David C. Ferranti

665 total citations
21 papers, 531 citations indexed

About

David C. Ferranti is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Structural Biology. According to data from OpenAlex, David C. Ferranti has authored 21 papers receiving a total of 531 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Surfaces, Coatings and Films, 14 papers in Electrical and Electronic Engineering and 6 papers in Structural Biology. Recurrent topics in David C. Ferranti's work include Electron and X-Ray Spectroscopy Techniques (15 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers) and Advancements in Photolithography Techniques (6 papers). David C. Ferranti is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (15 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers) and Advancements in Photolithography Techniques (6 papers). David C. Ferranti collaborates with scholars based in United States, Germany and Israel. David C. Ferranti's co-authors include Lewis Stern, Colin A. Sanford, Jason Huang, Jijin Yang, Zheng Ren, Adam R. Hall, Larry Scipioni, Chuong Huynh, Bernhard Goetze and Radislav A. Potyrailo and has published in prestigious journals such as Nano Letters, Journal of Applied Physics and Scientific Reports.

In The Last Decade

David C. Ferranti

19 papers receiving 515 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
David C. Ferranti United States 10 252 243 177 103 97 21 531
Bill Ward United States 9 141 0.6× 306 1.3× 275 1.6× 153 1.5× 207 2.1× 11 633
Achim Nadzeyka Germany 11 218 0.9× 201 0.8× 100 0.6× 39 0.4× 25 0.3× 28 469
Maja Ðukić Switzerland 7 97 0.4× 199 0.8× 79 0.4× 131 1.3× 118 1.2× 9 436
A. Muray United States 10 587 2.3× 553 2.3× 64 0.4× 62 0.6× 192 2.0× 18 864
Sylvain Lecler France 16 812 3.2× 477 2.0× 71 0.4× 12 0.1× 65 0.7× 71 967
Michal Urbánek Czechia 13 154 0.6× 162 0.7× 36 0.2× 27 0.3× 27 0.3× 44 482
Xiuli Zhou China 13 251 1.0× 214 0.9× 68 0.4× 6 0.1× 100 1.0× 49 627
Michel Prigent France 17 117 0.5× 484 2.0× 33 0.2× 26 0.3× 23 0.2× 74 952
Hideki Kawakatsu Japan 19 319 1.3× 395 1.6× 37 0.2× 20 0.2× 15 0.2× 82 851
Yong Jai Cho South Korea 12 133 0.5× 290 1.2× 33 0.2× 4 0.0× 58 0.6× 42 541

Countries citing papers authored by David C. Ferranti

Since Specialization
Citations

This map shows the geographic impact of David C. Ferranti's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David C. Ferranti with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David C. Ferranti more than expected).

Fields of papers citing papers by David C. Ferranti

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David C. Ferranti. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David C. Ferranti. The network helps show where David C. Ferranti may publish in the future.

Co-authorship network of co-authors of David C. Ferranti

This figure shows the co-authorship network connecting the top 25 collaborators of David C. Ferranti. A scholar is included among the top collaborators of David C. Ferranti based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David C. Ferranti. David C. Ferranti is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Xia, Deying, et al.. (2015). Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS). Microscopy and Microanalysis. 21(S3). 1165–1166. 1 indexed citations
2.
McVey, Shawn, David C. Ferranti, Chuong Huynh, et al.. (2014). Advantages of Helium and Neon Ion Beams for Intelligent Imaging. Microscopy and Microanalysis. 20(S3). 338–339. 1 indexed citations
3.
Ferranti, David C., et al.. (2014). Precise nanofabrication with multiple ion beams for advanced circuit edit. Microelectronics Reliability. 54(9-10). 1779–1784. 12 indexed citations
4.
Joens, Matthew S., Chuong Huynh, David C. Ferranti, et al.. (2013). Helium Ion Microscopy (HIM) for the imaging of biological samples at sub-nanometer resolution. Scientific Reports. 3(1). 3514–3514. 119 indexed citations
5.
Ananth, M.V., et al.. (2013). Advanced Nanofabrication using Helium, Neon and Gallium Ion Beams in the Carl Zeiss Orion NanoFab Microscope. Microscopy and Microanalysis. 19(S2). 1304–1305. 11 indexed citations
6.
Stern, Lewis, Deying Xia, David C. Ferranti, et al.. (2013). Focused helium ion beam deposited low resistivity cobalt metal lines with 10 nm resolution: implications for advanced circuit editing. Journal of Materials Science Materials in Electronics. 25(2). 587–595. 53 indexed citations
7.
Goetze, Bernhard, et al.. (2013). The Helium Ion Microscope - a Versatile Tool for a Wide Range of Applications. Microscopy and Microanalysis. 19(S2). 908–909. 2 indexed citations
8.
Jepson, Mark A., Xiong Liu, David C. Bell, et al.. (2011). Resolution Limits of Secondary Electron Dopant Contrast in Helium Ion and Scanning Electron Microscopy. Microscopy and Microanalysis. 17(4). 637–642. 11 indexed citations
9.
Yang, Jijin, David C. Ferranti, Lewis Stern, et al.. (2011). Rapid and precise scanning helium ion microscope milling of solid-state nanopores for biomolecule detection. Nanotechnology. 22(28). 285310–285310. 163 indexed citations
10.
Ananth, M.V., Lewis Stern, David C. Ferranti, et al.. (2011). Creating nanohole arrays with the helium ion microscope. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8036. 80360M–80360M. 11 indexed citations
11.
Winston, Donny, Vitor R. Manfrinato, Samuel M. Nicaise, et al.. (2011). Neon Ion Beam Lithography (NIBL). Nano Letters. 11(10). 4343–4347. 62 indexed citations
12.
Potyrailo, Radislav A., et al.. (2010). Fabrication and Characterization of Ultra-High Aspect Ratio Features in Gold Using the Helium Ion Microscope. Microscopy and Microanalysis. 16(S2). 198–199. 1 indexed citations
13.
Scipioni, Larry, David C. Ferranti, Vincent S. Smentkowski, & Radislav A. Potyrailo. (2010). Fabrication and initial characterization of ultrahigh aspect ratio vias in gold using the helium ion microscope. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 28(6). C6P18–C6P23. 37 indexed citations
14.
Bliznyuk, Valery N., A. A. Pud, Larry Scipioni, et al.. (2010). Structure and properties of polymer core-shell systems: Helium ion microscopy and electrical conductivity studies. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 28(6). C6P59–C6P65. 4 indexed citations
15.
Ferranti, David C., et al.. (2003). Material removal strategies and results for 193-nm lithography using FIB mask repair. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5256. 546–546. 2 indexed citations
16.
Scipioni, Larry, et al.. (2000). Performance of multicusp plasma ion source for focused ion beam applications. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 18(6). 3194–3197. 30 indexed citations
17.
Casey, J., et al.. (1997). Chemically enhanced focused-ion-beam (FIB) repair of opaque defects on chrome photomasks. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3096. 322–322. 2 indexed citations
18.
Ferranti, David C., et al.. (1994). Advances in focused ion-beam repair of opaque defects. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2194. 394–394. 6 indexed citations
19.
Belt, Roger F., et al.. (1991). Excimer laser processing of magneto-optic garnet films. Journal of Applied Physics. 70(10). 6398–6400. 1 indexed citations
20.
Elliott, David J., David C. Ferranti, & Burn J. Lin. (1988). <title>Sub-Micron Lithography At 248nm And 193nm Excimer Laser Wavelengths</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 922. 476–482. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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