Daeil Kwon
Impact in
- Automotive Engineering top 1%
- Advanced Battery Technologies Research
-
- Reliability and Maintenance Optimization
Papers in
-
- Electronic Packaging and Soldering Technologies 20
- Integrated Circuits and Semiconductor Failure Analysis 14
- Electrostatic Discharge in Electronics 7
- 3D IC and TSV technologies 6
- Electromagnetic Compatibility and Noise Suppression 5
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- Advanced Battery Technologies Research 7
- Co-authors
- Michael Pecht (17 shared papers)Chang‐Yong Lee (5 shared papers)Jinwoo Lee (4 shared papers)Michael H. Azarian (11 shared papers)Lingxi Kong (1 shared paper)Bin Xu (1 shared paper)Oh-Jin Kwon (1 shared paper)Tadahiro Shibutani (1 shared paper)
- Journals
- IEEE Transactions on Industrial Electronics (3 papers)IEEE Access (2 papers)Reliability Engineering & System Safety (2 papers)IEEE Transactions on Components Packaging and Manufacturing Technology (1 paper)International Journal of Precision Engineering and Manufacturing (1 paper)
- Partner nations
- South KoreaUnited StatesThailand
In The Last Decade
Daeil Kwon
47 papers receiving 1.3k citations
Hit Papers
Peers
Comparison fields: 5 of 97
- Automotive Engineering 551
- Safety, Risk, Reliability and Quality 166
- Medical Laboratory Technology 26
- Industrial and Manufacturing Engineering 139
- Management of Technology and Innovation 96
Countries citing papers authored by Daeil Kwon
This map shows the geographic impact of Daeil Kwon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Daeil Kwon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Daeil Kwon more than expected).
Fields of papers citing papers by Daeil Kwon
This network shows the impact of papers produced by Daeil Kwon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Daeil Kwon. The network helps show where Daeil Kwon may publish in the future.
Co-authors
The 25 scholars most cited alongside Daeil Kwon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 49 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Mitigation strategies for Li-ion battery thermal runaway: A review Hit paper breakdown → | 2021 | 263 |
| 2 | 2017 | 165 | |
| 3 | 2016 | 163 | |
| 4 | 2018 | 104 | |
| 5 | 2022 | 90 | |
| 6 | 2009 | 54 | |
| 7 | 2018 | 50 | |
| 8 | 2020 | 49 | |
| 9 | 2021 | 36 | |
| 10 | 2015 | 33 | |
| 11 | 2018 | 32 | |
| 12 | 2020 | 31 | |
| 13 | 2018 | 26 | |
| 14 | 2018 | 22 | |
| 15 | 2010 | 22 | |
| 16 | 2008 | 21 | |
| 17 | 2008 | 21 | |
| 18 | 2018 | 19 | |
| 19 | 2019 | 17 | |
| 20 | 2016 | 15 |
About Daeil Kwon
Daeil Kwon is a scholar working on Electrical and Electronic Engineering, Automotive Engineering, Control and Systems Engineering, Safety, Risk, Reliability and Quality and Industrial and Manufacturing Engineering, having authored 49 papers that have together received 1.4k indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (20 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Fault Detection and Control Systems (10 papers), Reliability and Maintenance Optimization (8 papers), Electrostatic Discharge in Electronics (7 papers), Advanced Battery Technologies Research (7 papers), 3D IC and TSV technologies (6 papers) and Electromagnetic Compatibility and Noise Suppression (5 papers). The work is most often cited by research in Automotive Engineering (551 citations), Safety, Risk, Reliability and Quality (166 citations), Medical Laboratory Technology (26 citations), Industrial and Manufacturing Engineering (139 citations) and Management of Technology and Innovation (96 citations). Daeil Kwon has collaborated with scholars based in South Korea, United States and Thailand. Frequent co-authors include Michael Pecht, Chang‐Yong Lee, Jinwoo Lee, Michael H. Azarian, Lingxi Kong, Bin Xu, Oh-Jin Kwon, Tadahiro Shibutani, Jiajie Fan and Melinda Hodkiewicz. Their work appears in journals such as IEEE Transactions on Industrial Electronics, IEEE Access, Reliability Engineering & System Safety, IEEE Transactions on Components Packaging and Manufacturing Technology and International Journal of Precision Engineering and Manufacturing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.