Carl G. Chen
- Electrical and Electronic Engineering
- Biomedical Engineering
- Atomic and Molecular Physics, and Optics top 10%
- Surfaces, Coatings and Films top 5%
- Mechanical Engineering
- Co-authors
- Mark L. SchattenburgRalf K. HeilmannPaul T. KonkolaG. S. PatiJ. Mariano FerreraChulmin JooChih‐Hao ChangJuan Montoya
- Topics
- Advanced Measurement and Metrology Techniques (12 papers)Advanced Surface Polishing Techniques (8 papers)Optical measurement and interference techniques (5 papers)
- Journals
- NanotechnologyJournal of the Optical Society of America AJournal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
- Partner nations
- United States
In The Last Decade
Carl G. Chen
19 papers receiving 432 citations
Peers
Comparison fields: 5 of 42
- Electrical and Electronic Engineering 199
- Biomedical Engineering 190
- Atomic and Molecular Physics, and Optics 184
- Surfaces, Coatings and Films 156
- Mechanical Engineering 146
Countries citing papers authored by Carl G. Chen
This map shows the geographic impact of Carl G. Chen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Carl G. Chen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Carl G. Chen more than expected).
Fields of papers citing papers by Carl G. Chen
This network shows the impact of papers produced by Carl G. Chen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Carl G. Chen. The network helps show where Carl G. Chen may publish in the future.
Co-authorship network of co-authors of Carl G. Chen
This figure shows the co-authorship network connecting the top 25 collaborators of Carl G. Chen. A scholar is included among the top collaborators of Carl G. Chen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Carl G. Chen. Carl G. Chen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 67 | |
| 2 | 10 | |
| 3 | 2 | |
| 4 | 8 | |
| 5 | 47 | |
| 6 | 18 | |
| 7 | 107 | |
| 8 | 16 | |
| 9 | 41 | |
| 10 | 10 | |
| 11 | 6 | |
| 12 | 43 | |
| 13 | 40 | |
| 14 | 7 | |
| 15 | 2 | |
| 16 | 16 | |
| 17 | 10 | |
| 18 | 8 | |
| 19 | 5 |
About Carl G. Chen
Carl G. Chen is a scholar working on Surfaces, Coatings and Films, Radiation and Mechanical Engineering, having authored 19 papers that have together received 463 indexed citations. Recurring topics across this work include Advanced Measurement and Metrology Techniques (12 papers), Advanced Surface Polishing Techniques (8 papers) and Optical measurement and interference techniques (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (156 citations), Atomic and Molecular Physics, and Optics (184 citations) and Biomedical Engineering (190 citations). Carl G. Chen has collaborated with scholars based in United States. Frequent co-authors include Mark L. Schattenburg, Ralf K. Heilmann, Paul T. Konkola, G. S. Pati, J. Mariano Ferrera, Chulmin Joo, Chih‐Hao Chang, Juan Montoya, G. Monnelly and Lester M. Cohen. Their work appears in journals such as Nanotechnology, Journal of the Optical Society of America A and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.