D. Preikszas
- Structural Biology top 0.5%
- Advanced Electron Microscopy Techniques and Applications 4
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 9
- Radiation top 10%
- X-ray Spectroscopy and Fluorescence Analysis 2
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- Adaptive optics and wavefront sensing 1
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- Advancements in Photolithography Techniques 6
- Integrated Circuits and Semiconductor Failure Analysis 1
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- Ion-surface interactions and analysis 1
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- Advanced Materials Characterization Techniques 1
D. Preikszas
12 papers receiving 409 citations
Peers
Comparison fields: 5 of 36
- Structural Biology 236
- Surfaces, Coatings and Films 267
- Radiation 76
- Atomic and Molecular Physics, and Optics 149
- Electrical and Electronic Engineering 171
Countries citing papers authored by D. Preikszas
This map shows the geographic impact of D. Preikszas's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Preikszas with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Preikszas more than expected).
Fields of papers citing papers by D. Preikszas
This network shows the impact of papers produced by D. Preikszas. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Preikszas. The network helps show where D. Preikszas may publish in the future.
Co-authorship network
The 25 scholars most cited alongside D. Preikszas, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2018 | 7 | |
| 2 | 2010 | 64 | |
| 3 | 2004 | 18 | |
| 4 | 2002 | 72 | |
| 5 | Performance of the mirror corrector for an ultrahigh resolution spectromicroscope | 2000 | 1 |
| 6 | 1999 | 12 | |
| 7 | 1998 | 62 | |
| 8 | 1997 | 45 | |
| 9 | 1997 | 102 | |
| 10 | 1995 | 17 | |
| 11 | Korrektur des Farb- und Öffnungsfehlers eines Niederspannungs-Elektronenmikroskops mit Hilfe eines Elektronenspiegels | 1995 | 1 |
| 12 | Outline of a versatile corrected LEEM | 1992 | 26 |
About D. Preikszas
D. Preikszas is a scholar working on Structural Biology, Surfaces, Coatings and Films and Radiation, having authored 12 papers that have together received 427 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (9 papers), Advancements in Photolithography Techniques (6 papers), Advanced Electron Microscopy Techniques and Applications (4 papers), X-ray Spectroscopy and Fluorescence Analysis (2 papers), Adaptive optics and wavefront sensing (1 paper), Ion-surface interactions and analysis (1 paper), Advanced Materials Characterization Techniques (1 paper) and Integrated Circuits and Semiconductor Failure Analysis (1 paper). The work is most often cited by research in Structural Biology (236 citations), Surfaces, Coatings and Films (267 citations) and Radiation (76 citations). D. Preikszas has collaborated with scholars based in Germany and United States. Frequent co-authors include H. Rose, G. Lilienkamp, Peter Hartel, Thomas Schmidt, R. Spehr, E. Umbach, R. Fink, W. Engel, Hans‐Joachim Freund and G. Benner. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, Ultramicroscopy and Journal of Electron Spectroscopy and Related Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.