Christian Dorfer
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- Semiconductor materials and devices 3
- Silicon Carbide Semiconductor Technologies 2
- Integrated Circuits and Semiconductor Failure Analysis 2
- Thin-Film Transistor Technologies 1
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- Diamond and Carbon-based Materials Research 1
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- Force Microscopy Techniques and Applications 1
- Laser-Matter Interactions and Applications 1
- Semiconductor materials and interfaces 1
- Co-authors
- Ulrike GroßnerMarianne Etzelmüller BathenStefania CastellettoBrett C. JohnsonR. WallnyM. MikužG. KrambergerDmitry Hits
- Journals
- Applied Physics Letters (2 papers)Journal of Applied Physics (1 paper)Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum (1 paper)
- Partner nations
- SwitzerlandAustraliaItaly
In The Last Decade
Christian Dorfer
4 papers receiving 40 citations
Peers
Comparison fields: 5 of 13
- Electrical and Electronic Engineering 34
- Ceramics and Composites 3
- Hardware and Architecture 2
- Materials Chemistry 11
- Electronic, Optical and Magnetic Materials 4
Countries citing papers authored by Christian Dorfer
This map shows the geographic impact of Christian Dorfer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Christian Dorfer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Christian Dorfer more than expected).
Fields of papers citing papers by Christian Dorfer
This network shows the impact of papers produced by Christian Dorfer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Christian Dorfer. The network helps show where Christian Dorfer may publish in the future.
Co-authorship network
The 12 scholars most cited alongside Christian Dorfer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 3 | |
| 2 | 2023 | 2 | |
| 3 | 2022 | 31 | |
| 4 | 2019 | 5 |
About Christian Dorfer
Christian Dorfer is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Materials Chemistry, Infectious Diseases and Organic Chemistry, having authored 4 papers that have together received 41 indexed citations. Recurring topics across this work include Semiconductor materials and devices (3 papers), Silicon Carbide Semiconductor Technologies (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Force Microscopy Techniques and Applications (1 paper), Laser-Matter Interactions and Applications (1 paper), Semiconductor materials and interfaces (1 paper), Diamond and Carbon-based Materials Research (1 paper) and Thin-Film Transistor Technologies (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (34 citations), Ceramics and Composites (3 citations), Hardware and Architecture (2 citations), Materials Chemistry (11 citations) and Electronic, Optical and Magnetic Materials (4 citations). Christian Dorfer has collaborated with scholars based in Switzerland, Australia and Italy. Frequent co-authors include Ulrike Großner, Marianne Etzelmüller Bathen, Stefania Castelletto, Brett C. Johnson, R. Wallny, M. Mikuž, G. Kramberger, Dmitry Hits, Lamia Kasmi and Matteo Lucchini. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.