David Blanco

545 citations
27 papers · 445 indexed · h-index 9
Topics
Surface Roughness and Optical Measurements (11 papers)Advanced Measurement and Metrology Techniques (10 papers)Optical measurement and interference techniques (10 papers)
Partner nations
Spain

In The Last Decade

David Blanco

21 papers receiving 434 citations

Peers

David Blanco
Comparison fields: 5 of 100
  • Mechanical Engineering 190
  • Automotive Engineering 146
  • Industrial and Manufacturing Engineering 122
  • Biomedical Engineering 79
  • Computer Vision and Pattern Recognition 76
Replace Pedro Fernández with:
Pedro Fernández Spain
Braulio José Álvarez Álvarez Spain
G. Valiño Spain
Farshad Barazandeh Iran
Roberto Marsili Italy
Xiaosheng Cheng China
Francesco Tamburrino Italy
Paolo Neri Italy
Haisen Zhao China
Wahyudin P. Syam United Kingdom
David Blanco relative to Pedro Fernández Spain Pedro Fernández's profile →
Citations per field
00.5×3.2×
Pedro Fernández · 1×
Citations per year

Countries citing papers authored by David Blanco

Since Specialization
Citations

This map shows the geographic impact of David Blanco's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David Blanco with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David Blanco more than expected).

Fields of papers citing papers by David Blanco

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David Blanco. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David Blanco. The network helps show where David Blanco may publish in the future.

Co-authorship network of co-authors of David Blanco

This figure shows the co-authorship network connecting the top 25 collaborators of David Blanco. A scholar is included among the top collaborators of David Blanco based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David Blanco. David Blanco is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 0
2 0
3 0
4 7
5 1
6 0
7 4
8 183
9 5
10 1
11 9
12 4
13 1
14 12
15 2
16 0
17 3
18 14
19 0
20 5

About David Blanco

David Blanco is a scholar working on Industrial and Manufacturing Engineering, Geology and Automotive Engineering, having authored 27 papers that have together received 445 indexed citations. Recurring topics across this work include Surface Roughness and Optical Measurements (11 papers), Advanced Measurement and Metrology Techniques (10 papers) and Optical measurement and interference techniques (10 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (122 citations), Automotive Engineering (146 citations) and General Dentistry (10 citations). David Blanco has collaborated with scholars based in Spain. Frequent co-authors include Braulio José Álvarez Álvarez, Á. Noriega, Pedro Fernández, G. Valiño, A. Garcı́a, E. Cuesta, Carlos Suárez, Lorena Suárez, Ainara Rodríguez and Vicente Jesus Segui. Their work appears in journals such as Sensors, International Journal of Production Research and Materials.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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