Chengyan Ren
- Electrical and Electronic Engineering top 5%
- Materials Chemistry top 10%
- Radiology, Nuclear Medicine and Imaging top 5%
- Biomedical Engineering top 10%
- Surfaces, Coatings and Films top 5%
- Topics
- High voltage insulation and dielectric phenomena (44 papers)Plasma Applications and Diagnostics (15 papers)Plasma Diagnostics and Applications (14 papers)
In The Last Decade
Chengyan Ren
54 papers receiving 990 citations
Peers
Comparison fields: 5 of 52
- Electrical and Electronic Engineering 743
- Materials Chemistry 606
- Radiology, Nuclear Medicine and Imaging 372
- Biomedical Engineering 262
- Surfaces, Coatings and Films 142
Countries citing papers authored by Chengyan Ren
This map shows the geographic impact of Chengyan Ren's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chengyan Ren with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chengyan Ren more than expected).
Fields of papers citing papers by Chengyan Ren
This network shows the impact of papers produced by Chengyan Ren. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chengyan Ren. The network helps show where Chengyan Ren may publish in the future.
Co-authorship network of co-authors of Chengyan Ren
This figure shows the co-authorship network connecting the top 25 collaborators of Chengyan Ren. A scholar is included among the top collaborators of Chengyan Ren based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Chengyan Ren. Chengyan Ren is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 1 | |
| 3 | 5 | |
| 4 | 11 | |
| 5 | 14 | |
| 6 | 0 | |
| 7 | 5 | |
| 8 | 6 | |
| 9 | 5 | |
| 10 | 18 | |
| 11 | 6 | |
| 12 | 25 | |
| 13 | 2 | |
| 14 | 13 | |
| 15 | 1 | |
| 16 | 80 | |
| 17 | 38 | |
| 18 | 2 | |
| 19 | 14 | |
| 20 | Simulation Calculation of Partial Discharge in Single Void Using Variable Void Resistance Model | 2 |
About Chengyan Ren
Chengyan Ren is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Radiology, Nuclear Medicine and Imaging, having authored 57 papers that have together received 1.0k indexed citations. Recurring topics across this work include High voltage insulation and dielectric phenomena (44 papers), Plasma Applications and Diagnostics (15 papers) and Plasma Diagnostics and Applications (14 papers). The work is most often cited by research in Surfaces, Coatings and Films (142 citations), Radiology, Nuclear Medicine and Imaging (372 citations) and Materials Chemistry (606 citations). Chengyan Ren has collaborated with scholars based in China, Australia and Russia. Frequent co-authors include Tao Shao, Cheng Zhang, Ruixue Wang, Fei Kong, Feng Liu, Bin Hai, Shuai Zhang, Ping Yan, В. Ф. Тарасенко and Yiyang Ma. Their work appears in journals such as Journal of Applied Physics, ACS Applied Materials & Interfaces and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.