David B. Williams

10.3k total citations · 3 hit papers
49 papers, 6.2k citations indexed

About

David B. Williams is a scholar working on Materials Chemistry, Surfaces, Coatings and Films and Mechanical Engineering. According to data from OpenAlex, David B. Williams has authored 49 papers receiving a total of 6.2k indexed citations (citations by other indexed papers that have themselves been cited), including 21 papers in Materials Chemistry, 18 papers in Surfaces, Coatings and Films and 12 papers in Mechanical Engineering. Recurrent topics in David B. Williams's work include Electron and X-Ray Spectroscopy Techniques (18 papers), Advanced Materials Characterization Techniques (10 papers) and Aluminum Alloy Microstructure Properties (7 papers). David B. Williams is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (18 papers), Advanced Materials Characterization Techniques (10 papers) and Aluminum Alloy Microstructure Properties (7 papers). David B. Williams collaborates with scholars based in United States, Japan and Australia. David B. Williams's co-authors include C. Barry Carter, Himanshu Jain, Kenneth S. Vecchio, Pradyumna Gupta, Helen M. Chan, Adam J. Papworth, Alexei Gruverman, Arthur P. Baddorf, Junsoo Shin and Brian J. Rodriguez and has published in prestigious journals such as Journal of Applied Physics, Journal of the American Ceramic Society and Scripta Materialia.

In The Last Decade

David B. Williams

46 papers receiving 5.9k citations

Hit Papers

Transmission Electron Microscopy 1996 2026 2006 2016 2009 1996 1996 500 1000 1.5k 2.0k

Peers

David B. Williams
Comparison fields: 5 of 158
  • Materials Chemistry 3.4k
  • Electrical and Electronic Engineering 1.5k
  • Mechanical Engineering 1.3k
  • Biomedical Engineering 1.1k
  • Atomic and Molecular Physics, and Optics 843
Replace Joseph R. Michael with:
Joseph R. Michael United States
U. Dahmen United States
Lucille A. Giannuzzi United States
Ferdinand Hofer Austria
C. Barry Carter United States
Rik Brydson United Kingdom
Raynald Gauvin Canada
Paul G. Kotula United States
Matthew Weyland Australia
Velimir Radmilović United States
Joseph R. Michael United States View profile →
Citations per field, relative to David B. Williams
David B. Williams · 1×
Citations per year, relative to David B. Williams
David B. Williams · 1×

Countries citing papers authored by David B. Williams

Since Specialization
Citations

This map shows the geographic impact of David B. Williams's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David B. Williams with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David B. Williams more than expected).

Fields of papers citing papers by David B. Williams

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David B. Williams. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David B. Williams. The network helps show where David B. Williams may publish in the future.

Co-authorship network of co-authors of David B. Williams

This figure shows the co-authorship network connecting the top 25 collaborators of David B. Williams. A scholar is included among the top collaborators of David B. Williams based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David B. Williams. David B. Williams is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
# Work Indexed citations
1 1
2
Transmission Electron Microscopy breakdown →
2119
3 203
4 12
5 5
6 4
7 25
8
Transmission Electron Microscopy breakdown →
1325
9 23
10
Images of materials
6
11 1
12 7
13
Electron microscopy 1990 : proceedings of the 12th International Congress for Electron Microscopy held in Seattle, Washington, USA, 12-18 August 1990 : 48th annual meeting of the Electron Microscopy Society of America and 25th annual meeting of the Microbeam Analysis Society
1
14 4
15
Photoelectric Photometry and Further Discussions of V Cephei
1
16 14
17 6
18
Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.
1
19 1
20
Hierarchy in stratigraphical nomenclature [discussion]
2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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