3 | 2011 | 62 | |
| 4 | 2013 | 53 | |
| 5 | 2010 | 37 | |
| 6 | 2000 | 30 | |
| 7 | 2014 | 12 | |
| 8 | 2011 | 11 | |
| 9 | 2013 | 11 | |
| 10 | 2011 | 11 | |
| 11 | 1994 | 6 | |
| 12 | 2010 | 4 | |
| 13 | 1997 | 2 | |
| 14 | 2003 | 2 | |
| 15 | 2013 | 2 | |
| 16 | 2010 | 1 | |
| 17 | 1991 | 1 | |
| 18 | 2015 | 1 | |
| 19 | 2014 | 1 | |
| 20 | 1988 | 1 |
About David C. Ferranti
David C. Ferranti is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Structural Biology, Computational Mechanics and Biomedical Engineering, having authored 21 papers that have together received 531 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (15 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Ion-surface interactions and analysis (6 papers), Advancements in Photolithography Techniques (6 papers), Advanced Electron Microscopy Techniques and Applications (6 papers), Semiconductor materials and devices (3 papers), Advanced Materials Characterization Techniques (2 papers) and Electrochemical sensors and biosensors (1 paper). The work is most often cited by research in Structural Biology (103 citations), Surfaces, Coatings and Films (97 citations), Computational Mechanics (177 citations), Biomedical Engineering (252 citations) and Electrical and Electronic Engineering (243 citations). David C. Ferranti has collaborated with scholars based in United States, Germany and Israel. Frequent co-authors include Lewis Stern, Colin A. Sanford, Adam R. Hall, Jijin Yang, Zheng Ren, Jason Huang, Larry Scipioni, Chuong Huynh, Bernhard Goetze and Radislav A. Potyrailo. Their work appears in journals such as Microscopy and Microanalysis, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Scientific Reports, Journal of Materials Science Materials in Electronics and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.