D. E. Sayers
- Radiation top 0.1%
- X-ray Spectroscopy and Fluorescence Analysis 27
- Advanced X-ray Imaging Techniques 14
- Structural Biology top 1%
- Surfaces, Coatings and Films top 0.5%
- Electron and X-Ray Spectroscopy Techniques 19
- Ceramics and Composites top 2%
- Glass properties and applications 17
- Environmental Chemistry top 2%
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- Semiconductor materials and interfaces 42
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- Phase-change materials and chalcogenides 22
- X-ray Diffraction in Crystallography 12
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- Semiconductor materials and devices 15
- Co-authors
- Edward A. SternFarrel W. LytleF. W. LytleDean HesterbergZ. ZhongD. ChapmanEtta D. PisanoRichard Johnston
- Journals
- Journal of Non-Crystalline Solids (13 papers)Physical review. B, Condensed matter (13 papers)Journal of Applied Physics (11 papers)
- Partner nations
- United StatesFranceJapan
In The Last Decade
D. E. Sayers
139 papers receiving 5.9k citations
Hit Papers
Peers
Comparison fields: 5 of 132
- Radiation 2.4k
- Structural Biology 175
- Surfaces, Coatings and Films 591
- Ceramics and Composites 368
- Environmental Chemistry 441
Countries citing papers authored by D. E. Sayers
This map shows the geographic impact of D. E. Sayers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. E. Sayers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. E. Sayers more than expected).
Fields of papers citing papers by D. E. Sayers
This network shows the impact of papers produced by D. E. Sayers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. E. Sayers. The network helps show where D. E. Sayers may publish in the future.
Co-authorship network
The 25 scholars most cited alongside D. E. Sayers, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 2 | |
| 2 | 2004 | 33 | |
| 3 | 2003 | 41 | |
| 4 | 2002 | 53 | |
| 5 | 2001 | 3 | |
| 6 | 2000 | 156 | |
| 7 | 1999 | 153 | |
| 8 | 1999 | 3 | |
| 9 | Diffraction enhanced x-ray imagingbreakdown → | 1997 | 864 |
| 10 | 1997 | 9 | |
| 11 | 1996 | 59 | |
| 12 | 1995 | 77 | |
| 13 | 1995 | 0 | |
| 14 | 1995 | 24 | |
| 15 | 1990 | 24 | |
| 16 | 1990 | 81 | |
| 17 | XAFS V : proceedings of the 5th International Conference on X-ray Absorption Fine Structure, held in Seattle, WA,USA on August 21-26, 1988 | 1989 | 1 |
| 18 | 1987 | 3 | |
| 19 | 1985 | 0 | |
| 20 | a New Technique to Determine Amorphous Structure Using Extended X-Ray Absorption Fine Structure. | 1972 | 4 |
About D. E. Sayers
D. E. Sayers is a scholar working on Radiation, Ceramics and Composites and Surfaces, Coatings and Films, having authored 143 papers that have together received 6.2k indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (42 papers), X-ray Spectroscopy and Fluorescence Analysis (27 papers), Phase-change materials and chalcogenides (22 papers), Electron and X-Ray Spectroscopy Techniques (19 papers), Glass properties and applications (17 papers), Semiconductor materials and devices (15 papers), Advanced X-ray Imaging Techniques (14 papers) and X-ray Diffraction in Crystallography (12 papers). The work is most often cited by research in Radiation (2.4k citations), Structural Biology (175 citations) and Surfaces, Coatings and Films (591 citations). D. E. Sayers has collaborated with scholars based in United States, France and Japan. Frequent co-authors include Edward A. Stern, Farrel W. Lytle, F. W. Lytle, Dean Hesterberg, Z. Zhong, D. Chapman, Etta D. Pisano, Richard Johnston, J. W. Cook and David B. Washburn. Their work appears in journals such as Journal of Non-Crystalline Solids, Physical review. B, Condensed matter, Journal of Applied Physics, Physica B Condensed Matter and Journal of Synchrotron Radiation.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.