Tieling Zhang
- Safety, Risk, Reliability and Quality top 1%
- Statistics, Probability and Uncertainty top 0.5%
- Electrical and Electronic Engineering
- Statistics and Probability top 2%
- Control and Systems Engineering top 5%
- Co-authors
- Min XieRichard DwightLiang MaZuojun LiuXu ZhangR. M. Chandima RatnayakeJinpeng TianQinghua Guo
- Topics
- Reliability and Maintenance Optimization (13 papers)Advanced Battery Technologies Research (10 papers)Statistical Distribution Estimation and Applications (8 papers)
In The Last Decade
Tieling Zhang
60 papers receiving 1.2k citations
Peers
Comparison fields: 5 of 119
- Safety, Risk, Reliability and Quality 344
- Statistics, Probability and Uncertainty 304
- Electrical and Electronic Engineering 282
- Statistics and Probability 227
- Control and Systems Engineering 220
Countries citing papers authored by Tieling Zhang
This map shows the geographic impact of Tieling Zhang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tieling Zhang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tieling Zhang more than expected).
Fields of papers citing papers by Tieling Zhang
This network shows the impact of papers produced by Tieling Zhang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tieling Zhang. The network helps show where Tieling Zhang may publish in the future.
Co-authorship network of co-authors of Tieling Zhang
This figure shows the co-authorship network connecting the top 25 collaborators of Tieling Zhang. A scholar is included among the top collaborators of Tieling Zhang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Tieling Zhang. Tieling Zhang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 4 | |
| 3 | 1 | |
| 4 | 1 | |
| 5 | 2 | |
| 6 | 0 | |
| 7 | 15 | |
| 8 | 32 | |
| 9 | 5 | |
| 10 | 11 | |
| 11 | 63 | |
| 12 | 7 | |
| 13 | 26 | |
| 14 | 1 | |
| 15 | 16 | |
| 16 | 11 | |
| 17 | 33 | |
| 18 | 17 | |
| 19 | 17 | |
| 20 | 70 |
About Tieling Zhang
Tieling Zhang is a scholar working on Safety, Risk, Reliability and Quality, Medical Laboratory Technology and Statistics, Probability and Uncertainty, having authored 62 papers that have together received 1.2k indexed citations. Recurring topics across this work include Reliability and Maintenance Optimization (13 papers), Advanced Battery Technologies Research (10 papers) and Statistical Distribution Estimation and Applications (8 papers). The work is most often cited by research in Statistics, Probability and Uncertainty (304 citations), Safety, Risk, Reliability and Quality (344 citations) and Statistics and Probability (227 citations). Tieling Zhang has collaborated with scholars based in Australia, China and Singapore. Frequent co-authors include Min Xie, Richard Dwight, Liang Ma, Zuojun Liu, Xu Zhang, R. M. Chandima Ratnayake, Jinpeng Tian, Qinghua Guo, Muhammad Nihal Hussain and Paul E. McMahon. Their work appears in journals such as PLoS ONE, European Journal of Operational Research and IEEE Access.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.